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公开(公告)号:US11309222B2
公开(公告)日:2022-04-19
申请号:US16556105
申请日:2019-08-29
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Lei Fu , Milind S. Bhagavat , Chia-Hao Cheng
IPC: H01L21/66 , H01L21/768 , H01L23/00
Abstract: Various semiconductor chips with solder capped probe test pads are disclosed. In accordance with one aspect of the present invention, a semiconductor chip is provided that includes a substrate, plural input/output (I/O) structures on the substrate and plural test pads on the substrate. Each of the test pads includes a first conductor pad and a first solder cap on the first conductor pad.
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公开(公告)号:US20210296194A1
公开(公告)日:2021-09-23
申请号:US16822353
申请日:2020-03-18
Applicant: ADVANCED MICRO DEVICES, INC
Inventor: Priyal Shah , Rahul Agarwal , Milind S. Bhagavat , Chia-Hao Cheng
IPC: H01L23/31 , H01L23/498 , H01L25/065 , H01L25/00 , H01L21/56 , H01L21/304 , H01L23/00
Abstract: Various molded semiconductor chip packages are disclosed. In one aspect, a semiconductor chip package includes a routing substrate and a semiconductor chip mounted on and electrically connected to the routing substrate. The semiconductor chip has plural side surfaces. A molding layer at least partially encases the semiconductor chip. The molding layer has a tread and a riser, the riser abutting at least some of the side surfaces.
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公开(公告)号:US12183675B2
公开(公告)日:2024-12-31
申请号:US16351728
申请日:2019-03-13
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Rahul Agarwal , Chia-Hao Cheng , Milind S. Bhagavat
IPC: H01L23/528 , H01L21/56 , H01L23/00 , H01L23/31 , H01L23/522 , H01L25/065
Abstract: Various molded fan-out semiconductor chip devices are disclosed. In one aspect, a semiconductor chip device is provided that includes a first molding layer that has internal conductor structures, a redistribution layer (RDL) structure positioned on the first molding layer and electrically connected to the internal conductor structures, a semiconductor chip positioned on and electrically connected to the RDL structure, and a second molding layer positioned on the RDL structure and at least partially encapsulating the semiconductor chip.
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公开(公告)号:US20210066144A1
公开(公告)日:2021-03-04
申请号:US16556105
申请日:2019-08-29
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Lei Fu , Milind S. Bhagavat , Chia-Hao Cheng
IPC: H01L21/66 , H01L23/00 , H01L21/768
Abstract: Various semiconductor chips with solder capped probe test pads are disclosed. In accordance with one aspect of the present invention, a semiconductor chip is provided that includes a substrate, plural input/output (I/O) structures on the substrate and plural test pads on the substrate. Each of the test pads includes a first conductor pad and a first solder cap on the first conductor pad.
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公开(公告)号:US11742301B2
公开(公告)日:2023-08-29
申请号:US16544021
申请日:2019-08-19
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Rahul Agarwal , Milind S. Bhagavat , Priyal Shah , Chia-Hao Cheng , Brett P. Wilkerson , Lei Fu
IPC: H01L23/00 , H01L23/31 , H01L23/538 , H01L21/48 , H01L21/56
CPC classification number: H01L23/562 , H01L21/4853 , H01L21/4857 , H01L21/565 , H01L23/3128 , H01L23/5381 , H01L23/5383 , H01L23/5386 , H01L23/5389 , H01L24/19 , H01L24/20 , H01L2224/214 , H01L2924/3511 , H01L2924/35121
Abstract: Various semiconductor chip packages are disclosed. In one aspect, a semiconductor chip package is provided that includes a fan-out redistribution layer (RDL) structure that has plural stacked polymer layers, plural metallization layers, plural conductive vias interconnecting adjacent metallization layers of the metallization layers, and plural rivets configured to resist delamination of one or more of the polymer layers. Each of the plural rivets includes a first head, a second head and a shank connected between the first head and the second head. The first head is part of one of the metallization layers. The shank includes at least one of the conductive vias and at least one part of another of the metallization layers.
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公开(公告)号:US11715691B2
公开(公告)日:2023-08-01
申请号:US17323454
申请日:2021-05-18
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Milind S. Bhagavat , Rahul Agarwal , Chia-Hao Cheng
IPC: H01L23/52 , H01L23/528 , H01L23/31 , H01L23/522 , H01L23/00 , H01L21/56 , H01L25/065
CPC classification number: H01L23/5283 , H01L21/566 , H01L23/3128 , H01L23/5227 , H01L24/09 , H01L24/17 , H01L25/0655 , H01L2224/0231 , H01L2224/02373 , H01L2224/02379 , H01L2224/02381 , H01L2224/0401 , H01L2924/1206 , H01L2924/1427
Abstract: Various semiconductor chip devices and methods of making the same are disclosed. In one aspect, an apparatus is provided that includes a first redistribution layer (RDL) structure having a first plurality of conductor traces, a first molding layer on the first RDL structure, plural conductive pillars in the first molding layer, each of the conductive pillars including a first end and a second end, a second RDL structure on the first molding layer, the second RDL structure having a second plurality of conductor traces, and wherein some of the conductive pillars are electrically connected between some of the first plurality of conductor traces and some of the second plurality of conductor traces to provide a first inductor coil.
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公开(公告)号:US20230187364A1
公开(公告)日:2023-06-15
申请号:US17644191
申请日:2021-12-14
Applicant: Advanced Micro Devices, Inc.
Inventor: Chia-Hao Cheng , Kong Toon Ng , Rahul Agarwal , Brett P. Wilkerson
IPC: H01L23/538 , H01L21/48
CPC classification number: H01L23/5384 , H01L21/486
Abstract: An embodiment of a semiconductor chip device can include a molding layer having a first side and a second side, an interconnect chip at least partially encased in the molding layer, the interconnect chip comprising a through substrate via (TSV) that extends through the interconnect chip, an insulating layer positioned on the first side of the molding layer, and a conductive structure that is positioned vertically below the interconnect chip and extends through the insulating layer, wherein the conductive structure is electrically coupled to the TSV.
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公开(公告)号:US11011466B2
公开(公告)日:2021-05-18
申请号:US16367731
申请日:2019-03-28
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Milind S. Bhagavat , Rahul Agarwal , Chia-Hao Cheng
IPC: H01L23/52 , H01L23/528 , H01L23/31 , H01L23/522 , H01L23/00 , H01L21/56 , H01L25/065
Abstract: Various semiconductor chip devices and methods of making the same are disclosed. In one aspect, an apparatus is provided that includes a first redistribution layer (RDL) structure having a first plurality of conductor traces, a first molding layer on the first RDL structure, plural conductive pillars in the first molding layer, each of the conductive pillars including a first end and a second end, a second RDL structure on the first molding layer, the second RDL structure having a second plurality of conductor traces, and wherein some of the conductive pillars are electrically connected between some of the first plurality of conductor traces and some of the second plurality of conductor traces to provide a first inductor coil.
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公开(公告)号:US20210057352A1
公开(公告)日:2021-02-25
申请号:US16544021
申请日:2019-08-19
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: Rahul Agarwal , Milind S. Bhagavat , Priyal Shah , Chia-Hao Cheng , Brett P. Wilkerson , Lei Fu
IPC: H01L23/00 , H01L23/31 , H01L23/538 , H01L21/48 , H01L21/56
Abstract: Various semiconductor chip packages are disclosed. In one aspect, a semiconductor chip package is provided that includes a fan-out redistribution layer (RDL) structure that has plural stacked polymer layers, plural metallization layers, plural conductive vias interconnecting adjacent metallization layers of the metallization layers, and plural rivets configured to resist delamination of one or more of the polymer layers. Each of the plural rivets includes a first head, a second head and a shank connected between the first head and the second head. The first head is part of one of the metallization layers. The shank includes at least one of the conductive vias and at least one part of another of the metallization layers.
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