Invention Grant
- Patent Title: Electric device testing apparatus
- Patent Title (中): 电器测试仪器
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Application No.: US09456408Application Date: 1999-12-08
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Publication No.: US06445203B1Publication Date: 2002-09-03
- Inventor: Tsuyoshi Yamashita , Yoshihito Kobayashi , Toshiyuki Kiyokawa , Hiroto Nakamura , Noriyuki Igarashi , Kenichi Shimada
- Applicant: Tsuyoshi Yamashita , Yoshihito Kobayashi , Toshiyuki Kiyokawa , Hiroto Nakamura , Noriyuki Igarashi , Kenichi Shimada
- Priority: JP10-348278 19981208; JP10-349790 19981209; JP10-349791 19981209
- Main IPC: G01R3102
- IPC: G01R3102
Abstract:
An electric device testing apparatus comprises a connection terminal to which an IC chip to be tested is removably connected, a pusher for pushing the IC chip in the direction of the connection terminal in order to connect the IC chip to the connection terminal, and temperature adjusted air supply for blowing a temperature adjusted air to around the IC chip during a test on the IC chip via a through hole formed on the pushed.
Information query
