SCANNING MICROSCOPE
    1.
    发明申请
    SCANNING MICROSCOPE 审中-公开
    扫描显微镜

    公开(公告)号:US20170059840A1

    公开(公告)日:2017-03-02

    申请号:US15230213

    申请日:2016-08-05

    Inventor: Shingo TAMANO

    Abstract: A scanning microscope includes: a varifocal lens that scans an object in an optical-axis direction of an objective; a scanner that scans the object in a direction orthogonal to the optical axis of the objective; and a controller configured to control the varifocal lens and the scanner.

    Abstract translation: 扫描显微镜包括:在物镜的光轴方向上扫描物体的变焦透镜; 扫描器,其在与物镜的光轴正交的方向上扫描物体; 以及配置成控制变焦透镜和扫描器的控制器。

    SCANNING MICROSCOPE
    2.
    发明申请
    SCANNING MICROSCOPE 审中-公开

    公开(公告)号:US20190056577A1

    公开(公告)日:2019-02-21

    申请号:US16167103

    申请日:2018-10-22

    Inventor: Shingo TAMANO

    Abstract: A scanning microscope includes a laser configured to emit laser light, an objective configured to focus the laser light on an object, a scanner configured to scan the object in a direction orthogonal to an optical axis of the objective, a varifocal lens configured to scan the object in an optical-axis direction of the objective by changing a lens shape of the varifocal lens, a first relay lens configured to project the scanner onto the varifocal lens, a second relay lens configured to project a pupil of the objective onto the varifocal lens, a photodetector configured to detect fluorescence generated from the object upon the laser light being focused on the object by the objective, and a dichroic mirror configured to separate the fluorescence and the laser light emitted from the laser from each other. The varifocal lens is located between the objective and the scanner.

    LASER MICROSCOPE
    3.
    发明申请
    LASER MICROSCOPE 审中-公开

    公开(公告)号:US20170351077A1

    公开(公告)日:2017-12-07

    申请号:US15613101

    申请日:2017-06-02

    Inventor: Shingo TAMANO

    Abstract: A laser microscope 1 includes: a filter unit 18, which is a fluorescence-splitting mechanism that splits the fluorescence generated by the specimen S and the excitation light according to a wavelength, and that changes a wavelength at which light is split; a diffraction grating 22 that disperses the fluorescence split by the filter unit 18; a mirror 23 that changes a wavelength of fluorescence that is detected by a PMT 26 and that is dispersed by the diffraction grating 22; and a control unit 30 that controls the filter unit 18. The control unit 30 performs control to change a wavelength at which the filter unit 18 splits light in accordance with a change in the wavelength of the fluorescence that is detected by the PMT 26 and that is dispersed by the diffraction grating 22, the change being performed by the mirror 23.

    SCANNING MICROSCOPE
    4.
    发明申请
    SCANNING MICROSCOPE 有权
    扫描显微镜

    公开(公告)号:US20150153554A1

    公开(公告)日:2015-06-04

    申请号:US14543394

    申请日:2014-11-17

    Inventor: Shingo TAMANO

    Abstract: A scanning microscope includes a collecting lens that takes in a detection light, a focal position adjustment unit that moves in an optical axis direction of the collecting lens to make the collecting lens move in the optical axis direction, a detector positioned at a location that is optically conjugate to a pupil of the collecting lens, and a relay optical system that relays the pupil to the detector . The relay optical system includes a first optical element with a positive power, the first optical element being positioned in the focal position adjustment unit and converting the detection light that was converted by the collecting lens into a parallel light flux, into a convergent light flux to be emitted outside of the focal position adjustment unit, and a second optical element that is positioned outside of the focal position adjustment unit and between the detector and the first optical element.

    Abstract translation: 扫描显微镜包括:采集检测光的收集透镜;焦点位置调整单元,其在聚光透镜的光轴方向上移动以使聚光透镜沿光轴方向移动;检测器,位于位于 与收集透镜的光瞳光学共轭,以及将瞳孔中继到检测器的中继光学系统。 中继光学系统包括具有正功率的第一光学元件,第一光学元件位于焦点位置调整单元中,并将由聚光透镜转换的检测光转换为平行光束,成为会聚光束, 被发射到焦点位置调整单元外部,以及第二光学元件,其位于焦点位置调整单元的外部,并且位于检测器和第一光学元件之间。

    LASER SCANNING MICROSCOPE, AND LASER SCANNING MICROSCOPE CONTROL METHOD

    公开(公告)号:US20170351074A1

    公开(公告)日:2017-12-07

    申请号:US15608401

    申请日:2017-05-30

    Abstract: A laser scanning microscope includes: an objective that irradiates a specimen with a laser beam; a detection lens that condenses the laser beam that passes through the specimen, the detection lens being arranged so as to face the objective; an optical element that is removably arranged between an image plane on which the detection lens forms an image of the specimen and a first surface that is a lens surface closest to the specimen of the detection lens, the optical element converting the laser beam made incident on the optical element into diffused light or deflecting a portion of the laser beam made incident on the optical element; and a photodetector that detects detection light emitted from the optical element arranged between the image plane and the first surface to the image plane.

    MICROSCOPE APPARATUS
    6.
    发明申请
    MICROSCOPE APPARATUS 有权
    MICROSCOPE设备

    公开(公告)号:US20160054554A1

    公开(公告)日:2016-02-25

    申请号:US14823425

    申请日:2015-08-11

    Inventor: Shingo TAMANO

    CPC classification number: G02B3/08 G02B21/002 G02B21/02 G02B21/06 G02B21/16

    Abstract: A microscope apparatus includes an objective and a photodetector, and projects a pupil of the objective onto a light-receiving surface of the photodetector. The microscope apparatus further includes an optical element that is arranged between the objective and the photodetector. The optical element has a plurality of refractive surfaces which are arranged in a direction orthogonal to an optical axis of the optical element and to which light fluxes emitted from the pupil of the objective at different angles are incident.

    Abstract translation: 显微镜装置包括物镜和光电检测器,并将物镜的光瞳投射到光检测器的光接收表面上。 显微镜装置还包括布置在物镜和光电检测器之间的光学元件。 光学元件具有多个折射表面,它们沿与光学元件的光轴正交的方向布置,并且以不同角度从物镜的光瞳发射的光束入射到该光学元件。

    MICROSCOPE SYSTEM AND METHOD FOR MEASURING REFRACTIVE INDEX OF SAMPLE
    7.
    发明申请
    MICROSCOPE SYSTEM AND METHOD FOR MEASURING REFRACTIVE INDEX OF SAMPLE 有权
    用于测量样品的折射率的微观系统和方法

    公开(公告)号:US20150015871A1

    公开(公告)日:2015-01-15

    申请号:US14315221

    申请日:2014-06-25

    Inventor: Shingo TAMANO

    CPC classification number: G01N21/41 G02B21/02 G02B21/14 G02B26/06

    Abstract: A microscope system includes: a wavefront modulator that modulates a wavefront of light from a light source; an objective that irradiates a sample with light whose wavefront has been modulated by the wavefront modulator; a spherical aberration corrector that corrects spherical aberration caused by a difference between a refractive index of a medium between the objective and the sample and a refractive index of the sample; a refractive index calculator that calculates, for each wavelength of the light from the light source, an average refractive index of a medium between the objective and a condensing position of light emitted from the objective on the basis of an amount of the corrected spherical aberration; and a controller that controls the wavefront modulator to correct chromatic aberration calculated on the basis of the calculated average refractive index for each wavelength.

    Abstract translation: 显微镜系统包括:波前调制器,其调制来自光源的光的波前; 用波前调制器调制波前的光照射样本的目标; 球面像差校正器,其校正由物镜和样品之间的介质的折射率与样品的折射率之间的差引起的球面像差; 折射率计算器,对于来自所述光源的光的每个波长,根据校正的球面像差的量,计算从所述物镜发射的物体与所述物体的聚光位置之间的介质的平均折射率; 以及控制器,其控制波前调制器以校正基于每个波长的计算的平均折射率计算的色差。

    SCANNING OPTICAL MICROSCOPE
    8.
    发明申请
    SCANNING OPTICAL MICROSCOPE 有权
    扫描光学显微镜

    公开(公告)号:US20140376078A1

    公开(公告)日:2014-12-25

    申请号:US14298707

    申请日:2014-06-06

    Abstract: A scanning optical microscope includes a light source, a light converging optical system, a stage, a scanning unit which displaces an illumination light and the stage relatively, a detecting optical system, and a photodetector. A light modulation element and a relay optical system are disposed on the light converging optical system side of the light source, and a modulated signal having only amplitude changed is input to the light modulation element, and the light modulation element is positioned such that the illumination light emerged from the light modulation element with respect to the modulated signal of a predetermined amplitude coincides with an optical axis of the light converging optical system, and a position of a pupil of the light converging optical system and a position of the light modulation element are conjugate through at least the relay optical system.

    Abstract translation: 扫描光学显微镜包括光源,聚光光学系统,舞台,相对地移动照明光和舞台的扫描单元,检测光学系统和光电检测器。 光调制元件和中继光学系统设置在光源的聚光光学系统侧,并且只有振幅改变的调制信号被输入到光调制元件,并且光调制元件被定位成使得照明 相对于预定幅度的调制信号从光调制元件出射的光与会聚光学系统的光轴重合,会聚光学系统的光瞳位置和光调制元件的位置是 通过至少中继光学系统共轭。

Patent Agency Ranking