Potential measurement device
    2.
    发明授权

    公开(公告)号:US11125716B2

    公开(公告)日:2021-09-21

    申请号:US15761693

    申请日:2016-08-09

    发明人: Jun Ogi Yusuke Oike

    摘要: A potential measurement device includes a plurality of read-out electrodes arranged in an array shape and that detects a potential at a potential generation point generated due to a chemical change, and a reference electrode that detects a reference potential. The reference electrode is arranged within the array of the read-out electrodes. With this configuration, a low-noise potential measurement device in which noise superimposed on a wire from each of the read-out electrodes to an amplifier and noise superimposed on a wire from the reference electrode to the amplifier, i.e., wiring noise, can be reduced is achieved.

    LIGHT RECEIVING DEVICE AND DISTANCE MEASURING APPARATUS

    公开(公告)号:US20230384431A1

    公开(公告)日:2023-11-30

    申请号:US18044827

    申请日:2021-09-13

    发明人: Jun Ogi

    IPC分类号: G01S7/4863 G01S17/10

    摘要: A light receiving device according to an embodiment of the present disclosure includes a stacked chip structure including a pixel chip and a circuit chip that are stacked. In the pixel chip, a light receiving element is provided. The light receiving element generates a signal in accordance with reception of a photon. In the circuit chip, a circuit section that is included in a readout circuit is disposed along a direction perpendicular to a substrate surface of the circuit chip with respect to an electrical coupling section between the pixel chip and the circuit chip. The readout circuit reads the signal generated by the light receiving element.

    LIGHT-RECEIVING APPARATUS
    7.
    发明申请

    公开(公告)号:US20220155153A1

    公开(公告)日:2022-05-19

    申请号:US17428408

    申请日:2020-03-06

    IPC分类号: G01J11/00 G01J1/44 H03K23/58

    摘要: A light-receiving apparatus (1a) includes a counting unit (11), a setting unit (12), and an acquiring unit (13). The counting unit is configured to measure a detection number of times that represents the number of times incidence of a photon to a light-receiving element has been detected within an exposure period and to output a counted value. The setting unit is configured to set a cycle of updating time information in accordance with an elapsed time during the exposure period. The acquiring unit is configured to acquire the time information indicating a time at which the counted value reaches a threshold before the exposure period elapses.

    Semiconductor apparatus and potential measuring apparatus

    公开(公告)号:US10852292B2

    公开(公告)日:2020-12-01

    申请号:US16343598

    申请日:2017-11-17

    摘要: The present disclosure relates to a semiconductor apparatus and a potential measuring apparatus capable of preventing electrostatic breakdown in an electrode formation process when an electrode and an amplifier are provided on a same substrate. A diode is provided of which a cathode is connected to a previous stage of an amplifying transistor for amplifying a signal read by a read electrode for reading a potential having contact with liquid in which a specimen is input and an anode is grounded. With such a configuration, by bypassing a negative charge generated between the electrode and the amplifying transistor in the electrode formation process from the diode and discharging the negative charge toward ground so as to prevent electrostatic breakdown. This is applicable to a bioelectric potential measuring apparatus.

    Imaging device
    9.
    发明授权

    公开(公告)号:US10777597B2

    公开(公告)日:2020-09-15

    申请号:US16301877

    申请日:2018-03-20

    摘要: To realize miniaturization of a pixel, reduction in noise, and high quantum efficiency, and to improve short-wavelength sensitivity while suppressing inter-pixel interference and variations for each pixel. According to the present disclosure, there is provided an imaging device including: a first semiconductor layer formed in a semiconductor substrate; a second semiconductor layer of a conductivity type opposite to a conductivity type of the first semiconductor layer formed on the first semiconductor layer; a pixel separation unit which defines a pixel region including the first semiconductor layer and the second semiconductor layer; a first electrode which is connected to the first semiconductor layer from one surface side of the semiconductor substrate; and a second electrode which is connected to the second semiconductor layer from a light irradiation surface side that is the other surface of the semiconductor substrate, and is formed to correspond to a position of the pixel separation unit.

    Charge detection sensor and potential measurement system

    公开(公告)号:US11754610B2

    公开(公告)日:2023-09-12

    申请号:US16646185

    申请日:2018-08-14

    IPC分类号: G01R29/24 G01N27/414

    CPC分类号: G01R29/24 G01N27/4145

    摘要: To achieve decreased noise and improved sensitivity by reducing parasitic capacitance in a charge detection sensor. The charge detection sensor includes a detection element, a detection electrode, and a contact. The detection element is provided on one surface of a semiconductor substrate and detects a charge. The detection electrode is provided on another surface different from the one surface of the semiconductor substrate. The contact penetrates the semiconductor substrate and electrically connects the detection electrode and the detection element. Since no wiring layer is formed between the detection element and the detection electrode, the parasitic capacitance is reduced.