Ambient illumination intensity determining method and apparatus, and storage medium

    公开(公告)号:US12067923B2

    公开(公告)日:2024-08-20

    申请号:US18548132

    申请日:2022-05-20

    发明人: Zhengqi Zhang

    IPC分类号: G09G3/20

    摘要: An ambient illumination intensity determining method and apparatus, and a storage medium are provided, and relate to the field of display technologies. In the method, a terminal device (20) includes a display (21, 304) and an ambient light sensor (12, 303), an ambient light detection area (211) is disposed in the display (21, 304), and the ambient light sensor (12, 303) is disposed in a coverage area of the ambient light detection area (211). When the display (21, 304) is turned on and an integration period of the ambient light sensor (12, 303) starts, a color value of a target color in the ambient light detection area (211) is determined; the ambient light detection area (211) is controlled to display the target color within the integration period; a first ambient illumination intensity is detected by the ambient light sensor (12, 303); a target impact value of both a brightness value of the display (21, 304) and the color value of the target color on the first ambient illumination intensity is determined; and the first ambient illumination intensity is corrected based on the target impact value to obtain a second ambient illumination intensity. In this way, the target color has a single color value, a target impact value calculation method is simple with high accuracy, and the obtained second ambient illumination intensity tends to be closer to a real ambient illumination intensity.

    Display device
    8.
    发明授权

    公开(公告)号:US12057042B2

    公开(公告)日:2024-08-06

    申请号:US18213172

    申请日:2023-06-22

    IPC分类号: G09G3/00 G09G3/20

    摘要: A display device includes: a display panel; and an inspection circuit at a non-display area. The display panel includes: first data lines at a display area; first connection lines at the non-display area; second data lines at the display area; and second connection lines at the non-display area. The inspection circuit includes: first transistors to be controlled by a first inspection signal of a first inspection line; second transistors to be controlled by a second inspection signal of a second inspection line; third transistors to be controlled by a third inspection signal of a third inspection line; fourth transistors to be controlled by a fourth inspection signal of a fourth inspection line; fifth transistors to be controlled by a fifth inspection signal of a fifth inspection line; and sixth transistors to be controlled by a sixth inspection signal of a sixth inspection line.