公开(公告)号：US06982174B2

公开(公告)日：2006-01-03

申请号：US10344810

申请日：2001-08-15

Applicant: Dawn A. Bonnell ,  Rodolfo Antonio Alvarez ,  Sergei V. Kalinin

Inventor： Dawn A. Bonnell ,  Rodolfo Antonio Alvarez ,  Sergei V. Kalinin

IPC: H01L21/00 ,  H05K3/00

CPC classification number: B81B1/00 ,  B82B3/00 ,  G01Q80/00 ,  H01L51/0595 ,  Y10S977/722 ,  Y10S977/859 ,  Y10T29/49124

Abstract: A ferroelectric substrate (10) is patterned using local electric fields from an apparatus (14) to produce nanometer sized domains with controlled surface charge (12), that allow site selective metalization (22) and subsequent reaction with functional molecules (18), resulting in nanometer-scale molecular devices.

Abstract translation: 使用来自设备（14）的局部电场对铁电衬底（10）进行构图，以产生具有受控表面电荷（12）的纳米尺寸域，其允许位置选择性金属化（22）和随后与功能分子（18）反应，导致 在纳米级分子器件中。

公开(公告)号：US06873163B2

公开(公告)日：2005-03-29

申请号：US10052024

申请日：2002-01-18

Applicant: Dawn A. Bonnell ,  Sergei V. Kalinin ,  Rodolfo Antonio Alvarez

Inventor： Dawn A. Bonnell ,  Sergei V. Kalinin ,  Rodolfo Antonio Alvarez

IPC: G01Q60/54 ,  G01R1/07 ,  G01R33/038 ,  G01R31/26

CPC classification number: G01Q60/54 ,  G01R1/071 ,  G01R33/0385 ,  Y10S977/852

Abstract: A scanning probe detects phase changes of a cantilevered tip proximate to a sample, the oscillations of the cantilevered tip are induced by a lateral bias applied to the sample to quantify the local impedance of the interface normal to the surface of the sample. An ac voltage having a frequency is applied to the sample. The sample is placed at a fixed distance from the cantilevered tip and a phase angle of the cantilevered tip is measured. The position of the cantilevered tip is changed relative to the sample and another phase angle is measured. A phase shift of the deflection of the cantilevered tip is determined based on the phase angles. The impedance of the grain boundary, specifically interface capacitance and resistance, is calculated based on the phase shift and the frequency of the ac voltage. Magnetic properties are measured by applying a dc bias to the tip that cancels electrostatic forces, thereby providing direct measurement of magnetic forces.

Abstract translation: 扫描探针检测靠近样品的悬臂尖端的相变，悬臂尖端的振荡由施加到样品的横向偏压引起，以量化与样品表面垂直的界面的局部阻抗。 对样品施加具有频率的交流电压。 将样品放置在与悬臂尖一定距离处，并测量悬臂尖的相位角。 悬臂尖端的位置相对于样品而改变，另外测量相位角。 基于相位角确定悬臂尖端偏转的相移。 基于相移和交流电压的频率计算晶界的阻抗，特别是界面电容和电阻。 通过将直流偏压施加到尖端以消除静电力来测量磁性，从而提供对磁力的直接测量。

公开(公告)号：US07078896B2

公开(公告)日：2006-07-18

申请号：US11072914

申请日：2005-03-04

Applicant: Dawn A. Bonnell ,  Sergei V. Kalinin ,  Rodolfo Antonio Alvarez

Inventor： Dawn A. Bonnell ,  Sergei V. Kalinin ,  Rodolfo Antonio Alvarez

IPC: G01R33/02

CPC classification number: G01Q60/54 ,  G01R1/071 ,  G01R33/0385 ,  Y10S977/852

Abstract: A method for determining a magnetic force profile of a sample by using a cantilevered probe having a magnetic tip, the method comprising the steps of: traversing the tip along a predetermined path on the surface of the sample, the tip being proximate the surface of the sample while traversing along the predetermined path; determining the sample surface topography along the path; substantially canceling the sample surface potential along the path using the determined sample surface topography; and determining magnetic force data along the path based on the determined surface topography, wherein the determined magnetic force data is not magnetic force gradient data and the determined magnetic force data includes substantially no components from the sample surface potential.

Abstract translation: 一种用于通过使用具有磁头的悬臂式探针来确定样品的磁力分布的方法，所述方法包括以下步骤：沿着样品表面上的预定路径横穿所述尖端，所述尖端接近所述样品的表面 沿着预定路径移动的样品; 沿着路径确定样品表面形貌; 使用所确定的样品表面形貌基本上抵消沿着路径的样品表面电位; 以及基于所确定的表面形貌确定沿着路径的磁力数据，其中所确定的磁力数据不是磁力梯度数据，并且所确定的磁力数据基本上不包含来自样本表面电位的分量。