Magnetic capacitor element
    4.
    发明授权

    公开(公告)号:US10319528B2

    公开(公告)日:2019-06-11

    申请号:US15854360

    申请日:2017-12-26

    Abstract: A magnetic capacitor element is provided. The magnetic capacitor element includes a first electrode, a second electrode, a first dielectric layer, a second dielectric layer, a magnetic layer and an oxide layer. The second electrode is disposed opposite to the first electrode. The first dielectric layer is disposed between the first electrode and the second electrode. The second dielectric layer is disposed between the first dielectric layer and the second electrode. The magnetic layer is disposed between the second electrode and the second dielectric layer. The oxide layer is disposed between the second dielectric layer and the magnetic layer.

    MEASURING APPARATUS FOR SOLAR CELL
    5.
    发明申请

    公开(公告)号:US20180123510A1

    公开(公告)日:2018-05-03

    申请号:US15382739

    申请日:2016-12-19

    CPC classification number: H02S50/10

    Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.

    Measuring apparatus for solar cell

    公开(公告)号:US10333462B2

    公开(公告)日:2019-06-25

    申请号:US15382739

    申请日:2016-12-19

    Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.

    Measuring method
    9.
    发明授权

    公开(公告)号:US11682179B2

    公开(公告)日:2023-06-20

    申请号:US17542504

    申请日:2021-12-06

    CPC classification number: G06T19/006 G06T3/4038

    Abstract: A measuring method includes the following. An image to be tested of an object to be tested with a first characteristic pattern is formed and is copied to form multiple images to be tested. The multiple images to be tested are superimposed to form a to-be-tested overlapped image which has the multiple first characteristic patterns. A reference image of a reference object with a second characteristic pattern is formed and is copied to form multiple reference images. The multiple reference images are superimposed to form a reference overlapped image which has the multiple second characteristic patterns. The to-be-tested overlapped image and the reference overlapped image are superimposed to generate a virtual moiré image having a moiré pattern different from the multiple first characteristic patterns and the multiple second characteristic patterns.

    MEASURING METHOD
    10.
    发明申请

    公开(公告)号:US20230119864A1

    公开(公告)日:2023-04-20

    申请号:US17542504

    申请日:2021-12-06

    Abstract: A measuring method includes the following. An image to be tested of an object to be tested with a first characteristic pattern is formed and is copied to form multiple images to be tested. The multiple images to be tested are superimposed to form a to-be-tested overlapped image which has the multiple first characteristic patterns. A reference image of a reference object with a second characteristic pattern is formed and is copied to form multiple reference images. The multiple reference images are superimposed to form a reference overlapped image which has the multiple second characteristic patterns. The to-be-tested overlapped image and the reference overlapped image are superimposed to generate a virtual moiré image having a moiré pattern different from the multiple first characteristic patterns and the multiple second characteristic patterns.

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