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    Communication apparatus and method
    1.
    发明授权
    Communication apparatus and method 有权

    公开(公告)号：US11296733B2

    公开(公告)日：2022-04-05

    申请号：US16930445

    申请日：2020-07-16

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Seok Ju Yun ,  Joonseong Kang

    IPC: H04L27/02 ,  H04B1/04 ,  H04W24/08 ,  H04L27/10 ,  H04L27/18

    Abstract: A communication apparatus and a communication method are provided. The communication apparatus includes an antenna configured to receive a wireless signal, an oscillator driven by a driving current and configured to generate an oscillating signal based on the wireless signal, a measurer configured to measure an oscillation degree of the oscillating signal, and an accumulator configured to accumulate a difference between a target value and a measurement value of the oscillation degree. A value of the wireless signal is determined based on a cumulative signal corresponding to the accumulated difference.

    Wireless communication apparatus and method
    2.
    发明授权
    Wireless communication apparatus and method 有权

    公开(公告)号：US11152974B2

    公开(公告)日：2021-10-19

    申请号：US16567441

    申请日：2019-09-11

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Seok Ju Yun ,  Sang Joon Kim ,  Joonseong Kang

    IPC: H03L7/00 ,  H04B5/00 ,  H04B13/00

    Abstract: A wireless communication apparatus may include: an oscillator including a coil assembly exposed to an outside of the wireless communication apparatus, a variable capacitor, and a negative resistor; and a phase locking circuit connected to the coil assembly and the negative resistor. The phase locking circuit may be configured to generate a control signal to lock an oscillation frequency of the oscillator based on an oscillation signal generated by the oscillator, and provide the generated control signal to the variable capacitor.

    Apparatus and method for calibrating frequency of oscillator in response to external signal
    4.
    发明授权
    Apparatus and method for calibrating frequency of oscillator in response to external signal 有权

    公开(公告)号：US10425039B2

    公开(公告)日：2019-09-24

    申请号：US15664732

    申请日：2017-07-31

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Seok Ju Yun

    IPC: H03B5/12 ,  H03L7/093 ,  H03L7/099 ,  H03L7/00 ,  H03L7/06 ,  H03L7/18

    Abstract: A frequency calibrator includes an input signal generator configured to generate an input signal based on an oscillation signal and an external signal; a frequency difference extractor configured to extract, from the input signal, a frequency difference signal having a frequency corresponding to a frequency difference between an external frequency of the external signal and an oscillation frequency of the oscillation signal; a divider configured to generate a division signal by dividing a signal having the oscillation frequency by a division ratio; and a frequency tuner configured to tune the oscillation frequency of the oscillation signal based on a result of comparing the frequency difference signal to the division signal.

    Memory and method with in-memory computing defect detection
    10.
    发明授权
    Memory and method with in-memory computing defect detection 有权

    公开(公告)号：US12198775B2

    公开(公告)日：2025-01-14

    申请号：US18091258

    申请日：2022-12-29

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Sungmeen Myung ,  Seok Ju Yun ,  Jaehyuk Lee ,  Seungchul Jung

    IPC: G11C13/00 ,  G11C29/00 ,  G11C29/36 ,  G11C29/44

    Abstract: A method and memory device with in-memory computing defection detection is disclosed. A memory device includes a memory including banks, wherein each bank includes a respective plurality of bit-cells, an in-memory computation (IMC) operator configured to perform an IMC operation between first data while the first data is in the bit-cells of the memory and second data received as input to the memory device, wherein the banks share the operator, and wherein the memory device is configured to: generate a first test pattern that is stored in the memory and generate a second test pattern applied to the IMC operator, and based thereon determine whether a defect has occurred in either the memory or the operator, and perform a repair based on the determination that a defect has occurred.

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