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公开(公告)号:US20240071040A1
公开(公告)日:2024-02-29
申请号:US18503554
申请日:2023-11-07
申请人: FEI Company
发明人: Thomas Gary Miller , John F. Flanagan, IV , Brian Routh, JR. , Richard Young , Brad Larson , Aditee Shrotre
IPC分类号: G06V10/44 , G06F18/21 , G06F18/2115 , G06F18/24 , G06T7/00 , G06V10/764 , H01L21/263 , H01L21/268 , H01L21/66
CPC分类号: G06V10/454 , G06F18/2115 , G06F18/2163 , G06F18/24 , G06T7/0004 , G06V10/764 , H01L21/2633 , H01L21/2686 , H01L22/26 , G06T2207/10056 , G06T2207/20081 , G06T2207/20084 , G06T2207/30148 , G06V2201/06
摘要: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
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公开(公告)号:US11355313B2
公开(公告)日:2022-06-07
申请号:US16917727
申请日:2020-06-30
申请人: FEI Company
发明人: Brian Routh, Jr. , Brad Larson , Aditee Shrotre , Oleg Sidorov
IPC分类号: H01J37/30 , H01J37/31 , G01N23/2251
摘要: Apparatuses and methods directed toward endpoint detection are disclosed herein. An example method at least includes forming a plurality of lines on a top surface of a sample; removing, a plurality of times, material from a working surface of the sample, the working surface different than the top surface; imaging, a plurality of times, the sample to at least capture the plurality of lines; and determining an endpoint based on a relative spatial characteristic between two or more lines of the plurality of lines.
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公开(公告)号:US20210374467A1
公开(公告)日:2021-12-02
申请号:US16888337
申请日:2020-05-29
申请人: FEI Company
发明人: Derek Higgins , Brad Larson
IPC分类号: G06K9/62 , G06F3/0482 , G06F3/0484 , G06N20/00
摘要: Methods and systems for allowing users operators to quickly and easily (i) review the products of machine learning algorithm(s) to evaluate their accuracy, (ii) make corrections to such products, and (iii) compile feedback for retraining the algorithm(s) are disclosed. An example method includes acquiring a plurality of correlated images of a sample, determining one or more features in each image of the plurality of correlated images, and then determining a relationship between at least a first feature in a first image of the plurality of correlated images and at least a second feature in a second image of the plurality of images. Then, when characteristic information is determined about the first feature, it is associated with both the first feature in the first image and the second feature in the second image based on the relationship
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公开(公告)号:US11847813B2
公开(公告)日:2023-12-19
申请号:US17499603
申请日:2021-10-12
申请人: FEI Company
发明人: Thomas Gary Miller , John F. Flanagan, IV , Brian Routh, Jr. , Richard Young , Brad Larson , Aditee Shrotre
IPC分类号: G06N3/00 , G06N20/00 , G06T7/00 , G06V10/764 , G06V10/44 , H01L21/66 , H01L21/268 , H01L21/263 , G06F18/24 , G06F18/2115 , G06F18/21
CPC分类号: G06V10/454 , G06F18/2115 , G06F18/2163 , G06F18/24 , G06T7/0004 , G06V10/764 , H01L21/2633 , H01L21/2686 , H01L22/26 , G06T2207/10056 , G06T2207/20081 , G06T2207/20084 , G06T2207/30148 , G06V2201/06
摘要: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
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公开(公告)号:US11569056B2
公开(公告)日:2023-01-31
申请号:US16667506
申请日:2019-10-29
申请人: FEI Company
发明人: Brad Larson , John Flanagan , Maurice Peemen
IPC分类号: H01J37/22 , G06T7/00 , H01J37/28 , G01N21/956 , H04N19/149
摘要: Methods and apparatuses are disclosed herein for parameter estimation for metrology. An example method at least includes optimizing, using a parameter estimation network, a parameter set to fit a feature in an image based on one or more models of the feature, the parameter set defining the one or more models, and providing metrology data of the feature in the image based on the optimized parameter set.
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公开(公告)号:US20210088770A1
公开(公告)日:2021-03-25
申请号:US16580957
申请日:2019-09-24
申请人: FEI Company
发明人: John Flanagan , Brad Larson , Thomas Miller
摘要: Methods and systems for implementing artificial intelligence to determine the pose of a sample within a microscope system and aligning said sample are disclosed. An example method includes receiving an image of the sample in the microscope apparatus, accessing a template associated with the sample. The template describes a plurality of template key points of the template version of the sample. A plurality of key points on the sample are then determined, where each of the key points on the sample corresponds to a corresponding template key point of a sample template, and the key points are subsequently used to determine a transformation between the sample as depicted in the image and the template version of the sample as described in the template. The transformation can then be used to automate the alignment of the sample within the microscope.
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公开(公告)号:US20200279362A1
公开(公告)日:2020-09-03
申请号:US16409477
申请日:2019-05-10
申请人: FEI Company
发明人: Thomas Gary Miller , John F. Flanagan, IV , Brian Routh, JR. , Richard Young , Brad Larson , Aditee Shrotre
IPC分类号: G06T7/00 , G06K9/62 , H01L21/66 , H01L21/263 , H01L21/268
摘要: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
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公开(公告)号:US20220067915A1
公开(公告)日:2022-03-03
申请号:US17499603
申请日:2021-10-12
申请人: FEI Company
发明人: Thomas Gary Miller , John F. Flanagan, IV , Brian Routh, JR. , Richard Young , Brad Larson , Aditee Shrotre
IPC分类号: G06T7/00 , G06K9/62 , H01L21/263 , H01L21/66 , H01L21/268
摘要: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
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公开(公告)号:US20210407765A1
公开(公告)日:2021-12-30
申请号:US16917727
申请日:2020-06-30
申请人: FEI Company
发明人: Brian Routh, JR. , Brad Larson , Aditee Shrotre , Oleg Sidorov
IPC分类号: H01J37/30 , H01J37/31 , G01N23/2251
摘要: Apparatuses and methods directed toward endpoint detection are disclosed herein. An example method at least includes forming a plurality of lines on a top surface of a sample; removing, a plurality of times, material from a working surface of the sample, the working surface different than the top surface; imaging, a plurality of times, the sample to at least capture the plurality of lines; and determining an endpoint based on a relative spatial characteristic between two or more lines of the plurality of lines.
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公开(公告)号:US11176656B2
公开(公告)日:2021-11-16
申请号:US16409477
申请日:2019-05-10
申请人: FEI Company
发明人: Thomas Gary Miller , John F. Flanagan, IV , Brian Routh, Jr. , Richard Young , Brad Larson , Aditee Shrotre
IPC分类号: G06T7/00 , G06K9/62 , H01L21/26 , C23F1/04 , G06N3/04 , G06N20/00 , H01L21/66 , H01L21/268 , H01L21/263
摘要: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
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