公开(公告)号：US11972937B2

公开(公告)日：2024-04-30

申请号：US17057736

申请日：2019-05-31

Applicant: Micromass UK Limited

Inventor： Alastair Booth ,  Alvin Chua ,  Carl Chen ,  Marcus Dawber ,  Enchen Guo ,  Dennis Ong ,  Richard Tyldesley-Worster

IPC: H01J49/14 ,  H01J49/06

CPC classification number: H01J49/147 ,  H01J49/067

Abstract: A filament assembly for mounting to a source assembly of a mass spectrometer, the filament assembly comprising a body having one of: an aperture to receive a corresponding spigot provided by a source assembly; or a spigot to be received in a corresponding aperture on a source assembly.

公开(公告)号：US20190189417A1

公开(公告)日：2019-06-20

申请号：US16147683

申请日：2018-09-29

Applicant: PERKINELMER HEALTH SCIENCES CANADA, INC.

Inventor： Heather Gamble ,  Gholamreza Javahery ,  Lisa Cousins ,  Charles Jolliffe

IPC: H01J49/14 ,  H01J49/04 ,  G01N30/72

CPC classification number: H01J49/147 ,  G01N30/7206 ,  H01J27/205 ,  H01J49/0422 ,  H01J49/145

Abstract: An ion source comprising a chamber and an electron collector is described. In one configuration, the chamber comprises a sample inlet and an ion outlet. The chamber may also include an electron inlet configured to receive electrons from an electron source. The electron collector can be arranged in opposition to the electron inlet. The chamber can be configured to direct an electron beam from the electron source along a path with the chamber transverse to a path between the gas inlet and the ion outlet. The chamber may comprise an ion guide that includes a guide axis offset from an axis of the ion outlet.

公开(公告)号：US20170316928A1

公开(公告)日：2017-11-02

申请号：US15645147

申请日：2017-07-10

Applicant: Ian W. HUNTER ,  Brian D. HEMOND ,  Harold F. HEMOND

Inventor： Ian W. HUNTER ,  Brian D. HEMOND ,  Harold F. HEMOND

IPC: H01J49/30 ,  H01J49/02 ,  H01J49/00 ,  H01J49/24 ,  H01J49/14

CPC classification number: H01J49/30 ,  H01J49/0013 ,  H01J49/0031 ,  H01J49/022 ,  H01J49/147 ,  H01J49/24

Abstract: A miniature, low cost mass spectrometer capable of unit resolution over a mass range of 10 to 50 AMU. The mass spectrometer incorporates several features that enhance the performance of the design over comparable instruments. An efficient ion source enables relatively low power consumption without sacrificing measurement resolution. Variable geometry mechanical filters allow for variable resolution. An onboard ion pump removes the need for an external pumping source. A magnet and magnetic yoke produce magnetic field regions with different flux densities to run the ion pump and a magnetic sector mass analyzer. An onboard digital controller and power conversion circuit inside the vacuum chamber allows a large degree of flexibility over the operation of the mass spectrometer while eliminating the need for high-voltage electrical feedthroughs. The miniature mass spectrometer senses fractions of a percentage of inlet gas and returns mass spectra data to a computer.

公开(公告)号：US20170294298A1

公开(公告)日：2017-10-12

申请号：US15321563

申请日：2015-12-04

Applicant: Korea Basic Science Institute

Inventor： Mo YANG ,  Seung Yong KIM ,  Hyun Sik KIM ,  Wan Seop JEONG

IPC: H01J49/40 ,  H01J43/10

CPC classification number: H01J49/40 ,  H01J43/10 ,  H01J43/246 ,  H01J49/08 ,  H01J49/142 ,  H01J49/147

Abstract: Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.

公开(公告)号：US20170200598A1

公开(公告)日：2017-07-13

申请号：US15320953

申请日：2015-12-09

Applicant: Korea Basic Science Institute

Inventor： Seung Yong KIM ,  Mo YANG ,  Hyun Sik KIM

IPC: H01J49/08 ,  H01J49/42

CPC classification number: H01J49/08 ,  H01J49/147 ,  H01J49/422 ,  H01J49/424

Abstract: The present invention relates to an electron bean injection control of a mass spectrometer. A mass spectrometer of the present invention includes: a reference waveform generator configured to generate a reference waveform signal having one type of a square wave and a sine wave, a waveform generator configured to generate a sync signal synchronized with the reference waveform signal; an RF module configured to generate an RF voltage signal from the reference waveform signal and apply the RF voltage signal to an RF electrode in the ion trap, an electron beam generator configured to control an operation of an ultraviolet (UV) diode for generating an electron beam injected into the ion trap according to an input control signal, and a control circuit configured to generate the control signal by using the square wave signal.

公开(公告)号：US09666422B2

公开(公告)日：2017-05-30

申请号：US14891123

申请日：2014-08-29

Applicant: ATONARP INC.

Inventor： Prakash Sreedhar Murthy

IPC: H01J49/02 ,  H01J49/00 ,  H01J49/14 ,  H01J49/10

CPC classification number: H01J49/0031 ,  H01J49/025 ,  H01J49/06 ,  H01J49/107 ,  H01J49/147

Abstract: There is provided an analyzer including: an ionizer unit that ionizes molecules to be analyzed; a filter unit that selectively passes ions generated by the ionizer unit; and a detection unit that detects ions that have passed the filter unit. The detection unit includes a plurality of detection elements disposed in a matrix, and the analyzer further includes a first reconfiguration unit that switches between detection patterns including detection elements to be enabled for detection out of the plurality of detection elements. The ionizer unit includes a plurality of ion sources, and the analyzer further includes a driving control unit that switches the connections of the plurality of ion sources based on changes in characteristics of the ion sources.

公开(公告)号：US20170016863A1

公开(公告)日：2017-01-19

申请号：US15301129

申请日：2014-10-23

Applicant: LECO Corporation

Inventor： Anatoly N. VERENCHIKOV

IPC: G01N30/72 ,  H01J49/00 ,  H01J49/14 ,  H01J49/40

CPC classification number: G01N30/7206 ,  H01J49/0031 ,  H01J49/147 ,  H01J49/401 ,  H01J49/406

Abstract: A method of targeted mass spectrometric analysis is provided for analyzing trace compounds at sub-ppb level compared to sample matrix. Sample is chromatographically separated at standard conditions to employ a map of target mass (M) versus retention time (RT). Small mass ions under M(RT) are rejected by RF field, and remaining ions are accumulated for pulsed injection into a multi-reflecting TOF MS, either directly from EI source, or from linear RF trap or via a heated RF only quadrupole with axial ion trapping. In combination with EI source the method provides sub femtogram sensitivity at matrices loads in microgram range.

Abstract translation: 提供了一种靶向质谱分析方法，用于分析与样品基质相比亚ppb级别的痕量化合物。 样品在标准条件下进行色谱分离，以使用目标质量（M）与保留时间（RT）的对照。 在M（RT）下的小质量离子被RF场排斥，并且剩余的离子被累积用于脉冲注入到多反射TOF MS中，直接来自EI源，或者来自线性RF陷阱，或者通过加热的RF仅四极杆轴向 离子捕获。 与EI源组合，该方法在微克范围内的矩阵载荷下提供副飞镖敏感度。

公开(公告)号：US09401266B2

公开(公告)日：2016-07-26

申请号：US14341076

申请日：2014-07-25

Applicant: Bruker Daltonics, Inc.

Inventor： Maurizio Splendore ,  Felician Muntean ,  Roy P. Moeller

IPC: H01J49/00 ,  H01J49/14 ,  H01J27/20

CPC classification number: H01J49/147 ,  H01J27/205

Abstract: The invention provides a cathode system for an Electron Ionization (EI) source comprising a filament and current supply posts, the current supply posts dividing the filament into segments and each current supply post supplying or returning the current for at least two segments of the filament. Each filament segment is connected, for instance by spot welding, to the supply posts delivering the heating current. The filament segments may be arranged in a row, or substantially parallel to each other. Filament segments arranged in a row may form a closed loop, for instance, a ring. Other embodiments encompass the filament shape of a helical coil.

Abstract translation: 本发明提供了一种用于电离电离（EI）源的阴极系统，其包括灯丝和电流供应柱，电流供应柱将灯丝分成段，每个电流供应柱供应或返回灯丝的至少两个段的电流。 每个细丝段例如通过点焊连接到供给点，从而传递加热电流。 灯丝段可以排列成一排或基本上彼此平行。 排列成一行的细丝片可以形成闭环，例如环。 其他实施例包括螺旋线圈的丝状。

公开(公告)号：US20160172146A1

公开(公告)日：2016-06-16

申请号：US14950983

申请日：2015-11-24

Applicant: Agilent Technologies, Inc.

Inventor： Mingda Wang

IPC: H01J27/20 ,  H01J49/14 ,  H01J49/00

CPC classification number: H01J49/147

Abstract: An ion source is configured for soft electron ionization and produces a low electron-energy, yet high-intensity, electron beam. The ion source includes an electron source that produces the electron beam and transmits it into an ionization chamber. The electron beam interacts with sample material in the ionization chamber to produce an ion beam that may be transmitted to a downstream device. The electron source is configured for generating a virtual cathode upstream of the ionization chamber, which enhances the intensity of the electron beam.

Abstract translation: 离子源被配置为软电子电离，并产生低电子能量但高强度的电子束。 离子源包括产生电子束并将其传输到电离室中的电子源。 电子束与电离室中的样品材料相互作用，以产生可以传输到下游装置的离子束。 电子源被配置为在电离室的上游产生虚拟阴极，这增强了电子束的强度。

公开(公告)号：US20160111269A1

公开(公告)日：2016-04-21

申请号：US14967699

申请日：2015-12-14

Applicant: Carl Zeiss Microscopy GmbH ,  Carl Zeiss SMT GmbH

Inventor： Gennady Fedosenko ,  Michel Aliman ,  Hin Yiu Anthony Chung ,  Albrecht Ranck ,  Leonid Gorkhover

IPC: H01J49/04 ,  H01J49/14 ,  H01J49/00

CPC classification number: H01J49/04 ,  H01J49/0027 ,  H01J49/105 ,  H01J49/14 ,  H01J49/145 ,  H01J49/147

Abstract: The disclosure relates to a mass spectrometer for mass spectrometric examination of gas mixtures, including: an ionization device and an ion trap for storage and mass spectrometric examination of the gas mixture. In one aspect of the disclosure, the ionization device is embodied for supplying ions and/or metastable particles of an ionization gas and/or for supplying electrons to the ion trap for ionizing the gas mixture to be examined and the mass spectrometer is embodied to determine the number of ions and/or metastable particles of the ionization gas present in the ion trap and/or the number of ions of a residual gas present in the ion trap prior to examining the gas mixture. The disclosure also relates to the use of such a mass spectrometer and a method for mass spectrometric examination of a gas mixture.

Abstract translation: 本公开涉及用于气体混合物质谱检测的质谱仪，包括：用于气体混合物的存储和质谱检查的离子阱和离子阱。 在本公开的一个方面，电离装置被实施用于提供电离气体的离子和/或亚稳颗粒和/或用于向离子阱提供电子以电离待检查的气体混合物，并且体现质谱仪以确定 存在于离子阱中的离子和/或亚稳颗粒的数量和/或在检查气体混合物之前存在于离子阱中的残留气体的离子数。 本公开还涉及使用这种质谱仪和气体混合物的质谱检测方法。