公开(公告)号：US11928628B2

公开(公告)日：2024-03-12

申请号：US17608467

申请日：2020-04-29

Applicant: Dürr Systems AG

Inventor： Dietmar Wieland ,  Oliver Iglauer-Angrik ,  Kevin Woll ,  Andreas Gienger ,  Oliver Sawodny

IPC: G06Q10/0633 ,  G05B19/418 ,  G06Q10/0639 ,  G06Q50/04

CPC classification number: G06Q10/0633 ,  G05B19/41875 ,  G06Q10/06395 ,  G06Q50/04 ,  G05B2219/32217 ,  G05B2219/37206 ,  G05B2219/45013

Abstract: In order to provide a checking facility for checking workpieces and also a treatment facility for treating workpieces, which enable efficient and reliable quality optimisation, it is proposed that workpiece parameters are detected, for example by means of an automatic checking station, and a workpiece-specific data set is created on this basis and/or from facility parameters.

公开(公告)号：US20190204809A1

公开(公告)日：2019-07-04

申请号：US16329964

申请日：2017-08-30

Applicant: Fraunhofer-Gesellschaft zu Förderung der angewandten Forschung e.V.

Inventor： Bernhard Stoevesandt ,  Matthias Schramm ,  Florian Sayer ,  Heiko Rosemann ,  Christian Dörsch

IPC: G05B19/4099 ,  B23C3/18

CPC classification number: G05B19/4099 ,  B23C3/18 ,  G05B19/41875 ,  G05B2219/32189 ,  G05B2219/32217 ,  G05B2219/32218 ,  G05B2219/35134 ,  G05B2219/37205 ,  G05B2219/37576 ,  G05B2219/37617 ,  G05B2219/45147 ,  G05B2219/50207 ,  Y02E10/721 ,  Y02P90/22

Abstract: The invention relates to a method and to system for producing blades (1) of a machine interacting with a fluid, in particular a fluid-driven machine, in particular a wind turbine, comprising an examination device (19) for determining geometric deviations (A, B, C, D, E, F) from a target shape for one or more shaped blades (1), a device (21) for determining a deviation evaluation of one or more determined geometric deviations from the target shape for each blade with respect to the aerodynamic and/or mechanical consequences thereof, a device (23) for assigning one or more corrective measures (100, 101, 102), each including an expenditure evaluation (100″, 101″, 102″), to one or more determined geometric deviations (A, B, C, D, E, F) from the target shape for each blade, and a linking device (24) for linking a deviation evaluation that was determined for one or more of the determined geometric deviations to the expenditure evaluation for one or more determined corrective measures and for determining the corrective measures to be carried out from the result of the linkage.

公开(公告)号：US06740534B1

公开(公告)日：2004-05-25

申请号：US10246341

申请日：2002-09-18

Applicant: Ernest D. Adams, III ,  Matthew A. Purdy ,  Gregory A. Cherry ,  Eric O. Green ,  Elfido Coss, Jr. ,  Brian K. Cusson ,  Naomi M. Jenkins ,  Patrick M. Cowan

Inventor： Ernest D. Adams, III ,  Matthew A. Purdy ,  Gregory A. Cherry ,  Eric O. Green ,  Elfido Coss, Jr. ,  Brian K. Cusson ,  Naomi M. Jenkins ,  Patrick M. Cowan

IPC: G01R3126

CPC classification number: H01L22/20 ,  G05B19/41875 ,  G05B2219/32217 ,  G05B2219/32222 ,  H01L2223/54453 ,  Y02P90/14 ,  Y02P90/22

Abstract: A method and an apparatus for the determination of a process flow based upon fault detection. A process step upon a workpiece is performed. Fault detection analysis based upon the process step performed upon the workpiece is performed. A workpiece routing process is performed based upon the fault detection analysis. The wafer routing process includes using a controller to perform one or a rework process routing, a non-standard process routing, a fault verification process routing, a normal process routing, or a termination process routing, based upon the fault detection analysis.

Abstract translation: 一种用于基于故障检测来确定处理流程的方法和装置。 执行工件上的工艺步骤。 执行基于对工件执行的工艺步骤的故障检测分析。 基于故障检测分析进行工件布线过程。 基于故障检测分析，晶圆路由过程包括使用控制器来执行一个或返工过程路由，非标准过程路由，故障验证过程路由，正常过程路由或终止过程路由。

公开(公告)号：US20240232760A9

公开(公告)日：2024-07-11

申请号：US18402412

申请日：2024-01-02

Applicant: Dürr Systems AG

Inventor： Dietmar Wieland ,  Oliver Iglauer-Angrik ,  Kevin Woll ,  Andreas Gienger ,  Oliver Sawodny

IPC: G06Q10/0633 ,  G05B19/418 ,  G06Q10/0639 ,  G06Q50/04

CPC classification number: G06Q10/0633 ,  G05B19/41875 ,  G06Q10/06395 ,  G06Q50/04 ,  G05B2219/32217 ,  G05B2219/37206 ,  G05B2219/45013

Abstract: In order to provide a checking facility for checking workpieces and also a treatment facility for treating workpieces, which enable efficient and reliable quality optimisation, it is proposed that workpiece parameters are detected, for example by means of an automatic checking station, and a workpiece-specific data set is created on this basis and/or from facility parameters.

公开(公告)号：US20240135289A1

公开(公告)日：2024-04-25

申请号：US18402412

申请日：2024-01-02

Applicant: Dürr Systems AG

Inventor： Dietmar Wieland ,  Oliver Iglauer-Angrik ,  Kevin Woll ,  Andreas Gienger ,  Oliver Sawodny

IPC: G06Q10/0633 ,  G05B19/418 ,  G06Q10/0639 ,  G06Q50/04

CPC classification number: G06Q10/0633 ,  G05B19/41875 ,  G06Q10/06395 ,  G06Q50/04 ,  G05B2219/32217 ,  G05B2219/37206 ,  G05B2219/45013

Abstract: In order to provide a checking facility for checking workpieces and also a treatment facility for treating workpieces, which enable efficient and reliable quality optimisation, it is proposed that workpiece parameters are detected, for example by means of an automatic checking station, and a workpiece-specific data set is created on this basis and/or from facility parameters.

公开(公告)号：US11880178B1

公开(公告)日：2024-01-23

申请号：US16929500

申请日：2020-07-15

Applicant: Ectoscan Systems, LLC

Inventor： Paul E. Thomson ,  Adam R. Gerlach

IPC: G05B19/042 ,  G06T7/73 ,  G01B21/20 ,  G01B11/24

CPC classification number: G05B19/0426 ,  G01B11/24 ,  G01B21/20 ,  G06T7/75 ,  G05B2219/32217 ,  G06T2207/30004

Abstract: A surface data acquisition, storage, and assessment system for detecting and quantifying similarities or differences between scanned surface data before and after the surface has been acted upon by a surface altering element.

公开(公告)号：US20120330447A1

公开(公告)日：2012-12-27

申请号：US13373456

申请日：2011-11-15

Applicant: Adam R. Gerlach ,  Paul Thomas ,  Bruce Walker

Inventor： Adam R. Gerlach ,  Paul Thomas ,  Bruce Walker

IPC: G06F19/00 ,  G06T15/00 ,  G06K9/00

CPC classification number: G05B19/0426 ,  G01B11/24 ,  G01B21/20 ,  G05B2219/32217 ,  G06T7/75 ,  G06T2207/30004

Abstract: A surface data acquisition, storage, and assessment system for detecting and quantifying similarities or differences between stored data and data collected from a scan. The system operates utilizing a method that decreases the time required for calculating a pose estimate thus increasing its performance making it more practical for applications that require real-time operations. In a preferred embodiment the system comprises one or more sensing components for scanning and measuring surface features of an object for determining the identity of the object, and determines differences between data obtained from two or more scans.

Abstract translation: 表面数据采集，存储和评估系统，用于检测和量化从扫描收集的存储数据和数据之间的相似性或差异。 该系统利用减少计算姿态估计所需的时间的方法进行操作，从而提高其性能，使其对于需要实时操作的应用更为实用。 在优选实施例中，系统包括用于扫描和测量对象的表面特征以确定对象的身份的一个或多个感测组件，并且确定从两个或多个扫描获得的数据之间的差异。

公开(公告)号：US20230258575A1

公开(公告)日：2023-08-17

申请号：US17989583

申请日：2022-11-17

Applicant: Sigma Labs, Inc.

Inventor： Darren Beckett ,  Roger Frye ,  Christina Xuan Yu ,  Scott Betts ,  Lars Jacquemetton ,  Kevin C. Anderson

IPC: G01N21/95 ,  G01N21/88 ,  B29C64/393 ,  B29C64/135 ,  B29C64/153 ,  B22F10/366 ,  G05B19/4099 ,  B33Y10/00 ,  B33Y50/02 ,  G06N20/00 ,  B22F10/85

CPC classification number: G01N21/95 ,  G01N21/8806 ,  B29C64/393 ,  B29C64/135 ,  B29C64/153 ,  B22F10/366 ,  G05B19/4099 ,  B33Y10/00 ,  B33Y50/02 ,  G06N20/00 ,  B22F10/85 ,  G05B2219/32217 ,  G01N2021/8845

Abstract: An additive manufacturing system comprises an apparatus arranged to distribute layer of metallic powder across a build plane and a power source arranged to emit a beam of energy at the build plane and fuse the metallic powder into a portion of a part. The system includes a processor configured to steer the beam of energy across the build plane and receive data generated by one or more sensors that detect electromagnetic energy emitted from the build plane when the beam of energy fuses the metallic powder. The received data is converted into one or more parameters that indicate one or more conditions at the build plane while the beam of energy fuses the metallic powder. The one or more parameters are used as input into a machine learning algorithm to detect one or more defects in the fused metallic powder.

公开(公告)号：US20170227942A1

公开(公告)日：2017-08-10

申请号：US15417902

申请日：2017-01-27

Applicant: EctoScan Systems, LLC

Inventor： Paul Thomson ,  Adam R. Gerlach ,  Bruce Walker

IPC: G05B19/042 ,  G01B21/20

CPC classification number: G05B19/0426 ,  G01B11/24 ,  G01B21/20 ,  G05B2219/32217 ,  G06T7/75 ,  G06T2207/30004

Abstract: A surface data acquisition, storage, and assessment system for detecting and quantifying similarities or differences between stored data and data collected from a scan. The system operates to scan features of an object and weighs various parameters and utilizing fuzzy logic makes a recommendation.

公开(公告)号：US20100204940A1

公开(公告)日：2010-08-12

申请号：US12367564

申请日：2009-02-09

Applicant: Gasner J. Barthold ,  Hari V. Mallela ,  Yunsheng Song

Inventor： Gasner J. Barthold ,  Hari V. Mallela ,  Yunsheng Song

IPC: G06F7/06 ,  G06F17/30 ,  G06F19/00

CPC classification number: G06Q10/00 ,  G05B19/41875 ,  G05B2219/32212 ,  G05B2219/32217 ,  G05B2219/32237 ,  G05B2219/45031 ,  Y02P90/22 ,  Y02P90/26

Abstract: According to an embodiment of the present invention is to provide methods to evaluate the impact of scrapped wafers on the remaining wafers in a lot by using scrap codes and statistical models. An embodiment of the present invention provides a method to obtain a baseline lot population by using cluster analysis model and functional limited yields. The functional limited yields may be for example chain limited yield, dc limited yield, or ac abist limited yield. By utilizing statistical modeling it is possible to determine which failures have an impact on the lot yield and require rework for the lot. In addition by monitoring the impact of failures, it is possible to determine if corrective actions need to be taken for lots that passed through a process prior to correction of the fault.

Abstract translation: 根据本发明的一个实施例是提供通过使用废品代码和统计模型来评估废弃晶片对剩余的晶片的影响的方法。 本发明的一个实施例提供了一种通过使用聚类分析模型和功能有限产量来获得基线批次群体的方法。 功能有限的产量可以是例如链有限的产量，直流限制产量或交换有限的产量。 通过利用统计建模，可以确定哪些失败对批量产量有影响，并需要对批次进行返工。 此外，通过监测故障的影响，可以确定在纠正故障之前通过过程的批次是否需要采取纠正措施。