CURRENT LEAKAGE MANAGEMENT CONTROLLER FOR READING FROM MEMORY CELLS

    公开(公告)号:US20230023614A1

    公开(公告)日:2023-01-26

    申请号:US17385313

    申请日:2021-07-26

    Applicant: Xilinx, Inc.

    Abstract: First and second sensing circuits are coupled to first and second data lines, respectively, and sense levels of current leakage or a memory cell state on the first and second data lines. First and second keeper circuits are coupled to the first and second data lines, respectively, and drive the first and second data lines by a voltage supply through biased transistors. First and second leakage latches are coupled to receive and latch state of signals output from the first and second sensing circuits, respectively. A control circuit is coupled to the first leakage latch, second leakage latch, and outputs of the first and second sensing circuits. The control circuit is configured to select either the signal output from the first sensing circuit or the signal output from the second sensing circuit in response to states of the first and second leakage latches.

    Current leakage management controller for reading from memory cells

    公开(公告)号:US12148464B2

    公开(公告)日:2024-11-19

    申请号:US17385313

    申请日:2021-07-26

    Applicant: Xilinx, Inc.

    Abstract: First and second sensing circuits are coupled to first and second data lines, respectively, and sense levels of current leakage or a memory cell state on the first and second data lines. First and second keeper circuits are coupled to the first and second data lines, respectively, and drive the first and second data lines by a voltage supply through biased transistors. First and second leakage latches are coupled to receive and latch state of signals output from the first and second sensing circuits, respectively. A control circuit is coupled to the first leakage latch, second leakage latch, and outputs of the first and second sensing circuits. The control circuit is configured to select either the signal output from the first sensing circuit or the signal output from the second sensing circuit in response to states of the first and second leakage latches.

    Circuit for and method of accessing memory elements in an integrated circuit device

    公开(公告)号:US10396799B1

    公开(公告)日:2019-08-27

    申请号:US15839462

    申请日:2017-12-12

    Applicant: Xilinx, Inc.

    Abstract: A circuit for accessing memory elements in an integrated circuit device is described. The circuit comprises a first plurality of memory elements; first line drivers, each of the first line drivers configured to provide a signal to a memory element of the first plurality of memory elements; first line driver buffers configured to control the signals provided by the first line drivers to the first plurality of memory elements; a second plurality of memory elements; second line drivers, each of the second line drivers configured to provide a signal to a memory element of the second plurality of memory elements; second line driver buffers configured to control the signals provided by the second line drivers to the second plurality of memory elements; and wherein one or both of the first line driver buffers and the second line driver buffers are configured to be selectively disabled.

Patent Agency Ranking