Lamp Housing Braze Improvement for Semiconductor Rapid Thermal Processing (RTP) Chamber

    公开(公告)号:US20240306262A1

    公开(公告)日:2024-09-12

    申请号:US18222979

    申请日:2023-07-17

    CPC classification number: H05B3/0047 B23K1/19 H05B3/02

    Abstract: Embodiments of lamp housings for a process chamber are provided herein. In some embodiments, a lamp housing for a process chamber includes: a first plate having a plurality of first openings; a copper plate having a plurality of second openings; a plurality of tubes brazed via a braze alloy to the first plate at first ends of the plurality of tubes and brazed to the copper plate via the braze alloy at second ends of the plurality of tubes, wherein the plurality of tubes have central openings that are aligned with the plurality of first openings and the plurality of second openings, and wherein the braze alloy comprises a nickel containing alloy or a copper containing alloy, wherein the copper containing alloy does not include gold; and an annular jacket circumscribing the plurality of tubes and brazed to the first plate via the braze alloy.

    Integrated Pressure Sensor for Process Chamber Assemblies

    公开(公告)号:US20240410773A1

    公开(公告)日:2024-12-12

    申请号:US18208010

    申请日:2023-06-09

    Abstract: Methods and apparatus provide in-situ pressure sensors for apparatus used in semiconductor manufacturing processes. In some embodiments, the apparatus may comprise a showerhead body, a first gas channel of the showerhead body, a second gas channel of the showerhead body, one or more first gas pressure sensors positioned on a surface of the first gas channel, and one or more second gas pressure sensors positioned on a surface of the second gas channel. The apparatus may be formed by additive manufacturing including the pressure sensors and electrical connections to the pressure sensors. In some embodiments, a controller may be utilized to control semiconductor processes based on the pressure readings from the in-situ pressure sensors.

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