公开(公告)号：US20070069123A1

公开(公告)日：2007-03-29

申请号：US11508323

申请日：2006-08-23

Applicant: Shinji Nagai ,  Hiroyuki Yasuda ,  Tetsuya Nishida

Inventor： Shinji Nagai ,  Hiroyuki Yasuda ,  Tetsuya Nishida

IPC: H01J49/00

CPC classification number: H01J49/424 ,  H01J49/0009 ,  H01J49/0027

Abstract: An ion resonance condition is corrected accurately in an ion trapping device. Measurements are repeated by alternately applying and not applying a resonance frequency voltage while spectral data is obtained continuously. Data obtained in the absence of the resonance frequency voltage is used as reference data to correct the set data of a resonance condition. As a result, calibration can be made while taking into consideration the variations in the amount of ions that are introduced into the ion trap.

Abstract translation: 在离子捕获装置中精确校正离子共振条件。 通过在连续获得光谱数据的同时交替地施加并不施加共振频率电压来重复测量。 在没有谐振频率电压的情况下获得的数据被用作参考数据，以校正谐振条件的设定数据。 结果，可以考虑到引入到离子阱中的离子量的变化来进行校准。

公开(公告)号：US07381948B2

公开(公告)日：2008-06-03

申请号：US11508323

申请日：2006-08-23

Applicant: Shinji Nagai ,  Hiroyuki Yasuda ,  Tetsuya Nishida

Inventor： Shinji Nagai ,  Hiroyuki Yasuda ,  Tetsuya Nishida

IPC: B01D59/44 ,  H01J49/00 ,  G01D18/00 ,  G12B13/00

CPC classification number: H01J49/424 ,  H01J49/0009 ,  H01J49/0027

Abstract: An ion resonance condition is corrected accurately in an ion trapping device. Measurements are repeated by alternately applying and not applying a resonance frequency voltage while spectral data is obtained continuously. Data obtained in the absence of the resonance frequency voltage is used as reference data to correct the set data of a resonance condition. As a result, calibration can be made while taking into consideration the variations in the amount of ions that are introduced into the ion trap.

Abstract translation: 在离子捕获装置中精确校正离子共振条件。 通过在连续获得光谱数据的同时交替地施加并不施加共振频率电压来重复测量。 在没有谐振频率电压的情况下获得的数据被用作参考数据，以校正谐振条件的设定数据。 结果，可以考虑到引入到离子阱中的离子量的变化来进行校准。

公开(公告)号：US20080054173A1

公开(公告)日：2008-03-06

申请号：US11889232

申请日：2007-08-10

Applicant: Hiroyuki Yasuda ,  Shinji Nagai ,  Tetsuya Nishida

Inventor： Hiroyuki Yasuda ,  Shinji Nagai ,  Tetsuya Nishida

IPC: H01J49/04

CPC classification number: H01J49/4265 ,  H01J49/0081

Abstract: According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.

Abstract translation: 根据本发明的一个方面，提供了一种离子阱质谱法和使用质谱仪的离子阱质谱仪，该质谱仪包括：用于电离样品的离子源部分; 用于捕获在离子源中产生的离子的离子阱部分; 用于向离子阱部分施加主高频电压的主高频电源和用于向其提供辅助高频电压的辅助高频电源; 以及用于检测从离子阱排出的离子的检测器。 离子阱质谱方法和离子阱质谱装置包括以下步骤：通过在将离子聚集到离子阱部分的同时喷出不期望的离子将期望的离子累积到离子阱部分中; 并且交替地重复留在离子阱部分中并留下离子阱部分中的期望离子的不需要的离子。

公开(公告)号：US07115862B2

公开(公告)日：2006-10-03

申请号：US11018375

申请日：2004-12-22

Applicant: Shinji Nagai ,  Hiroyuki Yasuda ,  Tetsuya Nishida

Inventor： Shinji Nagai ,  Hiroyuki Yasuda ,  Tetsuya Nishida

IPC: B01D59/44 ,  H01J49/00 ,  G01D18/00 ,  G12B13/00

CPC classification number: H01J49/424 ,  H01J49/0009 ,  H01J49/0027

Abstract: An ion resonance condition is corrected accurately in an ion trapping device. Measurements are repeated by alternately applying and not applying a resonance frequency voltage while spectral data is obtained continuously. Data obtained in the absence of the resonance frequency voltage is used as reference data to correct the set data of a resonance condition. As a result, calibration can be made while taking into consideration the variations in the amount of ions that are introduced into the ion trap.

Abstract translation: 在离子捕获装置中精确校正离子共振条件。 通过在连续获得光谱数据的同时交替地施加并不施加共振频率电压来重复测量。 在没有谐振频率电压的情况下获得的数据被用作参考数据，以校正谐振条件的设定数据。 结果，可以考虑到引入到离子阱中的离子量的变化来进行校准。

公开(公告)号：US07989764B2

公开(公告)日：2011-08-02

申请号：US11889232

申请日：2007-08-10

Applicant: Hiroyuki Yasuda ,  Shinji Nagai ,  Tetsuya Nishida

Inventor： Hiroyuki Yasuda ,  Shinji Nagai ,  Tetsuya Nishida

IPC: H01J49/42 ,  H01J49/40

CPC classification number: H01J49/4265 ,  H01J49/0081

Abstract: According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.

Abstract translation: 根据本发明的一个方面，提供了一种离子阱质谱法和使用质谱仪的离子阱质谱仪，该质谱仪包括：用于电离样品的离子源部分; 用于捕获在离子源中产生的离子的离子阱部分; 用于向离子阱部分施加主高频电压的主高频电源和用于向其提供辅助高频电压的辅助高频电源; 以及用于检测从离子阱排出的离子的检测器。 离子阱质谱方法和离子阱质谱装置包括以下步骤：通过在将离子聚集到离子阱部分的同时喷出不期望的离子将期望的离子累积到离子阱部分中; 并且交替地重复留在离子阱部分中并留下离子阱部分中的期望离子的不需要的离子。

公开(公告)号：US20090179148A1

公开(公告)日：2009-07-16

申请号：US12350328

申请日：2009-01-08

Applicant: Hiroyuki Yasuda ,  Yasushi Terui ,  Shinji Nagai ,  Tetsuya Nishida

Inventor： Hiroyuki Yasuda ,  Yasushi Terui ,  Shinji Nagai ,  Tetsuya Nishida

IPC: B01D59/44 ,  H01J49/00

CPC classification number: H01J49/004 ,  H01J49/063

Abstract: Performing an MS3 with a tandem mass spectrometer causes problems of increase in size of the device and of increase in cost. Likewise, a plural number of times MS/MS analyses are even more difficult. An electrode to create a harmonic potential is disposed in a collision cell, and fragment ions produced by the first-time collision induced dissociation are accumulated in the harmonic potential. Target ions of the subsequent stage are let out, by means of an axial resonance excitation, selectively from the accumulated ions. The ions are excited in the axial direction to have a potential exceeding the harmonic potential. Thereby, the second-time collision induced dissociation is performed by means of a potential difference provided at the subsequent stage. In addition, an operation to return the ions back to the harmonic potential enables a plural number of times MS/MS analyses to be performed.

Abstract translation: 使用串联质谱仪进行MS3会导致设备尺寸增加和成本增加的问题。 同样，多次MS / MS分析更加困难。 用于产生谐波电位的电极设置在碰撞室中，并且由第一次碰撞引起的解离产生的碎片离子累积在谐波电位中。 选择性地从累积的离子中排出后续阶段的目标离子，借助于轴向共振激发。 离子在轴向上被激发以具有超过谐波电位的电位。 因此，通过在后续阶段提供的电位差来执行第二次碰撞诱导解离。 此外，使离子返回到谐波电位的操作能够进行多次MS / MS分析。

公开(公告)号：US20050139763A1

公开(公告)日：2005-06-30

申请号：US11018375

申请日：2004-12-22

Applicant: Shinji Nagai ,  Hiroyuki Yasuda ,  Tetsuya Nishida

Inventor： Shinji Nagai ,  Hiroyuki Yasuda ,  Tetsuya Nishida

IPC: G01N27/62 ,  B01D59/44 ,  H01J49/40 ,  H01J49/42

CPC classification number: H01J49/424 ,  H01J49/0009 ,  H01J49/0027

Abstract: An ion resonance condition is corrected accurately in an ion trapping device. Measurements are repeated by alternately applying and not applying a resonance frequency voltage while spectral data is obtained continuously. Data obtained in the absence of the resonance frequency voltage is used as reference data to correct the set data of a resonance condition. As a result, calibration can be made while taking into consideration the variations in the amount of ions that are introduced into the ion trap.

Abstract translation: 在离子捕获装置中精确校正离子共振条件。 通过在连续获得光谱数据的同时交替地施加并不施加共振频率电压来重复测量。 在没有谐振频率电压的情况下获得的数据被用作参考数据，以校正谐振条件的设定数据。 结果，可以考虑到引入到离子阱中的离子量的变化来进行校准。

公开(公告)号：US20110248157A1

公开(公告)日：2011-10-13

申请号：US13123901

申请日：2009-10-13

Applicant: Masuyuki Sugiyama ,  Yuichiro Hashimoto ,  Hideki Hasegawa ,  Masuyoshi Yamada ,  Hiroyuki Yasuda ,  Shinji Nagai ,  Shintaro Kubo ,  Takefumi Yokokura

Inventor： Masuyuki Sugiyama ,  Yuichiro Hashimoto ,  Hideki Hasegawa ,  Masuyoshi Yamada ,  Hiroyuki Yasuda ,  Shinji Nagai ,  Shintaro Kubo ,  Takefumi Yokokura

IPC: H01J49/42

CPC classification number: H01J49/063 ,  H01J49/4215

Abstract: Objects of the present invention is to provide a quadrupole mass filter that can be fabricated at low cost and has a high transmission efficiency even under a high pressure (0.5 mTorr or more), and to provide a mass spectrometer or mass spectrometry method that reduces crosstalk in a wide mass range. Now, in a mass spectrometer, an ion separating unit is configured to include quadrupole rod electrodes that form a quadrupole radio-frequency electric field, electrodes that form a quadrupole electrostatic field, and a power supply that allows the voltage of the electrodes to form a quadrupole electrostatic field to change. In a collision cell configured to perform collision induced dissociation, harmonic potentials in a plurality of stages are produced to resonance excite ions in the axial direction, so that the ions obtain kinetic energy to move in the direction of the detector. This energy allows a time period to shorten for which ions stay in the collision cell.

Abstract translation: 本发明的目的是提供一种即使在高压（0.5mTorr以上）下也能低成本制造且具有高透射率的四极质量过滤器，并提供降低串扰的质谱仪或质谱法 在广泛的质量范围。 现在，在质谱仪中，离子分离单元被构造为包括形成四极射频电场的四极杆电极，形成四极静电场的电极和允许电极的电压形成的电源 四极静电场改变。 在被配置为执行碰撞诱导解离的碰撞单元中，产生多个级中的谐波电位以使轴向上的激发离子共振，使得离子获得沿检测器的方向移动的动能。 该能量允许缩短时间段，离子停留在碰撞池中。

公开(公告)号：US08008124B2

公开(公告)日：2011-08-30

申请号：US12526265

申请日：2008-02-26

Applicant: Hiroyuki Yasuda

Inventor： Hiroyuki Yasuda

IPC: H01L21/00

CPC classification number: H01L21/6836 ,  C08L33/06 ,  C08L2666/02 ,  C09J7/10 ,  C09J133/06 ,  C09J133/08 ,  C09J2201/602 ,  C09J2203/326 ,  C09J2433/00 ,  C09J2461/00 ,  H01L23/293 ,  H01L23/3128 ,  H01L24/27 ,  H01L24/29 ,  H01L24/48 ,  H01L24/73 ,  H01L24/83 ,  H01L24/85 ,  H01L25/0657 ,  H01L2221/68327 ,  H01L2224/274 ,  H01L2224/27436 ,  H01L2224/29 ,  H01L2224/29101 ,  H01L2224/2919 ,  H01L2224/29198 ,  H01L2224/2929 ,  H01L2224/29339 ,  H01L2224/29386 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/73265 ,  H01L2224/83191 ,  H01L2224/83385 ,  H01L2224/8388 ,  H01L2224/85 ,  H01L2225/06562 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/01004 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/0101 ,  H01L2924/01013 ,  H01L2924/01019 ,  H01L2924/01027 ,  H01L2924/01033 ,  H01L2924/01045 ,  H01L2924/01047 ,  H01L2924/01058 ,  H01L2924/01059 ,  H01L2924/01072 ,  H01L2924/01077 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/0665 ,  H01L2924/07802 ,  H01L2924/10253 ,  H01L2924/12044 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/20105 ,  H01L2924/30105 ,  H01L2924/00 ,  H01L2924/3512 ,  H01L2924/00012 ,  H01L2924/05432 ,  H01L2924/05442 ,  H01L2924/05341 ,  H01L2224/29099 ,  H01L2224/29199 ,  H01L2224/29299 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

Abstract: An adhesive film for a semiconductor containing an (A) ester (meth)acrylate copolymer and a (B) thermoplastic resin other than the ester (meth)acrylate copolymer, and composed so as to satisfy the following formula (1) for two hours from 10 minutes after starting measurement, in which γ represents an amount of shearing strain produced upon undergoing a shearing stress of 3000 Pa at a frequency of 1 Hz and a temperature of 175° C. on parallel plates of 20 mm in diameter, exhibits superior filling performance in surface unevenness of a substrate through an encapsulating material sealing process, despite that semiconductor chips are stacked in multiple layers in the semiconductor device and hence a wire bonding process imposes a longer thermal history. 0.10≦γ≦0.30  (1)

Abstract translation: 一种含有（A）（甲基）丙烯酸酯共聚物和（B）热塑性树脂的除了（甲基）丙烯酸酯共聚物之外的半导体的粘合剂薄膜，由下式（1）组成，满足下式（1） 开始测量后10分钟，其中γ表示在直径为20mm的平行板上以1Hz的频率和175℃的剪切应力在3000Pa下产生的剪切应变的量，表现出优异的填充 尽管半导体芯片在半导体器件中堆叠成多层，因此引线接合工艺施加了更长的热历史，但是通过封装材料密封工艺在基板的表面不均匀性方面。 0.10＆nlE;γ＆nlE; 0.30（1）

公开(公告)号：US07855692B2

公开(公告)日：2010-12-21

申请号：US11905985

申请日：2007-10-05

Applicant: Shinya Koboyashi ,  Kanemi Sasaki ,  Hiroyuki Yasuda ,  Koji Moriya

Inventor： Shinya Koboyashi ,  Kanemi Sasaki ,  Hiroyuki Yasuda ,  Koji Moriya

IPC: H01Q3/04

CPC classification number: H01Q3/08 ,  H01Q1/125 ,  H01Q3/04

Abstract: There is disclosed a method of aligning an azimuth of an antenna by use of an antenna azimuth aligning instrument capable of economically and precisely aligning the azimuth in a case where a direction of a main beam of a directional antenna is matched with a counter antenna. There is provided a method of aligning the azimuth of the directional antenna by use of the antenna azimuth aligning instrument to be attached to the antenna for use in radio communication, the azimuth aligning instrument includes an aiming hole whose central axis is constituted in parallel with a main beam azimuth of the antenna and in which a diameter of an opening 2C on an operator's viewing side is set to be larger than that of an opening 2B on a target side, and the azimuth of the antenna is aligned using the centers of the two openings of the aiming hole as aims for a target.

Abstract translation: 公开了在定向天线的主波束的方向与对位天线匹配的情况下，通过使用能够经济地且精确地对准方位角的天线方位对准仪来对准天线的方位角的方法。 提供了一种通过使用要连接到用于无线电通信的天线的天线方位角对准仪来对准定向天线的方位角的方法，所述方位对准仪包括瞄准孔，其中心轴与 天线的主波束方位角，其中操作者视野侧的开口2C的直径被设定为大于目标侧的开口2B的直径，并且使用两者的中心对准天线的方位角 瞄准孔的开口作为目标的目标。