TEMPERATURE TUNED FAILURE DETECTION DEVICE
    9.
    发明申请
    TEMPERATURE TUNED FAILURE DETECTION DEVICE 审中-公开
    温度调节故障检测装置

    公开(公告)号:US20140010259A1

    公开(公告)日:2014-01-09

    申请号:US13541711

    申请日:2012-07-04

    Abstract: The embodiments described herein relate to BMG parts and related failure detection devices. The BMG parts can be formed of a material including at least one or more amorphous alloys having binary physical properties in response to a temperature. The BMG parts can be configured in failure detection devices, which can be used for controlling and detecting failures, determining mechanical and temperature parameters, and/or providing protection and switching functions to an electronic system that contains the BMG parts and/or the failure detection devices.

    Abstract translation: 这里描述的实施例涉及BMG部件和相关故障检测装置。 BMG部件可以由包括响应于温度的具有二元物理性质的至少一种或多种非晶态合金的材料形成。 BMG部件可以配置在故障检测装置中,可用于控制和检测故障,确定机械和温度参数,和/或为包含BMG部件和/或故障检测的电子系统提供保护和切换功能 设备。

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