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    ELECTRONIC DEVICE TEST APPARATUS AND METHOD OF TESTING ELECTRONIC DEVICES
    1.
    发明申请
    ELECTRONIC DEVICE TEST APPARATUS AND METHOD OF TESTING ELECTRONIC DEVICES 审中-公开
    电子设备测试装置和测试电子设备的方法

    公开(公告)号：US20100147088A1

    公开(公告)日：2010-06-17

    申请号：US12161067

    申请日：2006-01-17

    Applicant: Akihiko Ito ,  Koya Karino ,  Yoshihito Kobayashi

    Inventor： Akihiko Ito ,  Koya Karino ,  Yoshihito Kobayashi

    IPC: G01N1/00 ,  G01R31/02

    CPC classification number: G01R31/2893

    Abstract: An electronic device test apparatus used for bringing the ICs into electrical contact with contact parts of the test head in the state where the ICs are held on a test tray and running tests on the electrical characteristics of ICs, the electronic device test apparatus including an inversion system for rotating the test tray which holds a plurality of ICs in a direction dropping ICs which are insufficiently held at least once before testing.

    Abstract translation: 一种电子设备测试装置，用于在IC保持在测试托盘上的状态下使IC与测试头的接触部分电接触，并对IC的电气特性进行运行测试，电子设备测试设备包括反演 系统，用于使测试托盘旋转，所述测试托盘在测试之前沿着不足够保持至少一次的IC的方向保持多个IC。

    Test tray positioning stopper mechanism for automatic handler
    3.
    发明授权
    Test tray positioning stopper mechanism for automatic handler 失效
    测试盘定位止动机构，用于自动处理

    公开(公告)号：US5625287A

    公开(公告)日：1997-04-29

    申请号：US410821

    申请日：1995-03-27

    Applicant: Hiroto Nakamura ,  Makoto Sagawa ,  Yoshihito Kobayashi

    Inventor： Hiroto Nakamura ,  Makoto Sagawa ,  Yoshihito Kobayashi

    IPC: G01R31/26 ,  B23Q7/14 ,  B23Q16/00 ,  B65G47/88 ,  G01R31/02 ,  G01R31/28

    CPC classification number: B23Q7/1447 ,  B23Q16/001 ,  G01R31/2851 ,  G01R31/2893

    Abstract: An automatic handler for an IC test system is disclosed which is capable of reducing a time for transferring IC devices to be tested from a supply area to a test head area and from the test head area to a discharge area. The automatic handler includes a test tray for loading the IC devices to be tested in which the IC devices to be tested are aligned in the test tray with a shorter distance with one another than a distance between test contactors in the test head area, a pair of positioning stoppers provided in the test head area along a moving direction of the test tray in which the positioning stoppers are spaced by the distance equal to the distance of the IC devices to be tested in the test tray. In the automatic handler, the distance of the contactors is adjusted to an integer multiple of the distance of the IC devices to be tested in the test tray. One of the positioning stoppers contacts the test tray to determine a first position for testing the IC devices in a first line in the test tray, and then the test tray is transferred until other positioning stoppers contacts the test tray in a second position for testing the IC devices in a second line in the test tray. The test tray is then transferred to the discharge area. Another aspect of the automatic handler is provided with a groove on the test tray to increase a number of test position for the test tray. The groove includes an end surface which engages with the positioning stoppers.

    Abstract translation: 公开了一种用于IC测试系统的自动处理器，其能够减少从供应区域到测试头区域以及从测试头区域到放电区域传送要测试的IC设备的时间。 自动处理机包括用于加载要测试的IC器件的测试托盘，其中待测试的IC器件在测试托架中彼此相距距离短于测试头区域中的测试接触器之间的距离，一对 沿着测试盘的移动方向设置在测试头区域中的定位止动件，其中定位止动件间隔距离等于待测试的IC器件在测试托盘中的距离。 在自动处理机中，将接触器的距离调整为测试盘中要测试的IC器件的距离的整数倍。 其中一个定位止动器接触测试托盘，以确定测试托盘中第一行中IC器件的第一位置，然后传输测试托盘，直到其他定位止动器在第二个位置接触测试托盘，以便测试 IC器件位于测试托盘的第二行。 然后将测试托盘转移到排放区域。 自动处理机的另一方面在测试托盘上设置有凹槽以增加测试托盘的测试位置的数量。 凹槽包括与定位止动件接合的端面。

    Photosensitive composition
    5.
    发明授权
    Photosensitive composition 失效

    公开(公告)号：US5100768A

    公开(公告)日：1992-03-31

    申请号：US519397

    申请日：1990-05-04

    Applicant: Hirokazu Niki ,  Yasunobu Onishi ,  Yoshihito Kobayashi ,  Rumiko Hayase

    Inventor： Hirokazu Niki ,  Yasunobu Onishi ,  Yoshihito Kobayashi ,  Rumiko Hayase

    IPC: G03F7/004

    CPC classification number: G03F7/0045

    Abstract: A photosensitive composition contains an alkali-soluble polymer having a phenol skeleton in its structure and a heterocyclic compound represented by formula (I-1) or (I-2), formula (II-1) or (II-2), any of formulas (III-1) to (III-8), any of formulas (IV-1) to (IV-12), or any of formulas (V-1) to (V-4) described in the claims and specification. A photosensitive composition containing a heterocyclic compound represented by formula (I-1) or (I-2), any of formulas (III-1) to (III-8), any of formulas (IV-1) to (IV-12), or any of formulas (V-1) to (V-4) can be suitably used as a negative resist. A photosensitive composition containing a heterocyclic compound represented by formula (II-1) or (II-2) can be suitably used as a positive resist. A photosensitive composition containing an alkali-soluble polymer having a phenol skeleton in its structure and a polymer having a nitrogen-containing heterocyclic compound as a polymeric unit is also included in this invention. The latter photosensitive composition can further contain a heterocyclic compound represented by any of formulas (VI-1) to (VI-15) described in the claims and specification.

    Tester for semiconductor devices and test tray used for the same
    6.
    发明授权
    Tester for semiconductor devices and test tray used for the same 失效
    用于半导体器件和测试托盘的测试仪用于相同

    公开(公告)号：US06459259B1

    公开(公告)日：2002-10-01

    申请号：US09254084

    申请日：1999-02-26

    Applicant: Akihiko Ito ,  Yoshihito Kobayashi ,  Yoshiyuki Masuo ,  Tsuyoshi Yamashita

    Inventor： Akihiko Ito ,  Yoshihito Kobayashi ,  Yoshiyuki Masuo ,  Tsuyoshi Yamashita

    IPC: B65G4300

    CPC classification number: G01R31/2893 ,  G01R31/01 ,  G01R31/2851 ,  G01R31/2867

    Abstract: An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber 4 and the exit chamber 5 is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray 3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber 41 in the constant temperature chamber 4 through the testing section 42 in the constant temperature chamber 4 to the exit chamber 5 so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.

    Abstract translation: 提供了一种能够在所有要测试的IC上测试完成之前减少所需时间的IC测试器。 恒温室4和出口室5的深度（Y轴方向的长度）以相当于矩形试验盘3的一个横向宽度（小边的长度）的尺寸扩大， 平行的测试托盘传送路径或者可选地，加宽的测试托盘传送路径足够宽以与横向于加宽的测试托盘传送路径的方向并置的两个测试托盘同时传送两个测试托盘设置在从托盘传送路径延伸的部分 恒温室4中的浸泡室41通过恒温室4中的检测部分42到出口室5，从而沿着两个试纸盘传送路径或加宽的试纸盘传送路径同时传送两个试纸盘。

    Test tray positioning stopper mechanism for automatic handler
    8.
    发明授权
    Test tray positioning stopper mechanism for automatic handler 失效
    测试盘定位止动机构，用于自动处理

    公开(公告)号：US5973493A

    公开(公告)日：1999-10-26

    申请号：US725377

    申请日：1996-10-03

    Applicant: Hiroto Nakamura ,  Makoto Sagawa ,  Yoshihito Kobayashi

    Inventor： Hiroto Nakamura ,  Makoto Sagawa ,  Yoshihito Kobayashi

    IPC: G01R31/26 ,  B23Q7/14 ,  B23Q16/00 ,  B65G47/88 ,  G01R31/02 ,  G01R31/28

    CPC classification number: B23Q7/1447 ,  B23Q16/001 ,  G01R31/2851 ,  G01R31/2893

    Abstract: A mechanism for positioning IC devices to be tested aligned in a test tray of an automatic handler for an IC test system capable of reducing a time for transferring the test tray from a supply area to a test head area which has a plurality of test contactors and from a test head area to a discharge area is disclosed. The mechanism includes a stopper which determines the first stop position of the test tray when said test tray contacts with the outer surface of the test tray and the second stop position of the test tray when said stopper contacts with the end surface of a groove being provided with on its side portion of the test tray to receive and engage with the projection of the stopper. The distance between the adjacent test contactors is adjusted to be equal to two times or integer multiple of the distance between the adjacent IC devices to be tested aligned in the test tray and the distance between the first position and the second position is adjusted to be equal to the distance between the adjacent IC devices to be tested so that minimizing the index time for transferring the test tray becomes possible.

    Abstract translation: 一种用于将待测试的IC器件定位在用于IC测试系统的自动处理器的测试盘中的机构，其能够减少用于将测试托盘从供应区域传送到具有多个测试接触器的测试头区域的时间，以及 从测试头区域到放电区域被公开。 所述机构包括：当所述止动件与所述槽的端面接触时，所述止动件确定所述测试托盘与所述测试托盘的外表面和所述测试托盘的第二停止位置接触时所述测试托盘的第一停止位置 其在其测试托盘的侧部接收并接合止动器的突起。 将相邻的测试接触器之间的距离调整为等于测试托盘中待测试的相邻IC器件之间距离的两倍或整数倍，并将第一位置与第二位置之间的距离调整为相等 到待测试的相邻IC器件之间的距离，使得最小化传送测试托盘的索引时间成为可能。

    Device transfer apparatus and device reinspection method for IC handler
    9.
    发明授权
    Device transfer apparatus and device reinspection method for IC handler 失效
    IC处理程序的设备传送设备和设备重新检测方法

    公开(公告)号：US5772387A

    公开(公告)日：1998-06-30

    申请号：US497223

    申请日：1995-06-30

    Applicant: Hiroto Nakamura ,  Yoshihito Kobayashi ,  Katsuhiko Suzuki

    Inventor： Hiroto Nakamura ,  Yoshihito Kobayashi ,  Katsuhiko Suzuki

    IPC: G01R31/01 ,  G01R31/28 ,  H01L21/00 ,  H05K13/08 ,  B65B21/02

    CPC classification number: H01L21/67271 ,  G01R31/2851 ,  G01R31/2893 ,  H05K13/08 ,  G01R31/01

    Abstract: An IC transfer system can be used in conjunction with either a tray type magazine or a rod-shaped magazine. A device reinspection method in the IC test handler reinspects the DUT stored in the magazine without human intervention, sorts in accordance with the test results, and stores in the magazine and the customer tray. For this purpose, a tray supply section transfers a user tray (170) to a test tray (180), whereas a magazine supply section (152) and a pick carrier section (112) transfer a rod-shaped magazine (150) to the test tray (180). An inspection setting sets the number of reinspections, the classification of inspection results, and the storage tray/magazine. The DUT (215) is loaded (203) from the magazine to the test tray (180) and is tested (204). After testing (204), a judgement is made whether or not the reinspection mode is effective. If the reinspection mode is effective, the DUT (215) to be reinspected are all stored (206) in the unloader section (223) , and transferred (207) to the loader section (222) using the tray transfer system (227). When the reinspection mode is completed, the DUT (215) is sorted by the category and stored (212) , and the testing is completed (213).

    Abstract translation: IC传输系统可以与托盘型杂志或棒状杂志一起使用。 IC测试处理器中的器件重新检查方法重新检查储存在杂志中的DUT，无需人为干预，按照测试结果进行排序，并存储在杂志和客户托盘中。 为此目的，托盘供应部分将用户托盘（170）传送到测试托盘（180），而料盒供应部分（152）和拾取托架部分（112）将棒形盒（150）转移到 测试盘（180）。 检查设置设置回访次数，检查结果分类和存储托盘/杂志。 DUT（215）从盒装载（203）到测试托盘（180）并经过测试（204）。 测试（204）后，判断再检测模式是否有效。 如果重新检查模式有效，则要重新检查的DUT（215）全部被存储在卸载器部分（223）中，并且使用托盘传送系统（227）传送到加载器部分（222）。 当重新检查模式完成时，DUT（215）按类别排序并存储（212），测试完成（213）。

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