公开(公告)号：US09866171B2

公开(公告)日：2018-01-09

申请号：US14965893

申请日：2015-12-10

Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor： Yean-San Long ,  Shu-Tsung Hsu ,  Teng-Chun Wu ,  Min-An Tsai

IPC: G01R31/00 ,  H02S50/15

CPC classification number: H02S50/15

Abstract: A measuring device for the property of a photovoltaic device and a measuring method using the same are provided. The measuring device includes several light sources and a feedback control module. The light color of each light source is different and includes several light-emitting elements symmetrically configured. The feedback control module is used for controlling illuminations of the light-emitting elements for measuring the property of a photovoltaic device.

公开(公告)号：US20180123510A1

公开(公告)日：2018-05-03

申请号：US15382739

申请日：2016-12-19

Applicant: Industrial Technology Research Institute

Inventor： Ren-Chin Shr ,  Yean-San Long ,  En-Yun Wang ,  Min-An Tsai ,  Hung-Sen Wu ,  Teng-Chun Wu ,  Cho-Fan Hsieh ,  Chin Lien

IPC: H02S50/10

CPC classification number: H02S50/10

Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.

公开(公告)号：US20230333168A1

公开(公告)日：2023-10-19

申请号：US18152771

申请日：2023-01-11

Applicant: Industrial Technology Research Institute

Inventor： Teng-Chun Wu ,  Yean-San Long ,  Cho-Fan Hsieh ,  Min-An Tsai ,  Hsiu-Ming Chang ,  Feng-Ming Chuang ,  Tze-An Liu

IPC: G01R31/367

CPC classification number: G01R31/367

Abstract: A method and a device for battery detection are provided. In the method, multiple characteristic values measured from a battery during operation of the battery are captured via a data capturing device to form a characteristic curve. Curve fitting is performed on the characteristic curve to obtain a curve error. According to the magnitude of the curve error, it is determined whether the battery is normal. When the determination result is abnormal, a step-curvature radius analysis is performed on the characteristic curve to determine whether the battery is normal.

公开(公告)号：US10333462B2

公开(公告)日：2019-06-25

申请号：US15382739

申请日：2016-12-19

Applicant: Industrial Technology Research Institute

Inventor： Ren-Chin Shr ,  Yean-San Long ,  En-Yun Wang ,  Min-An Tsai ,  Hung-Sen Wu ,  Teng-Chun Wu ,  Cho-Fan Hsieh ,  Chin Lien

IPC: H02S50/10

Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.

公开(公告)号：US10461690B2

公开(公告)日：2019-10-29

申请号：US15830010

申请日：2017-12-04

Applicant: Industrial Technology Research Institute

Inventor： Yean-San Long ,  En-Yun Wang ,  Ren-Chin Shr ,  Yu-Ting Yen ,  Hsiang-Ying Cheng

IPC: G01R31/26 ,  H02S50/10 ,  G06F3/14 ,  H01L31/18

Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error is not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.

公开(公告)号：US20190173423A1

公开(公告)日：2019-06-06

申请号：US15830010

申请日：2017-12-04

Applicant: Industrial Technology Research Institute

Inventor： Yean-San Long ,  En-Yun Wang ,  Ren-Chin Shr ,  Yu-Ting Yen ,  Hsiang-Ying Cheng

IPC: H02S50/10 ,  H01L31/18 ,  G06F3/14

CPC classification number: H02S50/10 ,  G06F3/14 ,  H01L31/18

Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error s not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.

公开(公告)号：US20150039270A1

公开(公告)日：2015-02-05

申请号：US14301343

申请日：2014-06-11

Applicant: Industrial Technology Research Institute

Inventor： Yean-San Long ,  Teng-Chun Wu ,  Cho-Fan Hsieh ,  Shu-Tsung Hsu ,  Chan-Hsiao Ho

IPC: G01R31/40 ,  G01N21/95 ,  G01R31/26

CPC classification number: H02S50/00 ,  G01N21/95

Abstract: A method and a system for inspecting a defect of a solar cell are provided, and the method includes: receiving inspecting data corresponding to the solar cell from an inspecting device; obtaining a current-voltage (I-V) curve of the solar cell according to the inspecting data; defining a first reference region on the I-V curve, and obtaining a plurality of first curve characteristics of the I-V curve in the first reference region; determining a defect type of the solar cell according to the first curve characteristics.

Abstract translation: 提供了一种用于检查太阳能电池缺陷的方法和系统，该方法包括：从检查装置接收对应于太阳能电池的检查数据; 根据检查数据获得太阳能电池的电流 - 电压（I-V）曲线; 定义I-V曲线上的第一参考区域，并获得第一参考区域中的I-V曲线的多个第一曲线特性; 根据第一曲线特性确定太阳能电池的缺陷类型。