Abstract:
A pattern drawing method of drawing a desired pattern on a base material by irradiating an electronic beam and scanning the base material with the electronic beam with a predetermined dose amount, comprising: a first step of drawing a first region on the base material by scanning with the electronic beam with a first dose amount; a second step of drawing a second region on the base material by scanning with the electronic beam with a second dose amount; and a inclining step of inclining a boundary between the first region and the second region to form an inclined surface by conducting a first scanning to scan with the electronic beam with the first dose amount and a second scanning to scan with the electronic beam with the second does amount in a mixed arrangement.
Abstract:
There is described a molding method for molding a product, having a microscopic structure of high aspect ratio. The molding method includes the steps of: setting a temperature of a mold, having a microscopic shape, at a value higher than a glass transition temperature of a material being deformable with heat; pushing the mold against the material at a first velocity, after the material is positioned opposite to the mold so that the microscopic shape contacts the material; pushing the mold against the material at a second velocity being faster than the first velocity; and releasing the mold from the material. The pushing pressure for pushing the mold against the material at the first velocity is equal to or smaller than a half of that for pushing the mold against the material at the second velocity.
Abstract:
A wide-band wave plate having at least two wave plates, each of which has a microstructure to generate a phase difference, the microstructure having a cycle not shorter than 1/nmin of a shortest wavelength of light in use, wherein the two wave plates are arranged to face opposite with their main axes in non-parallel with each other, wherein nmin is a refractive index of a wave plate material with respect to the shortest wavelength.
Abstract translation:具有至少两个波片的宽带波片,每个波片具有微结构以产生相位差,所述微结构具有不短于最短波长的光的1 / n sub>的周期 在使用中,其中两个波片布置成彼此不平行地与其主轴线相对,其中n分钟是波片材料相对于最短波长的折射率 。
Abstract:
A wide-band wave plate having at least two wave plates, each of which has a microstructure to generate a phase difference, the microstructure having a cycle not shorter than 1/nmin of a shortest wavelength of light in use, wherein the two wave plates are arranged to face opposite with their main axes in non-parallel with each other, wherein nmin is a refractive index of a wave plate material with respect to the shortest wavelength.
Abstract translation:具有至少两个波片的宽带波片,每个波片具有微结构以产生相位差,所述微结构具有不短于最短波长的光的1 / n sub>的周期 在使用中,其中两个波片布置成彼此不平行地与其主轴线相对,其中n分钟是波片材料相对于最短波长的折射率 。
Abstract:
The present invention aims at providing a device and method for writing a line with a high degree of precision at high speed. Distance calculation means 311 calculates the start-to-end point distance L of a writing pattern (S502), and number-of-scan-clocks calculating means 312 calculates the number of scan clocks required to write the writing pattern based on the start-to-end point distance L and a unit distance corresponding to the minimum time resolution for a high-speed D/A converter 306 (S503). Count conversion means 605 separates the start-to-end point distance L into X and Y components to convert them in an equation using the number of scan clocks (S504). Based on the equation, variable rate calculating means 314 calculates an extinction ratio to determine the extinction ratio at a variable attenuator 307 (S505). ATT D/A converter 303 specifies the extinction ratio at the attenuator 307 to reduce the unit distance corresponding to the resolving power of the high-speed D/A converter 306 so that an electron beam will be irradiated and scanned at intervals of the reduced unit distance to perform writing.
Abstract translation:本发明旨在提供一种以高速度高精度地写入线的装置和方法。 距离计算装置311计算写入模式的起点到终点距离L(S502),并且扫描时间计算装置312基于开始时间计算装置312计算写入写入模式所需的扫描时钟数, 端点距离L和对应于高速D / A转换器306的最小时间分辨率的单位距离(S503)。 计数转换装置605将起点到终点距离L分离为X和Y分量,以使用扫描时钟数在等式中转换它们(S504)。 基于该方程,可变速率计算装置314计算消光比以确定可变衰减器307处的消光比(S505)。 ATT D / A转换器303指定衰减器307处的消光比,以减小对应于高速D / A转换器306的分辨率的单位距离,使得将电子束以缩小单位的间隔照射和扫描 执行写作的距离
Abstract:
A method of drawing a pattern on a base material by scanning a beam, comprising: drawing a pattern including ring-shaped zones on a first pattern-drawn field on a base material by scanning a beam on a first pattern-drawn field; shifting at least one of the beam source and the base material to scan the beam on a second pattern-drawn field located next to the first pattern-drawn field in such a way that a boundary between the first pattern-drawn field and the second pattern-drawn field is positioned at a joint portion between a slope portion and a side wall portion of the ring-shaped zones; and drawing the pattern on the second pattern-drawn field by scanning a beam so that the joint portion between the slope portion and the side wall portion is drawn at the boundary between the first pattern-drawn field and the second pattern-drawn field.
Abstract:
A method of working an optical element for producing an optical element having a microscopic pattern, comprising a pattern drawing step for forming a specified pattern corresponding to said optical element on a base material including a layer of pattern drawing object, wherein said layer of pattern drawing object has a curved surface, and said specified pattern is drawn by the application of an electron beam to said layer of pattern drawing object.
Abstract:
A method of working an optical element for producing an optical element having a microscopic pattern, comprising a pattern drawing step for forming a specified pattern corresponding to said optical element on a base material including a layer of pattern drawing object, wherein said layer of pattern drawing object has a curved surface, and said specified pattern is drawn by the application of an electron beam to said layer of pattern drawing object.
Abstract:
The present invention aims at providing a device and method for writing a line with a high degree of precision at high speed. Distance calculation means 311 calculates the start-to-end point distance L of a writing pattern (S502), and number-of-scan-clocks calculating means 312 calculates the number of scan clocks required to write the writing pattern based on the start-to-end point distance L and a unit distance corresponding to the minimum time resolution for a high-speed D/A converter 306 (S503). Count conversion means 605 separates the start-to-end point distance L into X and Y components to convert them in an equation using the number of scan clocks (S504). Based on the equation, variable rate calculating means 314 calculates an extinction ratio to determine the extinction ratio at a variable attenuator 307 (S505). ATT D/A converter 303 specifies the extinction ratio at the attenuator 307 to reduce the unit distance corresponding to the resolving power of the high-speed D/A converter 306 so that an electron beam will be irradiated and scanned at intervals of the reduced unit distance to perform writing.
Abstract translation:本发明旨在提供一种以高速度高精度地写入线的装置和方法。 距离计算装置311计算写入模式的起始点到终点距离L(S 502),并且扫描时间计算装置312基于开始计算写入写入模式所需的扫描时钟数 到端点距离L和对应于高速D / A转换器306的最小时间分辨率的单位距离(S 503)。 计数转换装置605将起始点到终点距离L分离为X和Y分量,以使用扫描时钟数在等式中转换它们(S 504)。 基于该方程,可变速率计算装置314计算消光比以确定可变衰减器307处的消光比(S 505)。 ATT D / A转换器303指定衰减器307处的消光比,以减小对应于高速D / A转换器306的分辨率的单位距离,使得将电子束以缩小单位的间隔照射和扫描 执行写作的距离
Abstract:
A method of coating a coating liquid on a base material having a curved surface portion, includes processes of: a coating process of coating a coating liquid on a base material; and a rotating process of rotating the base material coated with the coating liquid.