Tray for aligning semiconductor packages and test handler using the same, and method of aligning semiconductor packages and test method using the same
    8.
    发明授权
    Tray for aligning semiconductor packages and test handler using the same, and method of aligning semiconductor packages and test method using the same 有权
    用于对准半导体封装的托盘和使用其的测试处理器,以及使用该半导体封装的测试方法和使用其的测试方法

    公开(公告)号:US09459315B2

    公开(公告)日:2016-10-04

    申请号:US14217911

    申请日:2014-03-18

    CPC classification number: G01R31/2893 H01L21/67333 H01L21/68

    Abstract: A tray for aligning semiconductor packages, a test handler using the same, a method of aligning the semiconductor packages, and a test method using the same include a tray main body comprising a plurality of package pocket portions at which a plurality of semiconductor packages are individually received and an air position-aligning unit coupled to the tray main body. The air position-aligning unit applies air having a preset pressure to the semiconductor package received at the package pocket portion. The semiconductor package is aligned at the package pocket portion.

    Abstract translation: 用于对准半导体封装的托盘,使用该托盘的测试处理器,对准半导体封装的方法以及使用其的测试方法包括托盘主体,其包括多个封装袋部分,多个半导体封装单独 接收的空气调节单元和与盘主体相连的空气调节单元。 空气位置对齐单元将具有预设压力的空气施加到在包装袋部分处接收的半导体封装。 半导体封装在封装袋部分对准。

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