公开(公告)号：US10073057B2

公开(公告)日：2018-09-11

申请号：US15182457

申请日：2016-06-14

Applicant: Universidad de Santiago de Chile

Inventor： Francisco Esteban Melo Hurtado ,  Romina Waleska Muñoz Buzeta ,  Felipe Andrés Aguilar Sandoval

IPC: G01Q60/54 ,  G01N27/72 ,  G01Q60/42

CPC classification number: G01N27/72 ,  G01Q60/42 ,  G01Q60/54

Abstract: Micro magnetic trap comprising a holder and a sample cell on said holder (5); means for providing a controllable homogeneous magnetic field (3) surrounding the sample cell; a modified micro-cantilever comprising a cantilever (1) having dimensions in the micron range and at least three paramagnetic microbeads with a diameter from 1 to 3 microns (2) attached to a bendable tip of the micro-cantilever such that they form a triangular arrangement; means for measuring the deflection of the micro-cantilever when the latter is in use (4). The trap does not require a specific surface functionalization in order to ensure an appropriate and selective linkage to a particular molecule.

公开(公告)号：US20150323562A1

公开(公告)日：2015-11-12

申请号：US14347407

申请日：2012-09-25

Applicant: Akita University

Inventor： Hitoshi SAITO ,  Satoru YOSHIMURA

IPC: G01Q60/54 ,  G01Q30/04

CPC classification number: G01Q30/04 ,  G01Q60/54 ,  G01R33/0385

Abstract: A magnetic profile measuring device which scans on a surface of a specimen by a magnetized probe on a tip of a driven cantilever, detects vibration of the cantilever, and generates a magnetic field distribution image of the area, the device including: the cantilever having the probe equipped on tip thereof; a driver driving the cantilever; an alternating-current magnetic field generator periodically reversing the magnetic polarity of the probe; a vibration sensor detecting vibration of the probe; a demodulator demodulating from a detection signal of the vibration sensor a magnetic signal corresponding to an alternating magnetic force between the probe and the specimen; a scanning mechanism; a data storage storing an initial data for each coordinate of the scanning area; a modified data generator generating a plurality of data by modifying the phase of the initial data; and an image display device.

Abstract translation: 磁性剖面测量装置，其通过在驱动悬臂的尖端上的磁化探针在试样的表面上扫描，检测悬臂的振动，并产生该区域的磁场分布图像，该装置包括：悬臂具有 探针装在其顶端; 驾驶悬臂的司机 交流磁场发生器周期性地反转探针的磁极性; 检测探头的振动的振动传感器; 解调器，根据所述振动传感器的检测信号，对应于所述探针与所述试样之间的交变磁力的磁信号进行解调; 扫描机制; 存储扫描区域的每个坐标的初始数据的数据存储器; 修改的数据生成器，通过修改初始数据的相位来生成多个数据; 和图像显示装置。

公开(公告)号：US07543482B2

公开(公告)日：2009-06-09

申请号：US11710974

申请日：2007-02-27

Applicant: Masashi Kitazawa ,  Masaki Tanemura ,  Junya Tanaka ,  Tatsuhiko Okita

Inventor： Masashi Kitazawa ,  Masaki Tanemura ,  Junya Tanaka ,  Tatsuhiko Okita

IPC: G12B21/08 ,  B82B1/00

CPC classification number: G01Q70/12 ,  C12N15/89 ,  G01Q60/54 ,  Y10S977/86 ,  Y10S977/863 ,  Y10S977/875 ,  Y10S977/876 ,  Y10S977/879

Abstract: A carbon thin line probe having a carbon thin line selectively formed at a projection-like terminal end portion thereof by means of an irradiation of high-energy beam, the carbon thin line internally containing a metal. Thereby achieved is a carbon thin line probe suitable for example for the probe of SPM cantilever, which has a high aspect ratio and high durability and reliability, capability of batch processing based on a simple manufacturing method, and to which magnetic characteristic can be imparted.

Abstract translation: 一种碳细线探针，其具有通过高能束的照射在其突起状端部选择性地形成的碳细线，所述碳细线在内部含有金属。 由此实现了适用于例如SPM悬臂的探针的碳细线探针，其具有高纵横比和高耐久性和可靠性，基于简单制造方法的批处理能力，并且可赋予其磁特性。

公开(公告)号：US07462270B2

公开(公告)日：2008-12-09

申请号：US11800598

申请日：2007-05-07

Applicant: Michael J. Naughton

Inventor： Michael J. Naughton

IPC: C25D5/18

CPC classification number: G01Q60/08 ,  G01Q60/38 ,  G01Q60/50 ,  G01Q60/52 ,  G01Q60/54 ,  G01Q70/12 ,  G01R33/0385 ,  Y10T29/49002

Abstract: The various embodiments discloses a cantilever probe comprising a first electrode and a second electrode engaged to a substrate and a branched cantilever wherein the cantilever comprises a nanostruture. Furthermore, the probe comprises a first arm of the cantilever engaged to the first electrode and a second arm of the cantilever engaged to the second electrode. Additionally, the cantilever probe comprises an electrical circuit coupled to the cantilever wherein the electrical circuit is capable of measuring a change in piezoresistance of the cantilever resulting from an atomic force and/or a magnetic force applied to the cantilever. Additionally, the invention discloses a method of performing atomic force microscopy, magnetic force microscopy, or magnetic resonance force microscopy. The nanostructures may comprise carbon or non-carbon materials. Additionally, the nanostructures may include nanotubes, nanowire, nanofibers and various other types of nanostructures.

Abstract translation: 各种实施例公开了一种悬臂探头，其包括接合到基底的第一电极和第二电极以及分支悬臂，其中悬臂包括纳米级缝合物。 此外，探针包括接合到第一电极的悬臂的第一臂和与第二电极接合的悬臂的第二臂。 此外，悬臂探头包括耦合到悬臂的电路，其中电路能够测量由施加到悬臂的原子力和/或磁力产生的悬臂的压阻变化。 此外，本发明公开了一种执行原子力显微镜，磁力显微镜或磁共振力显微镜的方法。 纳米结构可以包括碳或非碳材料。 另外，纳米结构可以包括纳米管，纳米线，纳米纤维和各种其他类型的纳米结构。

公开(公告)号：US07398678B2

公开(公告)日：2008-07-15

申请号：US11145869

申请日：2005-06-06

Applicant: Yoshikazu Nakayama ,  Takashi Okawa ,  Shigenobu Yamanaka ,  Akio Harada ,  Masatoshi Yasutake ,  Yoshiharu Shirakawabe

Inventor： Yoshikazu Nakayama ,  Takashi Okawa ,  Shigenobu Yamanaka ,  Akio Harada ,  Masatoshi Yasutake ,  Yoshiharu Shirakawabe

IPC: G01B5/28

CPC classification number: G01Q60/04 ,  G01Q60/08 ,  G01Q60/16 ,  G01Q60/38 ,  G01Q60/54 ,  G01Q60/56 ,  G01Q70/12

Abstract: A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.

Abstract translation: 扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到 从而允许尖端用作检测信号的探针针端。 形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。 由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。 这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。

公开(公告)号：US07262597B2

公开(公告)日：2007-08-28

申请号：US10940717

申请日：2004-09-15

Applicant: Solomon I. Woods ,  Lee A. Knauss ,  Nesco M. Lettsome ,  Alfred B. Cawthorne ,  Thirumalai Venkatesan

Inventor： Solomon I. Woods ,  Lee A. Knauss ,  Nesco M. Lettsome ,  Alfred B. Cawthorne ,  Thirumalai Venkatesan

IPC: G01R33/035 ,  G01R33/12

CPC classification number: G01Q60/54 ,  G01Q70/02 ,  G01R33/0385 ,  Y10S505/845 ,  Y10S505/846

Abstract: A scanning microscope for high resolution current imaging by direct magnetic field sensing of a sample maintained in an ambient environment. The scanning microscope uses a magnetic sensor such as a SQUID and a fiber probe magnetically coupled between the SQUID sensor and the sample under study. The fiber probe has a sharply defined tip for high resolution probing and for reaching minute cavities on the surface of the sample. The coupling between the tip of the fiber probe and the sample is controlled by a distance control mechanism, in the range of 1-100 nm. The material of the fiber probe with high permeability and low magnetic noise is chosen to optimize flux transmission to the magnetic sensor. Magnetic coupling to the sensor is maximized by keeping the distance between the end of the fiber probe and the sensor to approximately 0-100 μm. The fiber probe is integrated into the fiber holder for easy replacement of the fiber probe.

Abstract translation: 一种扫描显微镜，用于通过直接磁场感测维持在周围环境中的样品进行高分辨率电流成像。 扫描显微镜使用诸如SQUID的磁传感器和磁耦合在SQUID传感器和正在研究的样品之间的光纤探针。 光纤探针具有尖锐的尖端，用于高分辨率探测，并且可以达到样品表面的微小空洞。 光纤探针的尖端与样品之间的耦合由距离控制机构控制，范围为1-100nm。 选择具有高磁导率和低磁噪声的光纤探头的材料，以优化磁传感器的磁通传递。 通过将光纤探针的端部与传感器之间的距离保持在大约0-100 mum，使传感器的磁耦合最大化。 光纤探头集成到光纤支架中，便于更换光纤探头。

公开(公告)号：US07170055B1

公开(公告)日：2007-01-30

申请号：US11206672

申请日：2005-08-18

Applicant: Zhifeng Deng ,  Erhan Yenilmez ,  Kathryn Moler

Inventor： Zhifeng Deng ,  Erhan Yenilmez ,  Kathryn Moler

IPC: G01B9/00 ,  G01N23/00

CPC classification number: G01N23/2251 ,  G01Q60/54 ,  G01Q70/12

Abstract: Nanotubes and nanotube-based devices are implemented in a variety of applications. According to an example embodiment of the present invention, nanotube tips are coated with metal. In some applications, the metal coating facilitates the resolution of nano-scale magnetic features, such as features smaller than about 20 nanometers. In another embodiment, such metal-coated nanotubes are implemented with magnetic force microscopy (MFM) applications and adapted for implementation with structures and arrangements exhibiting a high aspect ratio, facilitating quantitative analysis of MFM data.

Abstract translation: 纳米管和基于纳米管的器件可以在各种应用中实现。 根据本发明的示例性实施例，用金属涂覆纳米管尖端。 在一些应用中，金属涂层有助于纳米尺度磁特征的分辨率，例如小于约20纳米的特征。 在另一个实施方案中，这种金属涂覆的纳米管是用磁力显微镜（MFM）应用来实现的，并适用于实现具有高纵横比的结构和布置，有助于MFM数据的定量分析。

公开(公告)号：US20060150720A1

公开(公告)日：2006-07-13

申请号：US11145869

申请日：2005-06-06

Applicant: Yoshikazu Nakayama ,  Takashi Okawa ,  Shigenobu Yamanaka ,  Akio Harada ,  Masatoshi Yasutake ,  Yoshiharu Shirakawabe

Inventor： Yoshikazu Nakayama ,  Takashi Okawa ,  Shigenobu Yamanaka ,  Akio Harada ,  Masatoshi Yasutake ,  Yoshiharu Shirakawabe

IPC: G01B5/28

CPC classification number: G01Q60/04 ,  G01Q60/08 ,  G01Q60/16 ,  G01Q60/38 ,  G01Q60/54 ,  G01Q60/56 ,  G01Q70/12

Abstract: A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.

Abstract translation: 扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到 从而允许尖端用作检测信号的探针针端。 形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。 由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。 这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。

公开(公告)号：US07064341B2

公开(公告)日：2006-06-20

申请号：US10793531

申请日：2004-03-04

Applicant: Yoshikazu Nakayama ,  Akio Harada ,  Seiji Akita

Inventor： Yoshikazu Nakayama ,  Akio Harada ,  Seiji Akita

IPC: G21G5/00

CPC classification number: G01Q60/16 ,  G01Q60/38 ,  G01Q60/54 ,  G01Q70/12 ,  Y10S977/869 ,  Y10S977/873 ,  Y10S977/876

Abstract: The coated nanotube surface signal probe constructed from a nanotube, a holder which holds the nanotube, a coating film fastening a base end portion of the nanotube to a surface of the holder by way of adhering the base end portion on the surface of holder in a range of a base end portion length with an electric contact state and covering a specified region including the base end portion with the coating film maintaining the electric contact state between the nanotube and the holder, a tip end portion of the nanotube being caused to protrude from the holder; and the tip end portion is used as a probe needle so as to scan surface signals. The coated nanotube surface signal probe can be used as a probe in AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope) other SPM (Scanning Probe Microscope).

Abstract translation: 由纳米管构成的涂覆的纳米管表面信号探针，保持纳米管的保持器，通过将基座端部粘附在保持器的表面上的涂膜将纳米管的基端部固定在保持器的表面上 具有电接触状态的基端部长度的范围，并且覆盖包括基端部的规定区域，所述涂膜保持纳米管和保持器之间的电接触状态，使纳米管的前端部从 持有人 并且使用尖端部作为探针，以扫描表面信号。 涂覆的纳米管表面信号探针可用作AFM（原子力显微镜），STM（扫描隧道显微镜）其他SPM（扫描探针显微镜）中的探针。

公开(公告)号：US06984977B2

公开(公告)日：2006-01-10

申请号：US10416489

申请日：2001-09-14

Applicant: Fred Wellstood ,  Erin Fleet ,  Sojiphong Chatraphorn

Inventor： Fred Wellstood ,  Erin Fleet ,  Sojiphong Chatraphorn

IPC: G01R33/02

CPC classification number: G01R33/0385 ,  G01N27/82 ,  G01Q60/54

Abstract: A scanning SQUID microscope for acquiring spatially resolved images of physical properties of an object includes a SQUID sensor arranged in perpendicular to the plane of the object under investigation for detecting tangential component of the magnetic field generated by the object. During scanning of the SQUID sensor over the object under investigation, the position signal from a position interpreting unit, as well as relevant output signals from the SQUID sensor are processed by a processing unit which derives from the data, spatially resolved images of the physical properties of the object. The specific orientation of the SQUID sensor with respect to the plane of the object permits an enlarged area of the SQUID chip on which the modulation and feedback line can be fabricated in the same technological process with the SQUID sensor. Additionally, larger contact pads afforded provide for lower contact resistance and ease in forming contact with bias and read-out wires.

Abstract translation: 用于获取对象的物理性质的空间分辨图像的扫描SQUID显微镜包括垂直于所研究对象的平面布置的SQUID传感器，用于检测由对象产生的磁场的切向分量。 在扫描被测物体上扫描SQUID传感器之前，来自位置解释单元的位置信号以及来自SQUID传感器的相关输出信号由处理单元处理，该处理单元从数据中得出物理特性的空间分辨图像 的对象。 SQUID传感器相对于物体平面的具体方向允许在与SQUID传感器相同的工艺过程中可以在其上制造调制和反馈线的SQUID芯片的放大区域。 另外，提供较大的接触垫提供较低的接触电阻并且容易与偏压和读出导线形成接触。