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公开(公告)号:US11974444B2
公开(公告)日:2024-04-30
申请号:US16973272
申请日:2019-06-11
发明人: Hideaki Togashi , Iwao Yagi , Masahiro Joei , Fumihiko Koga , Kenichi Murata , Shintarou Hirata , Yosuke Saito , Akira Furukawa
IPC分类号: H10K39/32
CPC分类号: H10K39/32
摘要: There is provided a solid-state image sensor, a solid-state imaging device, an electronic apparatus, and a method of manufacturing a solid-state image sensor capable of improving characteristics. There is provided a solid-state image sensor including a stacked structure that includes a semiconductor substrate, a first photoelectric converter provided above the semiconductor substrate and converting light into charges, and a second photoelectric converter provided above the first photoelectric converter and converting light into charges, where the first photoelectric converter and the second photoelectric converter include a photoelectric conversion stacked structure in which a common electrode, a photoelectric conversion film, and a readout electrode are stacked so that the first photoelectric converter and the second photoelectric converter are in a line-symmetrical relationship with each other with a vertical plane perpendicular to a stacking direction of the stacked structure as an axis of symmetry.
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公开(公告)号:US11888012B2
公开(公告)日:2024-01-30
申请号:US17261221
申请日:2019-07-25
发明人: Kenichi Murata , Masahiro Joei , Fumihiko Koga , Iwao Yagi , Shintarou Hirata , Hideaki Togashi , Yosuke Saito , Shingo Takahashi
IPC分类号: H01L27/146 , H04N25/76
CPC分类号: H01L27/14643 , H01L27/14623 , H04N25/76
摘要: Provided is a solid-state image capturing element including a semiconductor substrate and first and second photoelectric conversion parts configured to convert light into electric charge. The first and the second photoelectric conversion parts each have a laminated structure including an upper electrode, a lower electrode, a photoelectric conversion film sandwiched between the upper electrode and the lower electrode, and an accumulation electrode facing the upper electrode through the photoelectric conversion film and an insulating film. The lower electrode of each of the first and the second photoelectric conversion parts is electrically connected with a common electric charge accumulation part through a common penetration electrode provided in common to the first and the second photoelectric conversion parts and penetrating through the semiconductor substrate, the common electric charge accumulation part being provided in common to the first and the second photoelectric conversion parts in the semiconductor substrate.
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公开(公告)号:US11750952B2
公开(公告)日:2023-09-05
申请号:US17900222
申请日:2022-08-31
发明人: Yusuke Sato , Fumihiko Koga
IPC分类号: H04N25/79 , H01L27/146 , H04N23/10 , H04N25/77
CPC分类号: H04N25/79 , H01L27/14612 , H01L27/14627 , H01L27/14636 , H01L27/14643 , H01L27/14665 , H04N23/10
摘要: There is provided an imaging element includes a photoelectric conversion unit that includes a first electrode, a photoelectric conversion layer, and a second electrode, in which the photoelectric conversion unit further includes a charge storage electrode that has an opposite region opposite to the first electrode via an insulating layer, and a transfer control electrode that is opposite to the first electrode and the charge storage electrode via the insulating layer, and the photoelectric conversion layer is disposed above at least the charge storage electrode via the insulating layer.
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公开(公告)号:US11742369B2
公开(公告)日:2023-08-29
申请号:US17541509
申请日:2021-12-03
发明人: Fumihiko Koga
IPC分类号: H01L27/146 , H04N25/59 , H04N25/76 , H04N25/77 , H04N25/771 , H04N23/62 , H04N25/50 , H10K39/32
CPC分类号: H01L27/14612 , H01L27/146 , H01L27/1464 , H01L27/14641 , H01L27/14647 , H01L27/14667 , H04N25/59 , H04N25/76 , H04N25/77 , H04N25/771 , H04N23/62 , H04N25/50 , H10K39/32
摘要: The present technology relates to a solid-state image sensing device capable of restricting a deterioration in photoelectric conversion characteristic of a photoelectric conversion unit, and an electronic device. A solid-state image sensing device includes: a photoelectric conversion unit formed outside a semiconductor substrate; a charge holding unit for holding signal charges generated by the photoelectric conversion unit; a reset transistor for resetting the potential of the charge holding unit; a capacitance switching transistor connected to the charge holding unit and directed for switching the capacitance of the charge holding unit; and an additional capacitance device connected to the capacitance switching transistor. The present technology is applicable to solid-state image sensing devices and the like, for example.
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公开(公告)号:US10453898B2
公开(公告)日:2019-10-22
申请号:US15528580
申请日:2015-12-11
IPC分类号: H01L31/062 , H01L21/00 , H01L27/30 , H01L27/28 , H04N5/357 , H04N5/369 , H04N5/374 , H04N5/359 , H04N5/378 , H01L27/146
摘要: The present disclosure relates to a solid state image sensor capable of reducing signal mixture due to electric capacitive coupling between adjacent pixels, a method for manufacturing the same, and an electronic device. A first pixel and a second pixel are adjacently arranged in the solid state image sensor. Each of the first pixel and the second pixel has a photoelectric conversion film for photoelectrically converting an incident light, and a lower electrode arranged below the photoelectric conversion film, and another electrode different from the lower electrodes is provided between the lower electrodes of the first pixel and the second pixel. The present disclosure is applicable to solid state image sensors and the like, for example.
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公开(公告)号:US09985068B2
公开(公告)日:2018-05-29
申请号:US15029717
申请日:2014-10-14
发明人: Taiichiro Watanabe , Fumihiko Koga
IPC分类号: H01L27/148 , H01L27/146
CPC分类号: H01L27/1464 , H01L27/14607 , H01L27/14614 , H01L27/14641 , H01L27/14689
摘要: There is provided a solid state imaging device including a pixel including a photoelectric conversion unit that generates and accumulates a charge according to a received light amount, a charge accumulation unit that accumulates the generated charge, a first transfer transistor that transfers the charge of the photoelectric conversion unit to the charge accumulation unit, a charge holding unit that holds the charge to read out as a signal, and a second transfer transistor that transfers the charge of the charge accumulation unit to the charge holding unit, in which a gate electrode of the first transfer transistor is formed to be buried up to a predetermined depth from a semiconductor substrate interface, and the charge accumulation unit is formed in a longitudinally long shape to be extended in a depth direction along a side wall of the gate electrode of the first transfer transistor to be buried therein.
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公开(公告)号:US12085410B2
公开(公告)日:2024-09-10
申请号:US17611970
申请日:2020-04-27
发明人: Sozo Yokogawa , Yusuke Moriyama , Nobuhiro Kawai , Yuhi Yorikado , Fumihiko Koga , Yoshiki Ebiko , Suzunori Endo , Hayato Wakabayashi
IPC分类号: G01C3/06 , H04N25/705 , H04N25/772 , H04N25/778
CPC分类号: G01C3/06 , H04N25/705 , H04N25/772 , H04N25/778
摘要: A distance measurement accuracy is improved. A solid-state imaging device according to an embodiment includes a pixel array part in which a plurality of pixels is arranged in a matrix, in which each of the pixels includes a plurality of photoelectric conversion units that each photoelectrically converts incident light to generate a charge, a floating diffusion region that accumulates the charge, a plurality of transfer circuits that transfer the charge generated in each of the plurality of photoelectric conversion units to the floating diffusion region, and a first transistor that causes a pixel signal of a voltage value corresponding to a charge amount of the charge accumulated in the floating diffusion region to appear in a signal line.
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公开(公告)号:US11882359B2
公开(公告)日:2024-01-23
申请号:US18182735
申请日:2023-03-13
IPC分类号: H04N23/663 , H01L27/146 , H04N23/67 , H04N25/13 , H04N25/704 , H10K39/32 , H04N25/778 , G02B7/34 , H10K39/00
CPC分类号: H04N23/663 , G02B7/34 , H01L27/1464 , H01L27/14612 , H01L27/14621 , H01L27/14623 , H01L27/14627 , H01L27/14636 , H01L27/14645 , H04N23/672 , H04N25/134 , H04N25/704 , H04N25/778 , H10K39/32 , H10K39/00
摘要: The present disclosure relates to a solid-state imaging device, a method for driving the solid-state imaging device, and an electronic device capable of improving auto-focusing accuracy by using a phase difference signal obtained by using a photoelectric conversion film. The solid-state imaging device includes a pixel including a photoelectric conversion portion having a structure where a photoelectric conversion film is interposed by an upper electrode on the photoelectric conversion film and a lower electrode under the photoelectric conversion film. The upper electrode is divided into a first upper electrode and a second upper electrode. The present disclosure can be applied to, for example, a solid-state imaging device or the like.
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公开(公告)号:US11765483B2
公开(公告)日:2023-09-19
申请号:US17656584
申请日:2022-03-25
发明人: Yuji Uesugi , Fumihiko Koga , Keisuke Hatano
IPC分类号: H04N25/76 , H01L27/146
CPC分类号: H04N25/76 , H01L27/14643
摘要: Provided is a solid-state imaging device, including a first electrode formed on a semiconductor layer, a photoelectric conversion layer formed on the first electrode, a second electrode formed on the photoelectric conversion layer, and a third electrode disposed between the first electrode and an adjacent first electrode, and electrically insulated. A voltage of the third electrode is controlled to a voltage corresponding to a detection result which can contribute to control of discharge of charges or assist for transfer of charges. The detection results corresponds to one of light or temperature and the voltage of third electrode is controlled according to an output of a frame image obtained before exposure.
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公开(公告)号:US11575847B2
公开(公告)日:2023-02-07
申请号:US17185539
申请日:2021-02-25
发明人: Fumihiko Koga
IPC分类号: H04N5/357 , H04N5/367 , H04N5/374 , H01L27/146 , H01L27/30 , H04N5/369 , H04N9/04 , H04N5/363 , H04N5/365 , H04N5/3745
摘要: The present technology relates to a solid-state imaging device that can improve imaging quality by reducing variation in the voltage of a charge retention unit, a method of driving the solid-state imaging device, and an electronic apparatus. A first photoelectric conversion unit generates and accumulates signal charge by receiving light that has entered a pixel, and photoelectrically converting the light. A first charge retention unit retains the generated signal charge. A first output transistor outputs the signal charge in the first charge retention unit as a pixel signal, when the pixel is selected by the first select transistor. A first voltage control transistor controls the voltage of the output end of the first output transistor. The present technology can be applied to pixels in solid-state imaging devices, for example.
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