公开(公告)号：US20190051782A1

公开(公告)日：2019-02-14

申请号：US15826707

申请日：2017-11-30

Applicant: Industrial Technology Research Institute

Inventor： Chao-Ping Huang ,  Shang-Yeh Wen ,  Cheng-Yu Peng

IPC: H01L31/05 ,  H01L31/02

Abstract: A photovoltaic module is provided, and a cell set thereof includes a first cell, a second cell, and a conductive connection element. In the first cell, a first semiconductor stack has a first surface, a second surface, and a first side surface. A first electrode is disposed on the first surface. A second electrode is disposed on the second surface. In the second cell, a second semiconductor stack has a third surface, a fourth surface, and a second side surface. A third electrode is disposed on the third surface. A fourth electrode is disposed on the fourth surface. The conductive connection element connects the first electrode with a part of a first insulation layer on the second surface, and connects the third electrode with a part of a second insulation layer on the fourth surface.

公开(公告)号：US20190027627A1

公开(公告)日：2019-01-24

申请号：US15826002

申请日：2017-11-29

Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor： Wen-Kuei Lee ,  Mei-Hsiu Lin ,  Cheng-Yu Peng

IPC: H01L31/048 ,  H01L31/05

Abstract: A solar photovoltaic module including a solar cell, a first package layer and a second package layer is provided. The solar cell has a first surface and a second surface opposite to the first surface. The first package layer is formed on the first surface. The second package layer is formed on the second surface. The first package layer and the second package layer are made of different crosslinked materials, and a difference between the crosslink density of the first package layer and the crosslink density of the second package layer is equal to or less than 15%.

公开(公告)号：US20160079462A1

公开(公告)日：2016-03-17

申请号：US14864906

申请日：2015-09-25

Applicant: Industrial Technology Research Institute

Inventor： Cheng-Yu Peng ,  Chien-Rong Huang ,  Ray-Chien Lai

IPC: H01L31/054 ,  H01L31/048 ,  H01L31/049

CPC classification number: H01L31/0547 ,  H01L31/048 ,  Y02E10/52

Abstract: A package structure of solar photovoltaic module is provided. The package structure of solar photovoltaic module includes a transparent substrate, a backsheet disposed opposite to the transparent substrate, a plurality of solar cells between the transparent substrate and the backsheet, several encapsulants sandwiched in between the transparent substrate and the backsheet, and an optical board, wherein the encapsulants encapsulate the solar cells. The optical board is adhered to an outer surface of the backsheet, wherein the optical board has an embossing surface, and the embossing surface is a serrated surface, and a vertex angle of the serrated surface is larger than 60° and less than 150°.

Abstract translation: 提供太阳能光伏组件的封装结构。 太阳能光伏组件的封装结构包括透明基板，与透明基板相对设置的底片，在透明基板和底片之间的多个太阳能电池，夹在透明基板和底片之间的多个密封剂，以及光学板 ，其中所述密封剂封装所述太阳能电池。 光学板粘附到底片的外表面，其中光学板具有压花表面，并且压花表面是锯齿状表面，并且锯齿形表面的顶角大于60°且小于150°。

公开(公告)号：US11682179B2

公开(公告)日：2023-06-20

申请号：US17542504

申请日：2021-12-06

Applicant: Industrial Technology Research Institute

Inventor： Yu-Tai Li ,  Kao-Chi Lin ,  Cho-Fan Hsieh ,  Teng-Chun Wu ,  Cheng-Yu Peng

IPC: G06T19/00 ,  G06T3/40

CPC classification number: G06T19/006 ,  G06T3/4038

Abstract: A measuring method includes the following. An image to be tested of an object to be tested with a first characteristic pattern is formed and is copied to form multiple images to be tested. The multiple images to be tested are superimposed to form a to-be-tested overlapped image which has the multiple first characteristic patterns. A reference image of a reference object with a second characteristic pattern is formed and is copied to form multiple reference images. The multiple reference images are superimposed to form a reference overlapped image which has the multiple second characteristic patterns. The to-be-tested overlapped image and the reference overlapped image are superimposed to generate a virtual moiré image having a moiré pattern different from the multiple first characteristic patterns and the multiple second characteristic patterns.

公开(公告)号：US20230119864A1

公开(公告)日：2023-04-20

申请号：US17542504

申请日：2021-12-06

Applicant: Industrial Technology Research Institute

Inventor： Yu-Tai Li ,  Kao-Chi Lin ,  Cho-Fan Hsieh ,  Teng-Chun Wu ,  Cheng-Yu Peng

IPC: G06T19/00 ,  G06T3/40

Abstract: A measuring method includes the following. An image to be tested of an object to be tested with a first characteristic pattern is formed and is copied to form multiple images to be tested. The multiple images to be tested are superimposed to form a to-be-tested overlapped image which has the multiple first characteristic patterns. A reference image of a reference object with a second characteristic pattern is formed and is copied to form multiple reference images. The multiple reference images are superimposed to form a reference overlapped image which has the multiple second characteristic patterns. The to-be-tested overlapped image and the reference overlapped image are superimposed to generate a virtual moiré image having a moiré pattern different from the multiple first characteristic patterns and the multiple second characteristic patterns.