公开(公告)号：US11630442B2

公开(公告)日：2023-04-18

申请号：US16550285

申请日：2019-08-26

Applicant: Yokogawa Electric Corporation ,  Shikaden Corporation

Inventor： Ryouhei Furihata ,  Yusuke Yokota ,  Takahiro Kinoshita ,  Toshiaki Kase

IPC: G05B19/418 ,  G06F16/25 ,  G06F16/20 ,  G06F11/07 ,  G06F11/32 ,  G12B13/00

Abstract: To effectively utilize work information acquired by maintenance of an instrument in a plant, an apparatus is provided, which includes an acquisition unit that acquires work information about at least one of a calibration or an adjustment performed on the instrument in a plant; an extraction unit that extracts a plurality of data elements to be included in output information having a predetermined output format from the work information; and a generation unit that generates the output information from the plurality of data elements.

公开(公告)号：US11475977B2

公开(公告)日：2022-10-18

申请号：US15832354

申请日：2017-12-05

Applicant: John Bean Technologies Corporation

Inventor： George R. Blaine

IPC: G12B13/00 ,  B26D5/00 ,  B26F3/00 ,  B26D7/06

Abstract: The calibrating system 100 includes a conveyance system 102 for carrying work products 104 arranged in multiple lanes extending along the conveyor to be trimmed and/or cut into portions P. A scanner 110 scans the work product and a cutter system 120 consisting of one or more cutters are arranged in an array or series of cutter assemblies for cutting the work products into end pieces P of desired sizes or other physical parameters. A processor/computer 150, using a scanning program or portioning program, determines how the work product may be portioned into one or more end piece product sets. The processor/computer using the portioning software then functions as a controller to control the cutter system 120 to portion the workpiece 104 according to the selected end product/pieces P.

公开(公告)号：US11029754B2

公开(公告)日：2021-06-08

申请号：US15936865

申请日：2018-03-27

Applicant: ALPS ALPINE CO., LTD.

Inventor： Yukimitsu Yamada

IPC: G06F3/01 ,  A61B5/11 ,  H04N5/232 ,  A61B5/00 ,  G02B27/00 ,  H04N13/344 ,  A61B5/24 ,  G12B13/00 ,  G02B27/01

Abstract: A tilt adjusting image including a captured image that is obtained by capturing a wearer wearing a spectacle-type electronic device, and a horizontal line image indicating a horizontal direction identified by a tilt identification part, is displayed. The wearer adjusts a position of the spectacle-type electronic device by a wearer's hand or the like while viewing the tilt adjusting image so that the spectacle-type electronic device becomes horizontal. When the wearer judges that the spectacle-type electronic device has become horizontal, the wearer operates an operation part and inputs a calibration instruction. When the calibration instruction is input, the calibration instruction is transmitted to the spectacle-type electronic device.

公开(公告)号：US09865438B2

公开(公告)日：2018-01-09

申请号：US13188866

申请日：2011-07-22

Applicant: Sairaju Tallavarjula ,  Kailash Pradhan ,  Huy Q. Nguyen ,  Jian Li

Inventor： Sairaju Tallavarjula ,  Kailash Pradhan ,  Huy Q. Nguyen ,  Jian Li

IPC: G12B13/00 ,  H01J37/32 ,  G01J3/28 ,  G01J3/443 ,  G01N21/27 ,  G01N21/66

CPC classification number: H01J37/32972 ,  G01J3/28 ,  G01J3/443 ,  G01N21/274 ,  G01N21/66 ,  H01J37/32935 ,  H01J2237/2482

Abstract: Methods for matching semiconductor processing chambers using a calibrated spectrometer are disclosed. In one embodiment, plasma attributes are measured for a process in a reference chamber and a process in an aged chamber. Using a calibrated light source, an optical path equivalent to an optical path in a reference chamber and an optical path in an aged chamber can be compared by determining a correction factor. The correction factor is applied to adjust a measured intensity of plasma radiation through the optical path in the aged chamber. Comparing a measured intensity of plasma radiation in the reference chamber and the adjusted measured intensity in the aged chamber provide an indication of changed chamber conditions. A magnitude of change between the two intensities can be used to adjust the process parameters to yield a processed substrate from the aged chamber which matches that of the reference chamber.

公开(公告)号：US09049387B2

公开(公告)日：2015-06-02

申请号：US13751605

申请日：2013-01-28

Applicant: National Taiwan University ,  Himax Technologies Limited

Inventor： Chen-Tai Kao ,  Tai-Hsiang Huang ,  Homer H. Chen ,  Ling-Hsiu Huang

IPC: G03B21/00 ,  H04N17/00 ,  G01D18/00 ,  G12B13/00 ,  H04N9/31 ,  G03B21/56 ,  G03B21/14 ,  H04N9/77 ,  H04N13/04 ,  G06K9/46 ,  G03B17/54

CPC classification number: H04N9/3185 ,  G03B17/54 ,  G03B21/145 ,  G03B21/56 ,  G06K9/4661 ,  H04N9/31 ,  H04N9/3182 ,  H04N9/3194 ,  H04N9/77 ,  H04N13/327 ,  H04N13/363 ,  H04N17/00

Abstract: A method of generating view-dependent compensated images is disclosed. A uniform image is projected on a reflective screen, resulting in a first captured image. The distribution of specular highlight is predicted according to the first captured image, thereby obtaining model parameters. Calibration images are estimated according to the model parameters and a viewing angle, and a compensated image is generated according to the calibration images at the viewing angle.

Abstract translation: 公开了一种产生依赖于视图的补偿图像的方法。 将均匀的图像投影在反射屏幕上，产生第一捕获图像。 根据第一次拍摄图像预测镜面高光的分布，从而获得模型参数。 根据模型参数和视角来估计校准图像，并且根据视角处的校准图像生成补偿图像。

公开(公告)号：US08963070B2

公开(公告)日：2015-02-24

申请号：US14110013

申请日：2012-04-03

Applicant: Junichi Okada ,  Kouichi Kobayashi ,  Fumitaka Kume

Inventor： Junichi Okada ,  Kouichi Kobayashi ,  Fumitaka Kume

IPC: G01D18/00 ,  G12B13/00 ,  G01J3/42 ,  G01N21/3563 ,  G01N21/27

CPC classification number: G01J3/42 ,  G01N21/274 ,  G01N21/3563

Abstract: The present invention provides a method for making it possible to easily and simply measure approximate concentration of substitutional carbon impurities in a desired position in a polycrystalline silicon rod. A polycrystalline silicon plate is sliced out from a polycrystalline silicon rod and both surfaces of the polycrystalline silicon plate are mirror-polished to reduce the polycrystalline silicon plate to thickness of 2.12±0.01 mm. A calibration curve is created according to an infrared absorption spectroscopy and on the basis of a standard measurement method using a single crystal silicon standard sample having known substitutional carbon concentration and thickness of 2.00±0.01 mm, an infrared absorption spectrum in a frequency domain including an absorption zone peak of substitutional carbon of the polycrystalline silicon plate after the mirror polishing is calculated under conditions same as conditions during the calibration curve creation, and substitutional carbon concentration is calculated without performing thickness correction.

Abstract translation: 本发明提供了一种使得可以容易且简单地测量多晶硅棒中期望位置中的取代碳杂质的近似浓度的方法。 将多晶硅板从多晶硅棒切出，并将多晶硅板的两个表面进行镜面抛光以将多晶硅板的厚度减小到2.12±0.01mm。 根据红外吸收光谱法和基于使用具有已知的取代碳浓度和厚度为2.00±0.01mm的单晶硅标准样品的标准测量方法产生校准曲线，在频域中的红外吸收光谱包括 在与校准曲线生成期间的条件相同的条件下计算镜面抛光后的多晶硅板的取代碳的吸收峰的峰值，并且计算替代碳浓度而不进行厚度校正。

公开(公告)号：US08800349B2

公开(公告)日：2014-08-12

申请号：US13125442

申请日：2009-11-27

Applicant: Jean-Michel Caron

Inventor： Jean-Michel Caron

IPC: G12B13/00

CPC classification number: G01C19/56 ,  G01C25/005

Abstract: In a gyroscopic system comprising at least four vibratory gyroscopes, a first measurement is provided by said vibratory gyroscope to be calibrated, and a second measurement is provided by a combination of the measurements from the other vibratory gyroscopes of the system. At the level of the vibratory gyroscope to be calibrated, an initial command is applied in order to command a change in position from a first vibration position (θ1) to a second vibration position (θ2). A calibrated scale factor value of the vibratory gyroscope to be calibrated is then determined on the basis of a calculated value in relation to the change in position, based on the period of time during which the initial command is applied, the initial command, an angular difference between the first and second vibration positions measured according to the first measurement and an angular difference between the first and second vibration positions measured according to the second measurement.

Abstract translation: 在包括至少四个振动陀螺仪的陀螺仪系统中，由要校准的所述振动陀螺仪提供第一测量，并且通过来自系统的其它振动陀螺仪的测量的组合来提供第二测量。 在要校准的振动陀螺仪的水平面上，施加初始命令，以便指令从第一振动位置（＆amp; t; 1）到第二振动位置（＆amp; thetas; 2）的位置变化。 然后基于相对于位置变化的计算值，基于施加初始命令的时间周期，初始命令，角度，角度来确定待校准的振动陀螺仪的校准比例因子值 根据第一测量测量的第一和第二振动位置之间的差异以及根据第二测量测量的第一和第二振动位置之间的角度差。

公开(公告)号：US08746035B2

公开(公告)日：2014-06-10

申请号：US13114852

申请日：2011-05-24

Applicant: Andy Peczalski

Inventor： Andy Peczalski

IPC: G01M1/16 ,  G12B13/00

CPC classification number: G01H3/005

Abstract: An antenna in a radar sensor is vibrated at a known frequency and velocity in a direction generally normal to the antenna surface. A response received by the antenna is used to scale or calibrate sensor responses at frequencies of interest.

Abstract translation: 雷达传感器中的天线以与天线表面大致垂直的方向以已知的频率和速度振动。 由天线接收的响应用于在感兴趣的频率上缩放或校准传感器响应。

公开(公告)号：US08716652B2

公开(公告)日：2014-05-06

申请号：US13561690

申请日：2012-07-30

Applicant: Thilo Hannemann ,  Steffen Kappler ,  Edgar Kraft ,  Daniel Niederlöhner

Inventor： Thilo Hannemann ,  Steffen Kappler ,  Edgar Kraft ,  Daniel Niederlöhner

IPC: G01D18/00 ,  G12B13/00 ,  G01T7/00 ,  A61B6/00

CPC classification number: G01T7/005 ,  A61B6/583 ,  A61B6/585 ,  G01T1/17 ,  G01T1/40

Abstract: A method is disclosed for homogenization of threshold values of a multichannel, quanta-counting radiation detector. In an embodiment of the method empty measurements are carried out with the detector at different spectral compositions of the radiation with different settings of threshold values of the comparators. For each channel of which the comparators is to be set to the same energy threshold, an adapted threshold value is determined for this energy threshold from the empty measurement, at which a variation of the normalized count rate of the channel is minimized over the different spectral compositions of the radiation. This avoids problems in the further processing of the measurement data of the detector, which can occur during alterations of the spectrum.

Abstract translation: 公开了一种用于均衡多通道量子计数辐射检测器的阈值的方法。 在该方法的实施例中，利用不同比较器阈值设置的辐射的不同光谱组成的检测器进行空测量。 对于其中将比较器设置为相同能量阈值的每个通道，从空的测量中确定适用于该能量阈值的阈值，在该测量中，通道的归一化计数率的变化在不同频谱上被最小化 辐射的组成。 这样可以避免进一步处理检测器的测量数据的问题，这可能在频谱变化期间发生。

公开(公告)号：US08596107B1

公开(公告)日：2013-12-03

申请号：US12750472

申请日：2010-03-30

Applicant: Wipawan Wongdao ,  Yongyut Wongbunnak

Inventor： Wipawan Wongdao ,  Yongyut Wongbunnak

IPC: G12B13/00

CPC classification number: G12B13/00

Abstract: A correlation standard for calibrating a scanning electron microscope is provided. The correlation standard comprises a pellet and a metal stub. The pellet comprises a compressed mixture of carbon powder and alumina powder. The pellet is attached to the metal stub with a conductive adhesive.

Abstract translation: 提供了用于校准扫描电子显微镜的相关标准。 相关标准包括丸粒和金属根。 颗粒包括碳粉和氧化铝粉末的压缩混合物。 颗粒用导电粘合剂附接到金属短截线。