公开(公告)号：US12062402B2

公开(公告)日：2024-08-13

申请号：US17385493

申请日：2021-07-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Byungsoo Kim ,  Hyunggon Kim ,  Kyungsoo Park ,  Sejin Baek ,  Sangbum Yun

IPC: G11C16/26 ,  G11C16/04 ,  G11C16/08 ,  G11C16/10 ,  G11C16/24 ,  G11C16/30 ,  G11C16/34

CPC classification number: G11C16/3459 ,  G11C16/0433 ,  G11C16/08 ,  G11C16/102 ,  G11C16/24 ,  G11C16/26 ,  G11C16/30

Abstract: A non-volatile memory device including a memory cell array including a plurality of cell strings, wherein each cell string of the plurality of cell stings includes a string selection transistor, a plurality of memory cells, and a ground selection transistor connected in series between a bit line and a common source line; and a control circuit configured to perform a program operation on a selected memory cell from among the plurality of memory cells and pre-charge a selected cell string including the selected memory cell in a pre-charge section included in a verification section, wherein the selected cell string is pre-charged as a first pre-charge voltage is applied to a selected bit line connected to the selected memory cell.

公开(公告)号：US12039186B2

公开(公告)日：2024-07-16

申请号：US17875569

申请日：2022-07-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Suyong Kim ,  Junyong Park ,  Sangbum Yun ,  Ilhan Park

IPC: G06F3/06

CPC classification number: G06F3/0653 ,  G06F3/0604 ,  G06F3/0679

Abstract: A method of testing a suspend operation, the method including: determining whether to transfer a suspend sampling signal to a suspend command circuit at a time point prior to each of a plurality of suspend operation time points stored in a sequence operation circuit; transferring the suspend sampling signal from the sequence operation circuit to the suspend command circuit; generating an internal suspend operation command based on the suspend sampling signal; transferring the internal suspend operation command from the suspend command circuit to the sequence operation circuit; performing suspend operations for all the plurality of suspend operation time points in response to the internal suspend operation command; and determining whether the suspend operations are performed at all of the suspend operation time points.

公开(公告)号：US11626171B2

公开(公告)日：2023-04-11

申请号：US17201828

申请日：2021-03-15

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Joonsuc Jang ,  Hyunggon Kim ,  Sangbum Yun ,  Dongwook Kim ,  Kyungsoo Park ,  Sejin Baek

IPC: G11C16/34 ,  G11C16/10 ,  G11C16/26 ,  G11C16/30 ,  G11C7/10 ,  G11C16/24

Abstract: A method of programming a nonvolatile memory device includes performing a single-pulse program operation in a program loop, determining whether a condition is satisfied in the a program loop, and performing a multi-pulse program operation in a next program loop when the condition is satisfied. The single-pulse program operation includes applying a first program pulse and applying plural verification pulses, the multi-pulse program operation includes applying a second program pulse, applying a third program pulse, and applying plural verification pulses, and each of the second program pulse and the third program pulse has a level lower than a level of the first program pulse.

公开(公告)号：US11823753B2

公开(公告)日：2023-11-21

申请号：US18128596

申请日：2023-03-30

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Joonsuc Jang ,  Hyunggon Kim ,  Sangbum Yun ,  Dongwook Kim ,  Kyungsoo Park ,  Sejin Baek

IPC: G11C16/34 ,  G11C16/10 ,  G11C16/26 ,  G11C16/30 ,  G11C7/10 ,  G11C16/24

CPC classification number: G11C16/3459 ,  G11C7/106 ,  G11C7/1045 ,  G11C7/1048 ,  G11C7/1087 ,  G11C16/10 ,  G11C16/24 ,  G11C16/26 ,  G11C16/30

Abstract: A method of programming a nonvolatile memory device includes performing a single-pulse program operation in a program loop, determining whether a condition is satisfied in the a program loop, and performing a multi-pulse program operation in a next program loop when the condition is satisfied. The single-pulse program operation includes applying a first program pulse and applying plural verification pulses, the multi-pulse program operation includes applying a second program pulse, applying a third program pulse, and applying plural verification pulses, and each of the second program pulse and the third program pulse has a level lower than a level of the first program pulse.

公开(公告)号：US20230143341A1

公开(公告)日：2023-05-11

申请号：US17875569

申请日：2022-07-28

Applicant: Samsung Electronics Co., Ltd.

Inventor： Suyong Kim ,  Junyong Park ,  Sangbum Yun ,  Ilhan Park

IPC: G06F3/06

CPC classification number: G06F3/0653 ,  G06F3/0604 ,  G06F3/0679

Abstract: A method of testing a suspend operation, the method including: determining whether to transfer a suspend sampling signal to a suspend command circuit at a time point prior to each of a plurality of suspend operation time points stored in a sequence operation circuit; transferring the suspend sampling signal from the sequence operation circuit to the suspend command circuit; generating an internal suspend operation command based on the suspend sampling signal; transferring the internal suspend operation command from the suspend command circuit to the sequence operation circuit; performing suspend operations for all the plurality of suspend operation time points in response to the internal suspend operation command; and determining whether the suspend operations are performed at all of the suspend operation time points.