Power Semiconductor Device and Method of Manufacturing the Same, and Power Conversion Device

    公开(公告)号:US20220415738A1

    公开(公告)日:2022-12-29

    申请号:US17771206

    申请日:2020-11-18

    IPC分类号: H01L23/31 H01L23/00

    摘要: A power semiconductor device in which the size of an insulating substrate is reduced and connection failure can be suppressed includes an insulating substrate, a semiconductor element, and a printed circuit board. The semiconductor element is bonded to one main surface of the insulating substrate. The printed circuit board is bonded to face the semiconductor element. The semiconductor element has a main electrode and a signal electrode. The printed circuit board includes a core member, a first conductor layer, and a second conductor layer. The second conductor layer has a bonding pad. The printed circuit board has a missing portion. A metal column portion is arranged to pass through the inside of the missing portion and reach the insulating substrate. The signal electrode and the bonding pad are connected by a metal wire. The metal column portion and the insulating substrate are bonded.

    SEMICONDUCTOR DEVICE
    3.
    发明公开

    公开(公告)号:US20240266315A1

    公开(公告)日:2024-08-08

    申请号:US18500993

    申请日:2023-11-02

    发明人: Kazuya OKADA

    IPC分类号: H01L23/00 H01L25/07

    摘要: An object is to provide a technique capable of reducing variations in gate-source voltage among a plurality of semiconductor elements. The semiconductor device includes the plurality of semiconductor elements, a metal electrode, and a control wire. Each of the plurality of semiconductor elements has a control electrode configured to control a main current. The main current of the plurality of semiconductor element flows through the metal electrode. The control wire connects each of the control electrodes of the plurality of semiconductor elements in series, and interlinks with a magnetic field generated when the main current flows through the metal electrode.

    SEMICONDUCTOR DEVICE
    4.
    发明申请

    公开(公告)号:US20190074238A1

    公开(公告)日:2019-03-07

    申请号:US16004769

    申请日:2018-06-11

    摘要: Provided is a technique for improving product attachment. In a semiconductor device, the following expression is satisfied by an angle A formed by an imaginary line connecting two attachment holes together and an imaginary line connecting together a lowest point of one of two projections positioned in a surrounding portion of one of the two attachment holes and a contact point between a bulge and a heat sink, with a screw fastened to the heat sink through the one attachment hole, where M represents a vertical direction between the lower end of a body and the lower end of a case, where W represents a bulge amount of the bulge, where T represents a height of the projection, where L represents a horizontal distance from the outer peripheral end of the case to the outer peripheral end of the heat dissipation plate: 0