Drum sputtering device
    2.
    发明授权

    公开(公告)号:US09920419B2

    公开(公告)日:2018-03-20

    申请号:US14424123

    申请日:2013-08-21

    Abstract: A drum sputtering device that can uniformly deposit target atoms on all over particles is provided. The drum sputtering device includes a vacuum container 2 that contains particles, a tubular drum 10 that is arranged inside the vacuum container 2 and at least one end face 10c of which is open, and a sputtering target 16 that is arranged inside the drum 10. With a supporting arm 11, a drive motor 12 for rotation, a drive motor 13 for swing, a first gear member 14, and a second gear member 15, the drum can be rotated around the axis of the drum 10 and the drum 10 can be swung so that one end portion 10e and the other end portion 10f in the axial direction of the drum 10 are relatively vertically switched.

    Vapour deposition
    7.
    发明授权
    Vapour deposition 有权
    气相沉积

    公开(公告)号:US09556509B2

    公开(公告)日:2017-01-31

    申请号:US13885593

    申请日:2011-11-21

    Abstract: A method, comprising: generating a vapor of a material from a source of said material comprising a plurality of separate solid pieces of said material supported on a surface of a base in a configuration in which said plurality of solid pieces of said target material are arranged at two or more levels to cover the whole of said surface of said base while providing a gap between adjacent pieces at the same level; and depositing said material from said vapor onto a substrate.

    Abstract translation: 一种方法,包括:从所述材料的源产生材料的蒸气,所述材料的蒸气包括多个分离的所述材料的固体块,所述多个独立的固体块支撑在基体的表面上,所述构型中所述多个所述目标材料的固体块被布置 在两个或更多个水平上以覆盖所述基座的整个所述表面,同时在相同水平面上的相邻块之间提供间隙; 以及将所述材料从所述蒸气沉积到基底上。

    Substrate processing system having symmetric RF distribution and return paths
    9.
    发明授权
    Substrate processing system having symmetric RF distribution and return paths 有权
    基板处理系统具有对称的RF分布和返回路径

    公开(公告)号:US09255322B2

    公开(公告)日:2016-02-09

    申请号:US13436776

    申请日:2012-03-30

    Abstract: A processing system may include a target having a central axis normal thereto; a source distribution plate having a target facing side opposing a backside of the target, wherein the source distribution plate includes a plurality of first features such that a first distance of a first radial RF distribution path along a given first diameter is about equal to a second distance of an opposing second radial RF distribution path along the given first diameter; and a ground plate opposing a target opposing side of the source distribution plate and having a plurality of second features disposed about the central axis and corresponding to the plurality of first features, wherein a third distance of a first radial RF return path along a given second diameter is about equal to a fourth distance of an opposing second radial RF return path along the given second diameter.

    Abstract translation: 处理系统可以包括具有与其正交的中心轴的目标; 源分布板,其具有与所述靶的背面相对的目标面对侧,其中所述源分配板包括多个第一特征,使得沿着给定第一直径的第一径向RF分配路径的第一距离大约等于第二特征 沿着给定的第一直径的相对的第二径向RF分配路径的距离; 以及与所述源分配板的目标相对侧相对的并且具有围绕所述中心轴线设置并对应于所述多个第一特征的多个第二特征的接地板,其中沿着给定的第二部分的第一径向RF返回路径的第三距离 直径约等于沿着给定的第二直径的相对的第二径向RF返回路径的第四距离。

    Indium target and manufacturing method thereof
    10.
    发明授权
    Indium target and manufacturing method thereof 有权
    铟靶及其制造方法

    公开(公告)号:US09139900B2

    公开(公告)日:2015-09-22

    申请号:US13504329

    申请日:2011-07-07

    CPC classification number: C23C14/3414 H01J37/3414 H01J37/3426 Y10T29/49991

    Abstract: The present invention provides an indium target and manufacturing method thereof, where deposition rate is high, initial discharge voltage is low, and deposition rate and discharge voltage, from the start of sputtering to the end of sputtering, are stable. In the indium target, an aspect ratio (length of longer direction/length of shorter direction) of crystal particle, observed from cross-section direction of the target, is 2.0 or less.

    Abstract translation: 本发明提供了一种铟靶及其制备方法,其沉积速率高,初始放电电压低,并且从溅射开始到溅射结束时的沉积速率和放电电压都是稳定的。 在铟靶中,从靶的截面方向观察到的结晶粒子的长径比(长度方向/长度方向的长度)为2.0以下。

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