公开(公告)号：US20150039270A1

公开(公告)日：2015-02-05

申请号：US14301343

申请日：2014-06-11

Applicant: Industrial Technology Research Institute

Inventor： Yean-San Long ,  Teng-Chun Wu ,  Cho-Fan Hsieh ,  Shu-Tsung Hsu ,  Chan-Hsiao Ho

IPC: G01R31/40 ,  G01N21/95 ,  G01R31/26

CPC classification number: H02S50/00 ,  G01N21/95

Abstract: A method and a system for inspecting a defect of a solar cell are provided, and the method includes: receiving inspecting data corresponding to the solar cell from an inspecting device; obtaining a current-voltage (I-V) curve of the solar cell according to the inspecting data; defining a first reference region on the I-V curve, and obtaining a plurality of first curve characteristics of the I-V curve in the first reference region; determining a defect type of the solar cell according to the first curve characteristics.

Abstract translation: 提供了一种用于检查太阳能电池缺陷的方法和系统，该方法包括：从检查装置接收对应于太阳能电池的检查数据; 根据检查数据获得太阳能电池的电流 - 电压（I-V）曲线; 定义I-V曲线上的第一参考区域，并获得第一参考区域中的I-V曲线的多个第一曲线特性; 根据第一曲线特性确定太阳能电池的缺陷类型。

公开(公告)号：US09866171B2

公开(公告)日：2018-01-09

申请号：US14965893

申请日：2015-12-10

Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor： Yean-San Long ,  Shu-Tsung Hsu ,  Teng-Chun Wu ,  Min-An Tsai

IPC: G01R31/00 ,  H02S50/15

CPC classification number: H02S50/15

Abstract: A measuring device for the property of a photovoltaic device and a measuring method using the same are provided. The measuring device includes several light sources and a feedback control module. The light color of each light source is different and includes several light-emitting elements symmetrically configured. The feedback control module is used for controlling illuminations of the light-emitting elements for measuring the property of a photovoltaic device.