Abstract:
The analog-to-digital converter includes a first stage in which a voltage to be converted is applied to the input of a first comparator. The first comparator delivers, on a first digital output, a first digital result representative of the comparison between the voltage to be converted and the comparison voltage. The first digital output is connected to a calculator of a first intermediate voltage. A second comparator compares the first intermediate voltage with the comparison voltage and delivers a second digital result on a second digital output terminal. The second digital output terminal is connected to a second calculator of residual voltage that is a function of the voltage to be converted, of first and second voltages and of the first and second digital results. The first calculator is formed by the second calculator.
Abstract:
An analog to digital converter (ADC) system that includes a first amplifier configured to amplify an analog input signal to produce an amplified direct current (DC) signal, an ADC configured to receive the amplified DC signal and convert the amplified DC signal into a digital DC signal, a digital to analog converter configured to receive the digital DC signal and convert the digital DC signal into an analog DC signal, and a second amplifier configured to receive an analog alternating current (AC) signal comprising the analog DC signal subtracted from the analog input signal and amplify the analog AC signal to produce an amplified AC signal. The ADC is further configured to receive the amplified AC signal and produce a digital AC signal. The second amplifier has a gain greater than a gain of the first amplifier.
Abstract:
Methods and Systems for calibrating a Single Ramp Multiple Slope Analog to Digital Converter (SRMS ADC), the ADC including a counter and a plurality N of charge and discharge elements of different time constant i.e. slope, wherein the relationships between slopes is defined as a function of the shallowest slope SN such that S1=K1·SN, S2=K2·SN, . . . SN-1=KN-1·SN-1 where the K values are integers, and the code count for conversion is C=K1·C1+K2·C2+ . . . KN-1·CN-1+CN where each Ci represents an observed counts per each slope for a conversion, including; sampling for a first calibration pass a voltage with the ADC, discharging the voltage on the steepest slope for a number of counter counts C11, charging and discharging on the remaining slopes up to K2 to KN-1 for a number of counts per slope, Ci1 e.g. C21 to CN-1,1, discharging the remaining voltage residue on the shallowest slope and note the count, CN,1, sampling the same voltage on the ADC for a second calibration pass, discharging the voltage on the steepest slope for a modified number of counter counts C12=C11+/−X, modifying the number of charge/discharge counts time Ci2 for the slopes K2 to KN-1 to adjust for the change expected from the modified steep slope discharge to reach the shallowest slope with the same expected residue as for the first calibration pass, discharging the remaining voltage residue on the shallowest slope and note the actual count, CN,2, adjusting K1 to K1a based on the difference between CN,1 and CN,2, and; using C=K1a·C1+K2·C2+ . . . KN-1·CN-1+CN as the count code for conversion.
Abstract:
An enhanced resolution successive-approximation register (SAR) analog-to-digital converter (ADC) is provided that includes a digital-to-analog converter (DAC), a comparator and enhanced resolution SAR control logic. The DAC includes analog circuitry that is configured to convert an M-bit digital input to an analog output. The comparator includes a plurality of coupling capacitors. The enhanced resolution SAR control logic is configured to generate an M-bit approximation of an input voltage and to store a residue voltage in at least one of the coupling capacitors. The residue voltage represents a difference between the input voltage and the M-bit approximation of the input voltage. The enhanced resolution SAR control logic is further configured to generate an N-bit approximation of the input voltage based on the stored residue voltage, where N>M.
Abstract:
An SAR analog-to-digital conversion circuit includes: first and second CDACs; first to third comparators respectively comparing outputs of the first and second CDACs, output levels of the first and third CDACs with a reference level; an arithmetic operation circuit; and an SAR control circuit, wherein the SAR control circuit: at each step, determines in which of four ranges output levels of the sampled and held signals of the first and second CDACs are included, the four ranges corresponding to the conversion range being quartered, determines two bits of the digital data and adjusts the output levels of the first and second CDACs so that a level at ¼ or ¾ of the voltage range agrees with the intermediate level, and controls first and second switches so that the voltage range is set to be a conversion range at a next step.
Abstract:
According to this A/D converter, a first A/D conversion operation for performing integral A/D conversion and a second A/D conversion operation for performing cyclic A/D conversion are realized based on control of operational procedures in a same circuit configuration. Moreover, in the first A/D conversion operation, since a capacity of a capacitor used in the integration of an output signal is greater than a capacity of a capacitor used for storing an input analog signal and a standard reference voltage, the analog signal that is input in the integral A/D conversion is attenuated according to the capacity ratio and subject to sampling and integration. Consequently, the voltage range of the analog signal that is output in the integral A/D conversion also decreases according to the capacity ratio of the capacitors, and the A/D converter can be therefore constructed with a single-ended configuration.
Abstract:
An analog-to-digital converter includes a comparison signal generation unit and a control unit. The comparison signal generation unit determines a logic level of a comparison signal by comparing an input signal with a selected reference signal based on a switch control signal in a first comparison mode, and by comparing a difference voltage with a ramp signal based on the switch control signal in a second comparison mode. The difference voltage is generated based on the input signal and the selected reference signal such that a level of the difference voltage is lower than a fine voltage level corresponding to a voltage level of the selected reference signal in the second comparison mode. The control unit generates the switch control signal based on the comparison signal and a mode selection signal.
Abstract:
An analog-to-digital (A/D) converter includes: a coarse A/D converter configured to convert, when converting an analog input signal into an N-bit digital signal, the analog input signal into a high-order m-bit digital signal; a fine A/D converter configured to convert the analog input signal into a low-order n-bit (where n=N−m) digital signal based on a conversion result of the coarse A/D converter; and a track-and-hold (TH) circuit configured to sample the analog input signal, to supply a comparison voltage compared with a coarse reference voltage to the coarse A/D converter, and to supply a comparison voltage compared with a fine reference voltage based on a conversion result of the fine A/D converter to the fine A/D converter. The TH circuit is configured to share a sampling capacitor in a selective input path for the analog input signal, the coarse reference voltage, and the fine reference voltage.
Abstract:
An A/D converter 101 comprises a first cyclic A/D converter circuit 103 and an A/D converter circuit 105. The A/D converter 101 includes a record circuit 107 for storing conversion results from the A/D converter circuits 103, 105. The record circuit 107 includes an upper-bit record circuit 107a and a lower-bit circuit 107b. The cyclic A/D converter circuit 103 receives an analog value SA and generates a first digital value SD1 indicating the analog value SA and a residue value RD. The A/D converter circuit 105 receives the residue value RD and generates a second digital value SD2 having lower M bits indicating the residue value RD. The conversion accuracy in the A/D converter circuit 105 can be lowered to ½L that in the A/D converter circuit 103.
Abstract:
A system for signal processing comprising a cyclic analog to digital converter structure having a first stage and a second stage, wherein the first stage is configured to receive an input signal to perform 1.5 bits/stage ADC and to generate a first stage output signal, and the second stage is configured to receive the first stage output signal and to perform fine offset tuning using a final conversion phase. The second stage further configured to perform 1.5 bits/stage ADC and to generate a second stage output that is fed back to the first stage to iteratively generate a next 1.5 bits, until (N−3) most significant bits of N bits of data are generated. A third stage configured to generate a three least significant bits of the N bits of data using a flash ADC sampling circuit that samples a residue signal at the output of the first stage.