Abstract:
A semiconductor apparatus includes: an output timing controller configured to delay an applied external read command by a predetermined time and generate a normal output enable flag signal, during a normal mode, a test output timing controller configured to generate a DLL clock signal from an external clock signal, delay the applied external read command in synchronization with the DLL clock signal, and output the delayed applied external read command as a test output enable flag signal, during a test mode, and a multiplexer (MUX) configured to output any one of the normal output enable flag signal or the test output enable flag signal as an output enable flag signal.
Abstract:
A phase detection circuit is configured to receive an input clock signal and a reference clock signal. The phase detection circuit is configured to generate a divided clock signal from the reference clock signal. The phase detection circuit is configured to generate a phase detection signal after comparing the phase of the input clock signal with the divided clock signal.
Abstract:
A phase detection circuit is configured to receive an input clock signal and a reference clock signal. The phase detection circuit is configured to generate a divided clock signal from the reference clock signal. The phase detection circuit is configured to generate a phase detection signal after comparing the phase of the input clock signal with the divided clock signal.
Abstract:
A regulation circuit of a semiconductor apparatus includes a control block configured to generate control signals in response to a reference clock signal and a feedback clock signal; and a noise compensation block configured to compensate for a variation in a level of power in response to the control signals.
Abstract:
A semiconductor apparatus includes a duty cycle correction block and a delay locked loop. The duty cycle correction block generates a duty corrected clock by correcting a duty cycle of an internal clock, adjusts a phase of a rising edge of the duty corrected clock when a delay locked loop is reset, and adjusts a phase of a falling edge of the duty corrected clock when the delay locked loop is locked. The delay locked loop receives an external clock to output the internal clock, and delays the external clock by a variable delay amount to output the internal clock when the adjustment of the phase of the rising edge of the duty corrected clock by the duty cycle correction block is completed.
Abstract:
A semiconductor apparatus includes a first clock path which generates a first output clock signal by delaying a first phase clock signal, and a second clock path which generates a second output clock signal by delaying a second phase clock signal based on a delay compensation signal. The oscillating path generation circuit forms oscillating paths with the first clock path and the second clock path. The delay information generation circuit generates a delay compensation signal based on oscillating signals generated by forming the oscillating paths.
Abstract:
A semiconductor apparatus includes a first clock path which generates a first output clock signal by delaying a first phase clock signal, and a second clock path which generates a second output clock signal by delaying a second phase clock signal based on a delay compensation signal. The oscillating path generation circuit forms oscillating paths with the first clock path and the second clock path. The delay information generation circuit generates a delay compensation signal based on oscillating signals generated by forming the oscillating paths.
Abstract:
A synchronization circuit may include: a delay line configured to delay a reference clock signal; a division circuit configured to generate a divided feedback clock signal by dividing a feedback clock signal at a division ratio which is set according to a division ratio control signal; a phase detection circuit configured to generate a phase detection signal by detecting the phase of the divided feedback clock signal based on the reference clock signal; and a delay line control circuit configured to control a delay time of the delay line according to the phase detection signal and the divided feedback clock signal.
Abstract:
A clock generation circuit may include a reference clock generator configured to generate a pair of first reference clocks in an offset code generation mode, a triggering unit configured to generate a pair of second reference clocks from the pair of first reference clocks, a pulse detector configured to generate a duty detection signal based on a phase difference between the pair of second reference clocks, a correction code generator configured to generate a reference correction code based on the duty detection signal, and an offset code generator configured to generate an offset code based on the reference correction code and a preset reference code.
Abstract:
Provided is a clock delay detecting circuit and semiconductor apparatus using the same that is capable of generating a period signal whose period is a delay time of a clock, dividing the period signal, and counting the divided period signal. The clock delay detection circuit comprises a period signal generating unit configured to generate a counting control signal, a period signal dividing unit configured to generate a counting enable signal by dividing the counting control signal, and a counting unit configured to generate a delay information signal by counting the counting enable signal with a clock, wherein the counting control signal has a period with a predetermined time.