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公开(公告)号:US12125726B2
公开(公告)日:2024-10-22
申请号:US17657799
申请日:2022-04-04
Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
Inventor: Chuang Shan , Xiaoling Wang
IPC: H01L21/673
CPC classification number: H01L21/67359 , H01L21/67376 , H01L21/67386 , H01L21/67393
Abstract: The present disclosure relates to the technical field of semiconductors, and provides a mask pod and a semiconductor device. The mask pod includes: a body, wherein the body has an accommodation space configured to accommodate a mask, the accommodation space has a first opening, and the first opening is located on a circumferential side of the body; and a shielding member, wherein the shielding member is provided on the body and is movably provided relative to the body, to shield or release the first opening.
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公开(公告)号:US20240192588A1
公开(公告)日:2024-06-13
申请号:US18582045
申请日:2024-02-20
Inventor: Chih-Tsung SHIH , Tsung-Chih CHIEN , Tsung Chuan LEE , Hao-Shiang CHANG
IPC: G03F1/66 , G03F7/00 , H01L21/027 , H01L21/673
CPC classification number: G03F1/66 , H01L21/0274 , H01L21/67359 , G03F7/70741
Abstract: A reticle enclosure includes a base including a first surface, a cover including a second surface and coupled to the base with the first surface facing the second surface. The base and the cover form an internal space that includes a reticle. The reticle enclosure includes restraining mechanisms arranged in the internal space and for securing the reticle, and structures disposed adjacent the reticle in the internal space. The structures enclose the reticle at least partially, and limit passage of contaminants between the internal space and an external environment of the reticle enclosure. The structures include barriers disposed on the first and second surfaces. In other examples, a padding is installed in gaps between the barriers and the first and second surfaces. In other examples, the structures include wall structures disposed on the first and second surfaces and between the restraining mechanisms.
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公开(公告)号:US12009238B2
公开(公告)日:2024-06-11
申请号:US17364457
申请日:2021-06-30
Inventor: Po-Chien Huang , Chung-Hung Lin , Chih-Wei Wen
IPC: H01L21/673 , G03F1/62 , G03F1/66 , G03F7/00 , H01L21/033 , H01T23/00
CPC classification number: H01L21/67359 , G03F1/62 , G03F1/66 , G03F7/70716 , G03F7/70925 , H01L21/0337 , H01T23/00
Abstract: The present disclosure provides a method for fabricating a semiconductor structure, including disposing a mask at a first position in a first chamber, generating; a first plurality of ions toward the mask by an ionizer, forming a photoresist layer on a substrate, receiving the substrate in the first chamber, and exposing the photoresist layer with actinic radiation through the mask in the first chamber.
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公开(公告)号:US20240128106A1
公开(公告)日:2024-04-18
申请号:US18370998
申请日:2023-09-21
Applicant: GUDENG PRECISION INDUSTRIAL CO., LTD.
Inventor: Ming-Chien CHIU , Chia-Ho CHUANG , Hsin-Min HSUEH , Yu-Ruei CHEN
IPC: H01L21/673
CPC classification number: H01L21/67359 , H01L21/67386
Abstract: The invention discloses a container for a non-rectangular reticle, adapted for accommodating an elliptical reticle, and including a cover and a base which are configured to define an elliptical space when engaged with each other. The cover and the base have reticle retainers and reticle supports, respectively, which are configured to securely hold the elliptical reticle.
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公开(公告)号:US11961752B2
公开(公告)日:2024-04-16
申请号:US17432134
申请日:2020-01-20
Applicant: Murata Machinery, Ltd.
Inventor: Ryoma Nunome , Akifumi Sakamoto , Ryota Yamazaki
IPC: H01L21/677 , H01L21/673
CPC classification number: H01L21/67772 , H01L21/67359
Abstract: A first lid opening-and-closing mechanism includes: a first holder that holds an upper lid of a first container; a first protrusion provided to protrude from the first holder toward one side direction with respect to the first holder and extends to outside of a casing; and a first raising/lowering driver that raises and lowers the first holder in a cantilevered manner with the first protrusion interposed therebetween. A second lid opening-and-closing mechanism includes: a second holder that holds an upper lid of a second container; a second protrusion provided to protrude from the second holder toward the one side direction and extends to the outside of the casing; and a second raising/lowering driver that raises and lowers the second holder in a cantilevered manner with the second protrusion interposed therebetween. The first raising/lowering driver and the second raising/lowering driver are located outside the casing in the one side direction.
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公开(公告)号:US11940727B2
公开(公告)日:2024-03-26
申请号:US18126898
申请日:2023-03-27
Inventor: Chih-Tsung Shih , Tsung-Chih Chien , Tsung Chuan Lee , Hao-Shiang Chang
IPC: G03F7/20 , G03F1/66 , H01L21/027 , H01L21/673 , G03F7/00
CPC classification number: G03F1/66 , H01L21/0274 , H01L21/67359 , G03F7/70741
Abstract: A reticle enclosure includes a base including a first surface, a cover including a second surface and coupled to the base with the first surface facing the second surface. The base and the cover form an internal space that includes a reticle. The reticle enclosure includes restraining mechanisms arranged in the internal space and for securing the reticle, and structures disposed adjacent the reticle in the internal space. The structures enclose the reticle at least partially, and limit passage of contaminants between the internal space and an external environment of the reticle enclosure. The structures include barriers disposed on the first and second surfaces. In other examples, a padding is installed in gaps between the barriers and the first and second surfaces. In other examples, the structures include wall structures disposed on the first and second surfaces and between the restraining mechanisms.
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公开(公告)号:US11787621B2
公开(公告)日:2023-10-17
申请号:US16903337
申请日:2020-06-16
Applicant: GUDENG PRECISION INDUSTRIAL CO., LTD.
Inventor: Ming-Chien Chiu , Jain-Ping Sheng
IPC: H01L21/67 , B65D85/48 , H01L21/673 , G03F1/66 , G03F7/00
CPC classification number: B65D85/48 , G03F1/66 , G03F7/70741 , H01L21/67359
Abstract: The invention provides a reticle pod, in particular the reticle pod with wear parts. The reticle pod is a large-size reticle pod and includes a vertical accommodation space for accommodating reticles. The reticle pod mainly includes a cover and a box. The box is used to combine with the cover to form an internal space in order to accommodate reticles. Guiding members are disposed outside the box, and the guiding members can help guide the relative position of the box and the cover. The contact surfaces of the box contacting the upright reticles are disposed with at least two slots, and each of the slot is configured with at least one wear part. The wear part module further includes a first wear part disposed on the upper portion of the slot and a second wear part disposed on the lower portion of the slot.
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公开(公告)号:US11693307B2
公开(公告)日:2023-07-04
申请号:US16694958
申请日:2019-11-25
Applicant: XIA TAI XIN SEMICONDUCTOR (QING DAO) LTD.
Inventor: Jiyong Yoo , Byung-In Kwon , Dae-Youp Lee
IPC: G03F1/66 , H01L21/673 , G03F7/00 , H05F1/00 , G03F1/38
CPC classification number: G03F1/66 , G03F1/38 , G03F7/70741 , H01L21/67359 , H01L21/67393 , H05F1/00
Abstract: A stocker for holding a plurality of reticle pods is provided. Each of the reticle pods is configured to accommodate a reticle assembly. The reticle assembly includes a reticle and a pellicle covering the reticle. The stocker includes a main frame and an electrostatic generator. The main frame has an inner space and at least one pod support disposed in the inner space. The pod support divides the inner space into a plurality of chambers configured to respectively accommodate the plurality of reticle pods. The electrostatic generator is coupled to the reticle assembly and configured to generate static electricity to the reticle assembly. The static electricity alternates between positive electricity and negative electricity.
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公开(公告)号:US11687011B2
公开(公告)日:2023-06-27
申请号:US17446402
申请日:2021-08-30
Inventor: Yen-Hsun Chen , Yi-Zhen Chen , Jhan-Hong Yeh , Han-Lung Chang , Tzung-Chi Fu , Li-Jui Chen
IPC: G03F7/20 , G03F7/00 , H01L21/687 , H01L21/683 , H01L21/673
CPC classification number: G03F7/70741 , H01L21/67359 , H01L21/6831 , H01L21/68742
Abstract: A reticle carrier described herein is configured to quickly discharge the residual charge on a reticle so as to reduce, minimize, and/or prevent particles in the reticle carrier from being attracted to and/or transferred to the reticle. In particular, the reticle carrier may be configured to provide reduced capacitance between an inner baseplate of the reticle carrier and the reticle. The reduction in capacitance may reduce the resistance-capacitance (RC) time constant for discharging the residual charge on the reticle, which may increase the discharge speed for discharging the residual charge through support pins of the reticle carrier. The increase in discharge speed may reduce the likelihood that an electrostatic force in the reticle carrier may attract particles in the reticle carrier to the reticle. This may reduce pattern defects transferred to substrates that are patterned using the reticle, may increase semiconductor device manufacturing quality and yield, and may reduce scrap and rework of semiconductor devices and/or wafers.
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公开(公告)号:US20180350589A1
公开(公告)日:2018-12-06
申请号:US16057480
申请日:2018-08-07
Applicant: Brooks Automation (Germany) GmbH
Inventor: Lutz Rebstock
IPC: H01L21/02 , H01L21/687 , H01L21/677 , H01L21/67 , B08B3/12 , H01L21/673 , B08B3/08
CPC classification number: H01L21/02041 , B08B3/08 , B08B3/12 , H01L21/67017 , H01L21/67028 , H01L21/67051 , H01L21/67173 , H01L21/67207 , H01L21/67359 , H01L21/67745 , H01L21/68707 , Y10S294/902
Abstract: In an embodiment, the present invention discloses a EUV cleaner system and process for cleaning a EUV carrier. The euv cleaner system comprises separate dirty and cleaned environments, separate cleaning chambers for different components of the double container carrier, gripper arms for picking and placing different components using a same robot handler, gripper arms for holding different components at different locations, horizontal spin cleaning and drying for outer container, hot water and hot air (70 C) cleaning process, vertical nozzles and rasterizing megasonic nozzles for cleaning inner container with hot air nozzles for drying, separate vacuum decontamination chambers for outgassing different components, for example, one for inner and one for outer container with high vacuum (e.g.,
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