公开(公告)号：US10461690B2

公开(公告)日：2019-10-29

申请号：US15830010

申请日：2017-12-04

Applicant: Industrial Technology Research Institute

Inventor： Yean-San Long ,  En-Yun Wang ,  Ren-Chin Shr ,  Yu-Ting Yen ,  Hsiang-Ying Cheng

IPC: G01R31/26 ,  H02S50/10 ,  G06F3/14 ,  H01L31/18

Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error is not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.

公开(公告)号：US20190173423A1

公开(公告)日：2019-06-06

申请号：US15830010

申请日：2017-12-04

Applicant: Industrial Technology Research Institute

Inventor： Yean-San Long ,  En-Yun Wang ,  Ren-Chin Shr ,  Yu-Ting Yen ,  Hsiang-Ying Cheng

IPC: H02S50/10 ,  H01L31/18 ,  G06F3/14

CPC classification number: H02S50/10 ,  G06F3/14 ,  H01L31/18

Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error s not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.