TEST INPUT INFORMATION SEARCH DEVICE AND METHOD

    公开(公告)号:US20180196738A1

    公开(公告)日:2018-07-12

    申请号:US15488557

    申请日:2017-04-17

    Applicant: HITACHI, LTD.

    CPC classification number: G06F11/3684 G06F17/30952 G06F17/30979

    Abstract: A test input information search device searches for a candidate for test inputting in a database, and stores information of the database including a plurality of elements configured with a first structure, stores screen information including the plurality of elements configured with a second structure and displayed, identifies, from the second structure, relation between the elements in the plurality of elements included in the screen information, and searches for, based on the identified relation between the elements, the plurality of elements as the candidate for the test inputting from the information of the database.

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