Abstract:
Dual-voltage domain memory buffers, and related systems and methods are disclosed. To reduce area needed for voltage level shifters for voltage level shifting, latch banks are provided in a voltage domain of memory buffer read circuitry, separate from the voltage domain of a write data input to the latch banks. A write data input voltage level shifter is disposed between the write data input and the latch banks to voltage level shift write data on the write data input to the voltage domain of the latch banks. In this manner, voltage level shifters are not required to voltage level shill the latch bank outputs, because the latch banks are in the voltage domain of the memory buffer read circuitry. In this manner, semiconductor area that would otherwise be needed for the voltage level shifters to voltage level shift latch bank outputs is not required.
Abstract:
An apparatus includes a sense amplifier that has a sense amplifier differential output. The sense amplifier may be in a first power domain. The apparatus may include level shifting circuitry that has a level shifter differential output. The level shifting circuitry may be coupled to the sense amplifier differential output. The level shifting circuitry may include a first transistor and a second transistor. A first sense amplifier output of the sense amplifier differential output may be coupled to the first transistor, and a second sense amplifier output of the sense amplifier differential output may be coupled to the second transistor. The apparatus may further include a latch to store data. The latch may be coupled to the level shifter differential output. The latch is in a second power domain that is different from the first power domain.
Abstract:
Dual-voltage domain memory buffers, and related systems and methods are disclosed. To reduce area needed for voltage level shifters for voltage level shifting, latch banks are provided in a voltage domain of memory buffer read circuitry, separate from the voltage domain of a write data input to the latch banks. A write data input voltage level shifter is disposed between the write data input and the latch banks to voltage level shift write data on the write data input to the voltage domain of the latch banks. In this manner, voltage level shifters are not required to voltage level shill the latch bank outputs, because the latch banks are in the voltage domain of the memory buffer read circuitry. In this manner, semiconductor area that would otherwise be needed for the voltage level shifters to voltage level shift latch bank outputs is not required.
Abstract:
A method includes designing, at a computer, a first version of a memory device that includes first main memory and first redundant memory. The method further includes modifying a design of the first version of the memory device to produce a second version of the memory device when an error rate associated with fabrication of the first version of the memory device is below a threshold. The second version of the memory device includes second main memory that is logically identical to the first main memory, and the second version of the memory device includes less redundant memory than the first redundant memory.
Abstract:
An apparatus includes a sense amplifier that has a sense amplifier differential output. The sense amplifier may be in a first power domain. The apparatus may include level shifting circuitry that has a level shifter differential output. The level shifting circuitry may be coupled to the sense amplifier differential output. The level shifting circuitry may include a first transistor and a second transistor. A first sense amplifier output of the sense amplifier differential output may be coupled to the first transistor, and a second sense amplifier output of the sense amplifier differential output may be coupled to the second transistor. The apparatus may further include a latch to store data. The latch may be coupled to the level shifter differential output. The latch is in a second power domain that is different from the first power domain.
Abstract:
A multi-port hybrid full-swing/low-swing memory circuit in a static random access memory (SRAM) device comprises a first wordline driver that comprises a read wordline driver, a second wordline driver that comprises either a read wordline driver or a read/write wordline driver, a memory cell coupled to the first and second wordline drivers, a sense amplifier coupled to the memory cell, and a latch coupled to the memory cell. The memory circuit is capable of achieving high-speed low-swing or low-speed full-swing operations while avoiding the need for a large circuit area on an integrated circuit.