公开(公告)号：US20240426869A1

公开(公告)日：2024-12-26

申请号：US18698671

申请日：2022-10-07

Applicant: INFINITESIMA LIMITED

Inventor： Andrew David Laver Humphris ,  John Patrick Hole ,  Matthew Tedaldi ,  Jamie Kayne Hobbs ,  Xinyue Chen

IPC: G01Q10/06 ,  G01Q20/00 ,  G01Q30/04 ,  G01Q40/00

Abstract: A method of measuring a sample with a probe including a cantilever mount, a cantilever extending from the cantilever mount to a free end, and a probe tip carried by the free end of the cantilever is disclosed. The method includes taking a series of measurements of a sidewall of the sample with the probe; and analysing the series of measurements to determine a characteristic of the sidewall. The measurements are taken during a measurement cycle that includes a pair of measurement drive phases. The measurement drive phases include first and second drive phases in which the probe is driven, respectively, down, then up, next to the sidewall. During one of the drive phases the probe tip interacts with the sidewall, and the series of measurements are taken by measuring an angle of the cantilever as the probe tip interacts with the sidewall during the one of the drive phases.

公开(公告)号：US20240418746A1

公开(公告)日：2024-12-19

申请号：US18696244

申请日：2022-03-24

Applicant: SHIMADZU CORPORATION

Inventor： Hiroshi ARAI ,  Hideo NAKAJIMA ,  Shiho MORIGUCHI ,  Chiharu NAKANO

IPC: G01Q30/04

Abstract: A scanning probe microscope is equipped with an observation device for observing a sample containing particles and an information processing device. The information processing device generates one or more observation images based on observation data acquired by observing a sample with the observation device, calculates a particle parameter indicating a diameter of a particle image or the number of the particle images, the particle image being included in the observation image, and executes predetermined processing when an observation image including an image in which the particle parameter is outside a predefined observation range is included in one or more observation images.

公开(公告)号：US20240230709A1

公开(公告)日：2024-07-11

申请号：US18616453

申请日：2024-03-26

Applicant: Carl Zeiss SMT GmbH

Inventor： Christof Baur ,  Florian Demski

IPC: G01Q30/04 ,  G01Q10/06

CPC classification number: G01Q30/04 ,  G01Q10/065

Abstract: The present invention relates to a device for operating at least one bending beam in at least one closed control loop, wherein the device has: (a) at least one first interface designed to receive at least one controlled variable of the at least one control loop; (b) at least one programmable logic circuit designed to process a control error of the at least one control loop using a bit depth greater than the bit depth of the controlled variable; and (c) at least one second interface designed to provide a manipulated variable of the at least one control loop.

公开(公告)号：US20240012022A1

公开(公告)日：2024-01-11

申请号：US18370923

申请日：2023-09-21

Applicant: Trustees of Tufts College

Inventor： Igor Sokolov ,  Milos Miljkovic

IPC: G01Q30/04

CPC classification number: G01Q30/04

Abstract: A method comprises using an atomic-force microscope, acquiring a set of images associated with surfaces, and, using a machine-learning algorithm applied to the images, classifying the surfaces. As a particular example, the classification can be done in a way that relies on surface parameters derived from the images rather than using the images directly.

公开(公告)号：US11796564B2

公开(公告)日：2023-10-24

申请号：US17980667

申请日：2022-11-04

Applicant: Trustees of Tufts College

Inventor： Igor Sokolov ,  Milos Miljkovic

IPC: G01Q30/04 ,  G06V20/69 ,  G01N33/49 ,  G01Q60/34 ,  G01Q60/42 ,  G01N33/493 ,  G01N33/574 ,  G06V10/764

CPC classification number: G01Q30/04 ,  G01N33/493 ,  G01N33/57488 ,  G01Q60/34 ,  G01Q60/42 ,  G06V10/764 ,  G06V20/698

Abstract: A method comprises using an atomic-force microscope, acquiring a set of images associated with surfaces, and, using a machine-learning algorithm applied to the images, classifying the surfaces. As a particular example, the classification can be done in a way that relies on surface parameters derived from the images rather than using the images directly.

公开(公告)号：US11644478B2

公开(公告)日：2023-05-09

申请号：US17591402

申请日：2022-02-02

Applicant: Oxford Instruments Asylum Research, Inc.

Inventor： Jason Bemis ,  David Aue ,  Aleksander Labuda

IPC: G01Q20/02 ,  G01Q10/06 ,  G01Q30/02 ,  G01Q30/04 ,  G01Q60/42

CPC classification number: G01Q20/02 ,  G01Q10/065 ,  G01Q30/025 ,  G01Q30/04 ,  G01Q60/42

Abstract: An atomic force microscope is provided having a controller configured to store one or more positional parameters output by a sensor assembly when a light spot is located at a first preset position on the surface of the cantilever. The controller is further configured to operate an actuator assembly so as to induce movement of the spot away from the first preset position, to detect said movement of the first spot based on a change in the one or more positional parameters output by the sensor assembly, and to operate an optical assembly in response to the detected movement of the first spot to return the first spot to the first preset position.

公开(公告)号：US11630124B2

公开(公告)日：2023-04-18

申请号：US17400349

申请日：2021-08-12

Applicant: Carl Zeiss SMT GmbH

Inventor： Christof Baur ,  Florian Demski

IPC: G01Q30/04 ,  G01Q10/06

Abstract: The present invention relates to a device for operating at least one bending beam in at least one closed control loop, wherein the device has: (a) at least one first interface designed to receive at least one controlled variable of the at least one control loop; (b) at least one programmable logic circuit designed to process a control error of the at least one control loop using a bit depth greater than the bit depth of the controlled variable; and (c) at least one second interface designed to provide a manipulated variable of the at least one control loop.

公开(公告)号：US20230003762A1

公开(公告)日：2023-01-05

申请号：US17887532

申请日：2022-08-15

Applicant: Lua Optomekatronik ARGE A.S.

Inventor： Tayfun Tatar ,  Onur Samet Yildirim

IPC: G01Q30/02 ,  G01N33/68 ,  G01Q30/04 ,  G01N21/65 ,  G06T7/00 ,  G06T7/60

Abstract: An extracellular vesicle characterization and analysis device in terms of their size, phenotype, and cargo content is provided. A method performed with the device to quantify the heterogeneity of extracellular vesicle samples both in terms of size and cargo content and further quantify the purity of extracellular vesicles based on their phenotype and cargo content is further provided. The extracellular vesicle characterization and analysis device includes an atomic force microscope and confocal Raman spectrometer subsystems that will present the phenotypic characterization and cargo analysis of extracellular vesicles, respectively. By processing the topographic images obtained by atomic force microscopy with image processing methods and analyzing them, the dimensional heterogeneity of the extracellular vesicle samples can be quantified and information about their purity can be presented. The confocal Raman spectrometer applies the tip-enhanced Raman spectrum method, performs a heterogeneity quantification and provides data on the purity of the sample.

公开(公告)号：US11524102B2

公开(公告)日：2022-12-13

申请号：US16521159

申请日：2019-07-24

Applicant: Fresenius Medical Care Holdings, Inc.

Inventor： Stephen Merchant ,  Roland Levin ,  Chris Chau ,  Shakil Aslam

IPC: A61M1/16 ,  A61M1/34 ,  A61M1/36 ,  G01N27/333 ,  G06F3/14 ,  G01Q30/04 ,  G01N33/00 ,  G01N21/31 ,  G01J1/00 ,  G01N21/62 ,  G01N21/63 ,  G01N21/64 ,  G01N21/77 ,  A61B5/00 ,  A61B5/02 ,  G01N21/33 ,  A61B5/024 ,  A61B5/0205

Abstract: A dialysis system is provided that includes a dialysis machine and a potassium sensing device that is configured to measure the concentration of potassium in the patient's blood, in spent dialysate resulting from treating the patient, or in both. The potassium sensing device can be configured to generate a sensed value of the concentration of potassium. A control and computing unit, including a processor and a memory, is configured to receive the sensed value, compare the value with one or more values stored in the memory, and generate a control signal based on the comparison. A potassium infusion circuit uses the control signal to infuse supplemental potassium solution into the treatment dialysate, a replacement fluid, or both. The memory can include stored patient-historical and population data.

公开(公告)号：US20220130033A1

公开(公告)日：2022-04-28

申请号：US17429443

申请日：2020-02-14

Applicant: Quantum Silicon Inc.

Inventor： Mohammad Rashidi ,  Jeremiah Croshaw ,  Robert Wolkow

IPC: G06T7/00 ,  G01Q30/04

Abstract: A method for autonomously applying a dangling bond pattern to a substrate for atom scale device fabrication includes inputting the pattern, initiating a patterning process, scanning the substrate using a scanning probe microscope (SPM) to generate an SPM image of the substrate, feeding the SPM image into a trained convolution neural network (CNN), analyzing the SPM image using the CNN to identify substrate defects, determining a defect free substrate area for pattern application; and applying the pattern to the substrate in that area. An atom scale electronic component includes functional patches on a substrate and wires electrically connecting the functional patches. Training a CNN includes recording a Scanning Tunneling Microscope (STM) image of the substrate, extracting images of defects from the STM image, labeling pixel-wise the defect images, and feeding the extracted and labeled images of defects into a CNN to train the CNN for semantic segmentation.