Abstract:
A METHOD FOR MEASURING ION BEAM HOMOGENEITY IN HIGH ENERGY ACCELERATING EQUIPMENT BY PLACING A WAFER OF A THERMAL OXIDE IN THE PATH OF THE BEAM, BOMBARDING THE WAFER WITH IONS, ETCHING THE WAFER WITH ACID AND MEASURING THE DISCONTINUITY IN THE BOMBARDED SURFACE TO DETERMINE THE LOCATION OF VARIATIONS IN INTENSITY IN THE BEAM.
Abstract:
Schottky barrier detector arrays for detecting the infrared portion of the spectrum connected through enhancement mode field effect transistors to a charge coupled device for read out. The system utilizes a voltage to charge conversion to provide an infrared camera device vidicon.