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公开(公告)号:US20250029672A1
公开(公告)日:2025-01-23
申请号:US18904922
申请日:2024-10-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiheung KIM , Sanguhn CHA , Junhyung KIM , Sungchul PARK , Hyojin JUNG , Kyungsoo HA
Abstract: A semiconductor memory device includes a memory cell array, an error correction code (ECC) circuit, a fault address register and a control logic circuit. The memory cell array includes a plurality of memory cell rows. The scrubbing control circuit generates scrubbing addresses for performing a scrubbing operation on a first memory cell row based on refresh row addresses for refreshing the memory cell rows. The control logic circuit controls the ECC circuit such that the ECC circuit performs an error detection and correction operation on a plurality of sub-pages in the first memory cell row to count a number of error occurrences during a first interval and determines a sub operation in a second interval in the scrubbing operation based on the number of error occurrences in the first memory cell row.
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公开(公告)号:US20230223095A1
公开(公告)日:2023-07-13
申请号:US18113702
申请日:2023-02-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiheung KIM , Sanguhn CHA , Junhyung KIM , Sungchul PARK , Hyojin JUNG , Kyungsoo HA
CPC classification number: G11C29/42 , G11C29/20 , G11C29/4401 , G11C2029/1204
Abstract: A semiconductor memory device includes a memory cell array, an error correction code (ECC) circuit, a fault address register and a control logic circuit. The memory cell array includes a plurality of memory cell rows. The scrubbing control circuit generates scrubbing addresses for performing a scrubbing operation on a first memory cell row based on refresh row addresses for refreshing the memory cell rows. The control logic circuit controls the ECC circuit such that the ECC circuit performs an error detection and correction operation on a plurality of sub-pages in the first memory cell row to count a number of error occurrences during a first interval and determines a sub operation in a second interval in the scrubbing operation based on the number of error occurrences in the first memory cell row.
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公开(公告)号:US20220208252A1
公开(公告)日:2022-06-30
申请号:US17400585
申请日:2021-08-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kiheung KIM , Junhyung KIM , Sungchul PARK , Hangyun JUNG , Hyojin JUNG , Kyungsoo HA
IPC: G11C11/4091 , G11C11/402 , G06F7/58 , G11C11/408
Abstract: A semiconductor memory device includes a memory cell array, a sense amplifier circuit and a random code generator. The memory cell array is divided into a plurality of sub array blocks arranged in a first direction and a second direction crossing the first direction. The sense amplifier circuit is arranged in the second direction with respect to the memory cell array, and includes a plurality of input/output (I/O) sense amplifiers. The random code generator generates a random code which is randomly determined based on a power stabilizing signal and an anti-fuse flag signal. A second group of I/O sense amplifiers selected from among a first group of I/O sense amplifiers performs a data I/O operation by data scrambling data bits of main data. The first group of I/O sense amplifiers correspond to a first group of sub array blocks accessed by an access address.
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公开(公告)号:US20240203475A1
公开(公告)日:2024-06-20
申请号:US18593937
申请日:2024-03-03
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungyong CHO , Kiheung KIM , Hyeran KIM
IPC: G11C11/406 , G11C11/408 , H01L25/065 , H03M13/00 , H03M13/11
CPC classification number: G11C11/40615 , G11C11/4085 , H03M13/1105 , H03M13/611 , H01L25/0657 , H01L2225/06541
Abstract: A semiconductor memory device includes a memory cell array including a plurality of memory cell rows, a row hammer management circuit and a refresh control circuit. The row hammer management circuit counts the number of times of access associated with each of the plurality of memory cell rows in response to an active command from an external memory controller to store the counted values in each of the plurality of memory cell rows as count data, determines a hammer address associated with at least one of the plurality of memory cell rows, which is intensively accessed more than a predetermined reference number of times, based on the counted values, and performs an internal read-update-write operation. The refresh control circuit receives the hammer address and to perform a hammer refresh operation on victim memory cell rows which are physically adjacent to a memory cell row corresponding to the hammer address.
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公开(公告)号:US20230021622A1
公开(公告)日:2023-01-26
申请号:US17703049
申请日:2022-03-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungyong CHO , Kiheung KIM , Hyeran KIM
IPC: G11C11/406 , G11C11/408 , H03M13/11 , H03M13/00
Abstract: A semiconductor memory device includes a memory cell array including a plurality of memory cell rows, a row hammer management circuit and a refresh control circuit. The row hammer management circuit counts the number of times of access associated with each of the plurality of memory cell rows in response to an active command from an external memory controller to store the counted values in each of the plurality of memory cell rows as count data, determines a hammer address associated with at least one of the plurality of memory cell rows, which is intensively accessed more than a predetermined reference number of times, based on the counted values, and performs an internal read-update-write operation. The refresh control circuit receives the hammer address and to perform a hammer refresh operation on victim memory cell rows which are physically adjacent to a memory cell row corresponding to the hammer address.
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公开(公告)号:US20220208293A1
公开(公告)日:2022-06-30
申请号:US17374822
申请日:2021-07-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiheung KIM , Sanguhn CHA , Junhyung KIM , Sungchul PARK , Hyojin JUNG , Kyungsoo HA
Abstract: A semiconductor memory device includes a memory cell array, an error correction code (ECC) circuit, a fault address register and a control logic circuit. The memory cell array includes a plurality of memory cell rows. The scrubbing control circuit generates scrubbing addresses for performing a scrubbing operation on a first memory cell row based on refresh row addresses for refreshing the memory cell rows. The control logic circuit controls the ECC circuit such that the ECC circuit performs an error detection and correction operation on a plurality of sub-pages in the first memory cell row to count a number of error occurrences during a first interval and determines a sub operation in a second interval in the scrubbing operation based on the number of error occurrences in the first memory cell row.
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