METHOD FOR FORMING AN INTEGRATED CIRCUIT LEVEL BY SEQUENTIAL TRIDIMENSIONAL INTEGRATION
    5.
    发明申请
    METHOD FOR FORMING AN INTEGRATED CIRCUIT LEVEL BY SEQUENTIAL TRIDIMENSIONAL INTEGRATION 有权
    通过顺序三维集成形成集成电路电平的方法

    公开(公告)号:US20100308411A1

    公开(公告)日:2010-12-09

    申请号:US12794092

    申请日:2010-06-04

    Abstract: A method for forming a level of a tridimensional structure on a first support in which components are formed, including the steps of forming, on a second semiconductor support, a single-crystal semiconductor substrate with an interposed thermal oxide layer; placing the free surface of the single-crystal semiconductor substrate on the upper surface of the first support; eliminating the second semiconductor support; and thinning down the thermal oxide layer down to a thickness capable of forming a gate insulator.

    Abstract translation: 一种用于在其上形成部件的第一支撑件上形成三维结构水平的方法,包括以下步骤:在第二半导体支架上形成具有插入的热氧化物层的单晶半导体衬底; 将单晶半导体衬底的自由表面放置在第一支撑件的上表面上; 消除了第二个半导体支持; 并将热氧化层减薄至能够形成栅极绝缘体的厚度。

    Bulk acoustic wave resonator disposed on a substrate having a buried cavity formed therein providing different substrate thicknesses underneath the resonator
    6.
    发明授权
    Bulk acoustic wave resonator disposed on a substrate having a buried cavity formed therein providing different substrate thicknesses underneath the resonator 有权
    放置在其上形成有掩埋腔的衬底上的体声波谐振器提供在谐振器下面的不同衬底厚度

    公开(公告)号:US08456258B2

    公开(公告)日:2013-06-04

    申请号:US12783095

    申请日:2010-05-19

    CPC classification number: H03H9/173 H03H3/04 H03H2003/021 Y10T29/42

    Abstract: A resonant device including a stack of a first metal layer, a piezoelectric material layer, and a second metal layer formed on a silicon substrate, a cavity being formed in depth in the substrate, the thickness of the silicon above the cavity having at least a first value in a first region located opposite to the center of the stack, having a second value in a second region located under the periphery of the stack and having at least a third value in a third region surrounding the second region, the second value being greater than the first and the third values.

    Abstract translation: 一种谐振装置,包括第一金属层,压电材料层和形成在硅衬底上的第二金属层的堆叠,空腔在衬底中深度形成,空腔上方的硅的厚度至少具有 第一值位于与堆叠的中心相对的第一区域中,在位于堆叠的周边下方的第二区域中具有第二值,并且在围绕第二区域的第三区域中具有至少第三值,第二值为 大于第一和第三值。

    BULK ACOUSTIC WAVE RESONATOR AND METHOD FOR MANUFACTURING SAID RESONATOR
    9.
    发明申请
    BULK ACOUSTIC WAVE RESONATOR AND METHOD FOR MANUFACTURING SAID RESONATOR 有权
    大容积声波谐振器和制造谐振器的方法

    公开(公告)号:US20100295631A1

    公开(公告)日:2010-11-25

    申请号:US12783095

    申请日:2010-05-19

    CPC classification number: H03H9/173 H03H3/04 H03H2003/021 Y10T29/42

    Abstract: A resonant device including a stack of a first metal layer, a piezoelectric material layer, and a second metal layer formed on a silicon substrate, a cavity being formed in depth in the substrate, the thickness of the silicon above the cavity having at least a first value in a first region located opposite to the center of the stack, having a second value in a second region located under the periphery of the stack and having at least a third value in a third region surrounding the second region, the second value being greater than the first and the third values.

    Abstract translation: 一种谐振装置,包括第一金属层,压电材料层和形成在硅衬底上的第二金属层的堆叠,空腔在衬底中深度形成,空腔上方的硅的厚度至少具有 第一值位于与堆叠的中心相对的第一区域中,在位于堆叠的周边下方的第二区域中具有第二值,并且在围绕第二区域的第三区域中具有至少第三值,第二值为 大于第一和第三值。

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