All reflective wafer defect inspection and review systems and methods

    公开(公告)号:US10309907B2

    公开(公告)日:2019-06-04

    申请号:US15055292

    申请日:2016-02-26

    Abstract: Disclosed are methods and apparatus for reflecting, towards a sensor, an Infrared to vacuum ultra-violet (VUV) light that is reflected from a target substrate. The system includes a first mirror arranged to receive and reflect the Infrared to VUV light that is reflected from the target substrate and a second mirror arranged to receive and reflect Infrared to VUV light that is reflected by the first mirror. The first and second mirrors are arranged and shaped so as to reflect Infrared to VUV light from the target substrate towards an optical axis of the apparatus. In another embodiment, the apparatus can also include a third mirror arranged to receive and reflect the Infrared to VUV light that is reflected by the second mirror and a fourth mirror arranged to receive and reflect such illuminating light that is reflected by the third mirror towards the sensor. In one more embodiment, a reflecting or refracting optics is used to relay the image by above optics to the sensor; various magnification is achieved by adjusting the distance between the intermediate image and the relay optics.

    Method and System for Controlling Convective Flow in a Light-Sustained Plasma
    3.
    发明申请
    Method and System for Controlling Convective Flow in a Light-Sustained Plasma 有权
    用于控制轻维持等离子体中对流的方法和系统

    公开(公告)号:US20160322211A1

    公开(公告)日:2016-11-03

    申请号:US15207136

    申请日:2016-07-11

    CPC classification number: H01J65/042 H01J61/28 H01J61/523 H01J65/00 H05H1/24

    Abstract: A system for controlling convective flow in a light-sustained plasma includes an illumination source configured to generate illumination, a plasma cell including a bulb for containing a volume of gas, a collector element arranged to focus illumination from the illumination source into the volume of gas in order to generate a plasma within the volume of gas contained within the bulb. Further, the plasma cell is disposed within a concave region of the collector element, where the collector element includes an opening for propagating a portion of a plume of the plasma to a region external to the concave region of the collect element.

    Abstract translation: 用于控制光持久等离子体中的对流的系统包括被配置为产生照明的照明源,包括用于容纳一定体积的气体的灯泡的等离子体单元,被布置成将来自照明源的照明聚焦到气体体积中的集电器元件 以便在容纳在灯泡内的气体的体积内产生等离子体。 此外,等离子体单元设置在集电器元件的凹入区域内,其中集电器元件包括用于将等离子体的一部分羽流传播到收集元件的凹部区域外部的区域的开口。

    High-Power Short-Pass Total Internal Reflection Filter

    公开(公告)号:US20190235390A1

    公开(公告)日:2019-08-01

    申请号:US16165799

    申请日:2018-10-19

    Inventor: Wei Zhao Ilya Bezel

    Abstract: An apparatus for generating filtered light may include a broadband illumination source configured to generate broadband illumination and a total internal reflection (TIR) filter formed from a material at least partially transparent to the broadband illumination. The TIR filter may include one or more input faces oriented to receive the broadband illumination. The TIR filter may further be oriented to reflect wavelengths of the broadband illumination beam below a selected cutoff wavelength on one or more filtering faces as filtered broadband illumination and provide the filtered broadband illumination beam through one or more output faces. The cutoff wavelength may further be selected based on total internal reflection on the one or more faces.

    High-power short-pass total internal reflection filter

    公开(公告)号:US10691024B2

    公开(公告)日:2020-06-23

    申请号:US16165799

    申请日:2018-10-19

    Inventor: Wei Zhao Ilya Bezel

    Abstract: An apparatus for generating filtered light may include a broadband illumination source configured to generate broadband illumination and a total internal reflection (TIR) filter formed from a material at least partially transparent to the broadband illumination. The TIR filter may include one or more input faces oriented to receive the broadband illumination. The TIR filter may further be oriented to reflect wavelengths of the broadband illumination beam below a selected cutoff wavelength on one or more filtering faces as filtered broadband illumination and provide the filtered broadband illumination beam through one or more output faces. The cutoff wavelength may further be selected based on total internal reflection on the one or more faces.

    System and method for LADAR-based optic alignment and characterization

    公开(公告)号:US10145944B1

    公开(公告)日:2018-12-04

    申请号:US14703664

    申请日:2015-05-04

    Abstract: An optical alignment system includes a LADAR sub-system including: a laser source and a probe configured to deliver probe illumination from the laser source to a first optical surface of the optical system and an additional optical surface of the optical system. The probe is further configured to receive a first measurement signal from the first optical surface and an additional measurement signal from the additional optical surface of the optical system. The system also includes a detector configured to receive a first combined signal and an additional combined signal from an optical coupling assembly. The system further include a controller configured to determine a relative distance between the first optical surface and the additional optical surface based on the first combined signal or the additional combined signal.

    System and method for imaging a sample with a laser sustained plasma illumination output
    7.
    发明授权
    System and method for imaging a sample with a laser sustained plasma illumination output 有权
    用激光持续等离子体照明输出成像样品的系统和方法

    公开(公告)号:US09558858B2

    公开(公告)日:2017-01-31

    申请号:US14459155

    申请日:2014-08-13

    CPC classification number: G21K5/00

    Abstract: The inspection of a sample with VUV light from a laser sustained plasma includes generating pumping illumination including a first selected wavelength, or range of wavelength, containing a volume of gas suitable for plasma generation, generating broadband radiation including a second selected wavelength, or range of wavelengths, by forming a plasma within the volume of gas by focusing the pumping illumination into the volume of gas, illuminating a surface of a sample with the broadband radiation emitted from the plasma via an illumination pathway, collecting illumination from a surface of the sample, focusing the collected illumination onto a detector via a collection pathway to form an image of at least a portion of the surface of the sample and purging the illumination pathway and/or the collection pathway with a selected purge gas.

    Abstract translation: 使用来自激光持续等离子体的VUV光检测样品包括产生包括第一选定波长或波长范围的泵浦照明,其包含适于等离子体产生的气体体积,产生包括第二选定波长的宽度辐射或范围 通过将泵浦照明聚焦到气体体积中,通过将等离子体聚焦在气体体积中,利用从等离子体经由照明路径发射的宽带辐射来照射样品的表面,从样品的表面收集照明, 通过收集路径将收集的照明聚焦到检测器上,以形成样品表面的至少一部分的图像,并用所选择的吹扫气体吹扫照明路径和/或收集路径。

    Method and system for controlling convective flow in a light-sustained plasma
    8.
    发明授权
    Method and system for controlling convective flow in a light-sustained plasma 有权
    用于控制光持久等离子体中对流的方法和系统

    公开(公告)号:US09390902B2

    公开(公告)日:2016-07-12

    申请号:US14224945

    申请日:2014-03-25

    CPC classification number: H01J65/042 H01J61/28 H01J61/523 H01J65/00 H05H1/24

    Abstract: A system for controlling convective flow in a light-sustained plasma includes an illumination source configured to generate illumination, a plasma cell including a bulb for containing a volume of gas, a collector element arranged to focus illumination from the illumination source into the volume of gas in order to generate a plasma within the volume of gas contained within the bulb. Further, the plasma cell is disposed within a concave region of the collector element, where the collector element includes an opening for propagating a portion of a plume of the plasma to a region external to the concave region of the collect element.

    Abstract translation: 用于控制光持久等离子体中的对流的系统包括被配置为产生照明的照明源,包括用于容纳一定体积的气体的灯泡的等离子体单元,被布置成将来自照明源的照明聚焦到气体体积中的集电器元件 以便在容纳在灯泡内的气体的体积内产生等离子体。 此外,等离子体单元设置在集电器元件的凹入区域内,其中集电器元件包括用于将等离子体的一部分羽流传播到收集元件的凹部区域外部的区域的开口。

    System and Method for Imaging a Sample with a Laser Sustained Plasma Illumination Output
    9.
    发明申请
    System and Method for Imaging a Sample with a Laser Sustained Plasma Illumination Output 有权
    用激光持续等离子体照明输出成像样品的系统和方法

    公开(公告)号:US20150048741A1

    公开(公告)日:2015-02-19

    申请号:US14459155

    申请日:2014-08-13

    CPC classification number: G21K5/00

    Abstract: The inspection of a sample with VUV light from a laser sustained plasma includes generating pumping illumination including a first selected wavelength, or range of wavelength, containing a volume of gas suitable for plasma generation, generating broadband radiation including a second selected wavelength, or range of wavelengths, by forming a plasma within the volume of gas by focusing the pumping illumination into the volume of gas, illuminating a surface of a sample with the broadband radiation emitted from the plasma via an illumination pathway, collecting illumination from a surface of the sample, focusing the collected illumination onto a detector via a collection pathway to form an image of at least a portion of the surface of the sample and purging the illumination pathway and/or the collection pathway with a selected purge gas.

    Abstract translation: 使用来自激光持续等离子体的VUV光检测样品包括产生包括第一选定波长或波长范围的泵浦照明,其包含适于等离子体产生的气体体积,产生包括第二选定波长的宽度辐射或范围 通过将泵浦照明聚焦到气体体积中,通过将等离子体聚焦在气体体积中,利用从等离子体经由照明路径发射的宽带辐射来照射样品的表面,从样品的表面收集照明, 通过收集路径将收集的照明聚焦到检测器上,以形成样品表面的至少一部分的图像,并用所选择的吹扫气体吹扫照明路径和/或收集路径。

    System and Method for Imaging a Sample with an Illumination Source Modified by a Spatial Selective Wavelength Filter
    10.
    发明申请
    System and Method for Imaging a Sample with an Illumination Source Modified by a Spatial Selective Wavelength Filter 审中-公开
    用空间选择波长滤波器修改的照明源成像样品的系统和方法

    公开(公告)号:US20170059490A1

    公开(公告)日:2017-03-02

    申请号:US14839338

    申请日:2015-08-28

    Abstract: A system for illuminating a sample with a spectrally filtered illumination source includes an illumination source configured to generate a beam of illumination having a first set of wavelengths. In addition, the system includes a wavelength filtering sub-system, a sample stage, an illumination sub-system, a detector, and an objective to focus illumination from the surface of one or more samples and focus the collected illumination to the detector. Further, the wavelength filtering sub-system includes one or more first dispersive elements positioned to introduce spatial dispersion into the beam, a spatial filter element, and one or more dispersive elements positioned to remove spatial dispersion from the beam. The spatial filter element is further positioned to pass at least a portion of the beam including a second set of wavelengths, wherein the second set of wavelengths is a subset of the first set of wavelengths.

    Abstract translation: 用频谱滤波的照明源照射样本的系统包括被配置为产生具有第一组波长的照明束的照明源。 此外,该系统包括波长滤波子系统,样本台,照明子系统,检测器和用于聚焦来自一个或多个样本的表面的照明并将所收集的照明聚焦到检测器的目的。 此外,波长滤波子系统包括定位成将空间色散引入光束中的一个或多个第一色散元件,空间滤光元件以及定位成从光束去除空间色散的一个或多个色散元件。 空间滤波器元件还被定位成使包括第二组波长的波束的至少一部分通过,其中第二组波长是第一组波长的子集。

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