Soft Ionization Based on Conditioned Glow Discharge for Quantitative Analysis

    公开(公告)号:US20190157056A1

    公开(公告)日:2019-05-23

    申请号:US16259769

    申请日:2019-01-28

    Abstract: One aspect of the disclosure provides a method of mass spectrometric analysis that includes producing either glow discharge within a noble gas between 3-100 mBar pressure, sampling and conditioning glow discharge products within a gas flow through a conductive channel, removing charged particles while transferring excited Ridberg atoms, and mixing conditioned discharge products with analyte flow within an enclosed chamber at elevated temperatures above 150° Celsius for producing a Penning reaction between analyte molecules and Ridberg atoms. The method further includes sampling, by a gas flow, said analyte ions for mass spectrometric analysis, and at least one of the following steps: (i) removing charge within said conditioning channel; (ii) coaxially mixing of analyte flow with the flow of conditioned plasma; and (iii) cooling of the mixed flow within a sonic or supersonic jet for reducing the region of Penning ionization to cold jet.

    Ionization apparatus
    6.
    发明授权

    公开(公告)号:US09679755B2

    公开(公告)日:2017-06-13

    申请号:US15049366

    申请日:2016-02-22

    Abstract: In an ion source 3 in which a repeller electrode 32 for forming a repelling electric field that repels ions toward an ion emission port 311 is provided inside of an ionization chamber 31, ion focusing electrodes 36 and 37 are respectively arranged between an electron introduction port 312 and a filament 34 and between an electron discharge port 313 and a counter filament 35. An electric field formed by applying a predetermined voltage to each of the ion focusing electrodes 36 and 37 intrudes into the ionization chamber 31 through the electron introduction port 312 and the electron discharge port 313, and becomes a focusing electric field that pushes the ions in an ion optical axis C direction. Ions at positions off a central part of the ionization chamber 31 receive the combined force of the force of the repelling electric field and the force of the focusing electric field, and move toward the ion emission port 311 while approaching the ion optical axis C. Accordingly, the amount of ions sent out from the ion emission port increases. Further, even if a charge-up phenomenon occurs, the ion trajectories less easily change, and the stability of the sensitivity can be enhanced.

    Coupling device for mass spectrometry apparatus

    公开(公告)号:US20170103878A1

    公开(公告)日:2017-04-13

    申请号:US15386790

    申请日:2016-12-21

    CPC classification number: H01J49/0422 H01J49/0027 H01J49/145

    Abstract: An object of the present invention is to provide a technology that enables highly sensitive atmospheric-pressure real-time mass spectrometry of a volatile substance. The present invention provides a coupling device for a mass spectrometry apparatus that is an interface member to be connected to an atmospheric-pressure real-time mass spectrometry apparatus, the coupling device including (A) an excitation gas introducing port, a sample gas introducing port, and an ionized sample gas discharging port, and (B) a channel through which the excitation gas introducing port and the ionized sample gas discharging port are in communication, and (C) a space for mixing excitation gas and sample gas being formed in a region of a portion of the channel recited in (B), by the coupling device having a structure in which the sample gas introducing port and the channel recited in (B) are in communication.

    Contamination filter for mass spectrometer
    10.
    发明授权
    Contamination filter for mass spectrometer 有权
    质谱仪污染过滤器

    公开(公告)号:US09564302B2

    公开(公告)日:2017-02-07

    申请号:US14894494

    申请日:2014-06-20

    Abstract: Methods and systems for performing mass spectrometry are provided herein. In accordance with various aspects of the applicants' teachings, the methods and systems can utilize an ion mobility spectrometer operating at atmospheric or low-vacuum pressure to remove the major contributors to the contamination and degradation of critical downstream components of a mass spectrometer located within a high-vacuum system (e.g., ion optics, mass filters, detectors), with limited signal loss.

    Abstract translation: 本文提供了用于进行质谱分析的方法和系统。 根据申请人的教导的各个方面,所述方法和系统可以利用在大气压或低真空压力下操作的离子迁移谱仪来除去主要贡献者对位于一个或多个内部的质谱仪的关键下游组分的污染和降解 高真空系统(例如离子光学,质量过滤器,检测器),信号损失有限。

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