公开(公告)号：US11901187B2

公开(公告)日：2024-02-13

申请号：US17522193

申请日：2021-11-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hwanyeol Park ,  Jongyoung Park ,  Yongdeok Lee ,  Sejin Kyung ,  Daewee Kong ,  Ilwoo Kim ,  Songyi Baek ,  Philippe Coche

IPC: H01L21/308 ,  H01L21/768 ,  H01L21/02 ,  H01L29/06 ,  H01L49/02

CPC classification number: H01L21/3086 ,  H01L21/02129 ,  H01L21/76829 ,  H01L28/40 ,  H01L28/60 ,  H01L29/06

Abstract: Provided is a semiconductor device. The semiconductor device includes a wafer; an etch stop layer on the wafer; a lower mold layer on the etch stop layer; an intermediate supporter layer on the lower mold layer; an upper mold layer on the intermediate supporter layer; an upper supporter layer on the upper mold layer; and a hard mask structure on the upper supporter layer, wherein the hard mask structure includes a first hard mask layer on the upper supporter layer and a second hard mask layer on the first hard mask layer, one of the first hard mask layer and the second hard mask layer includes a first organic layer including a SOH containing C, H, O, and N, and the other one of the first hard mask layer and the second hard mask layer includes a second organic layer including an SOH containing C, H, and O.

公开(公告)号：US20250087509A1

公开(公告)日：2025-03-13

申请号：US18647044

申请日：2024-04-26

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jitae Park ,  Kwangho Lee ,  Seongjin In ,  Keonhee Lim ,  Yoonjae Kim ,  Ilwoo Kim ,  Sangki Nam ,  Sejin Oh

IPC: H01L21/67 ,  G01J3/443 ,  G05B19/4099 ,  H01J37/32

Abstract: A semiconductor process device includes a housing including a chamber where a substrate is processed, a viewport in a side wall of the housing, an adapter configured to receive reflected light in which light generated from plasma generated inside the chamber is reflected at a target position on a surface of a structure provided on an upper surface of the substrate, a polarization beam splitter configured to separate the reflected light received from the adapter into P-polarized light and S-polarized light, a spectroscope configured to analyze spectra of the P-polarized light and the S-polarized light, and a control unit configured to monitor a thickness of the structure based on luminous intensity over time at one or more wavelengths of each of the P-polarized light and the S-polarized light, based on results of analyzing the spectra.

公开(公告)号：US12225724B2

公开(公告)日：2025-02-11

申请号：US17505842

申请日：2021-10-20

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hwanyeol Park ,  Sejin Kyung ,  Ilwoo Kim ,  Minwoo Lee ,  Youngho Jeung

IPC: H01L27/11582 ,  H01L27/11524 ,  H01L27/11556 ,  H01L27/1157 ,  H10B41/27 ,  H10B41/35 ,  H10B43/27 ,  H10B43/35

Abstract: In a method of manufacturing a semiconductor device, a first insulation layer and a first sacrificial layer are alternately and repeatedly formed on a substrate to form a mold layer. A sacrificial layer structure is formed on the mold layer to include an etch stop layer and a second sacrificial layer sequentially stacked. After forming a hard mask on the sacrificial layer structure, the sacrificial layer structure and the mold layer are etched by a dry etching process using the hard mask as an etching mask to form a channel hole exposing an upper surface of the substrate and form a recess on a sidewall of the second sacrificial layer adjacent to the channel hole. A memory channel structure is formed in the channel hole. The first sacrificial layer is replaced with a gate electrode.