公开(公告)号：US20130247682A1

公开(公告)日：2013-09-26

申请号：US13888959

申请日：2013-05-07

申请人： Hysitron Inc.

发明人： Yunje Oh ,  Edward Cyrankowski ,  Zhiwei Shan ,  Syed Amanula Syed Asif

IPC分类号： G01L1/00

CPC分类号： G01L1/005 ,  B81C99/005 ,  G01N3/08 ,  G01N2203/0286 ,  G01N2203/0647

摘要： A micromachined or microelectromechanical system (MEMS) based push-to-pull mechanical transformer for tensile testing of micro-to-nanometer scale material samples including a first structure and a second structure. The second structure is coupled to the first structure by at least one flexible element that enables the second structure to be moveable relative to the first structure, wherein the second structure is disposed relative to the first structure so as to form a pulling gap between the first and second structures such that when an external pushing force is applied to and pushes the second structure in a tensile extension direction a width of the pulling gap increases so as to apply a tensile force to a test sample mounted across the pulling gap between a first sample mounting area on the first structure and a second sample mounting area on the second structure.

摘要翻译： 一种用于对包括第一结构和第二结构的微米至纳米尺度材料样品的拉伸测试的基于微机械或微机电系统（MEMS）的推挽式机械变压器。 第二结构通过至少一个可使第二结构相对于第一结构运动的柔性元件耦合到第一结构，其中第二结构相对于第一结构设置，以便在第一结构之间形成牵引间隙 以及第二结构，使得当在拉伸延伸方向上施加外推力并推动所述第二结构时，所述牵引间隙的宽度增加，以便对安装在所述牵引间隙上的第一样品 第一结构上的安装区域和第二结构上的第二样品安装区域。

公开(公告)号：US09829417B2

公开(公告)日：2017-11-28

申请号：US14407783

申请日：2013-03-14

申请人： Hysitron, Inc.

发明人： Roger William Schmitz ,  Ude D. Hangen ,  Lucas Paul Keranen ,  Ryan Major ,  Yunje Oh ,  Jeremiah Vieregge ,  Christopher David Young

IPC分类号： G01N3/42 ,  G01N1/28 ,  G01B3/00 ,  F28F9/26 ,  G01N1/44 ,  G01N19/00 ,  G01N27/14

CPC分类号： G01N1/28 ,  F28F9/26 ,  G01B3/00 ,  G01N1/44 ,  G01N3/42 ,  G01N19/00 ,  G01N27/14

摘要： An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.

公开(公告)号：US20150075264A1

公开(公告)日：2015-03-19

申请号：US14388744

申请日：2013-03-13

申请人： Hysitron, Inc.

发明人： Syed Amanulla Syed Asif ,  Rajiv Dama ,  Ryan Major

IPC分类号： G01N3/40 ,  G02B7/16 ,  G01Q70/02 ,  G01N3/56 ,  G01N3/04

CPC分类号： G01N3/40 ,  G01N3/04 ,  G01N3/068 ,  G01N3/42 ,  G01N3/56 ,  G01N2203/0078 ,  G01N2203/0647 ,  G01Q30/025 ,  G01Q60/366 ,  G01Q70/02 ,  G02B7/16 ,  G02B21/248

摘要： An objective testing module includes a module base configured for coupling with an objective turret of a microscope. The objective testing module includes a mechanical testing assembly. The mechanical testing assembly is configured to mechanically test a sample at macro scale or less, and quantitatively determine one or more properties of the sample based on the mechanical testing. The mechanical testing assembly optionally includes a probe and one or more transducers coupled with the probe. The transducer measures one or more of force applied to a sample by the probe or displacement of the probe within the sample. In operation, an optical instrument locates a test location on a sample and the objective testing module mechanically tests at the test location with the mechanical testing assembly at a macro scale or less. The mechanical testing assembly further determines one or more properties of the sample according to the mechanical test.

摘要翻译： 客观测试模块包括被配置为与显微镜的目标转台耦合的模块基座。 客观测试模块包括机械测试组件。 机械测试组件被配置为以大规模或更小的尺寸机械测试样品，并且基于机械测试定量地确定样品的一个或多个特性。 机械测试组件可选地包括探针和与探针耦合的一个或多个换能器。 传感器测量通过探头施加到样品的力或样品内探针位移的一种或多种。 在操作中，光学仪器将测试位置定位在样品上，并且客观测试模块在机械测试组件以大规模或更小的程度在测试位置进行机械测试。 机械测试组件根据机械测试进一步确定样品的一个或多个特性。

公开(公告)号：US09759641B2

公开(公告)日：2017-09-12

申请号：US14948549

申请日：2015-11-23

申请人： Hysitron, Inc.

发明人： Yunje Oh ,  Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Oden Lee Warren

IPC分类号： H05B3/20 ,  H05B3/10 ,  G01N1/42 ,  H01J37/20 ,  G01N3/08 ,  H05B1/02 ,  H05B3/22 ,  G01N3/18 ,  G01N3/42

CPC分类号： G01N1/42 ,  G01N3/08 ,  G01N3/18 ,  G01N3/42 ,  G01N2203/0226 ,  G01N2203/0286 ,  G01N2203/04 ,  G01N2223/418 ,  H01J37/20 ,  H05B1/023 ,  H05B3/06 ,  H05B3/22

摘要： A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

公开(公告)号：US20150185117A1

公开(公告)日：2015-07-02

申请号：US14407783

申请日：2013-03-14

申请人： Hysitron, Inc.

发明人： Roger William Schmitz ,  Ude D. Hangen ,  Lucas Paul Keranen ,  Ryan Major ,  Yunje Oh ,  Jeremiah Vieregge ,  Christopher David Young

IPC分类号： G01N1/28 ,  G01N1/44 ,  G01N19/00 ,  F28F9/26 ,  G01N27/14

CPC分类号： G01N1/28 ,  F28F9/26 ,  G01B3/00 ,  G01N1/44 ,  G01N3/42 ,  G01N19/00 ,  G01N27/14

摘要： An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.

摘要翻译： 用于微米或更小尺寸的机械测试的环境调理组件。 组件包括其中具有环境空腔的外壳壳体。 样品台位于环境腔内，并包括一个选件样品加热器。 外壳壳体包括围绕样品台聚集的空腔周边，并且外壳壳体将环境腔和样品台与外壳外部的环境隔离。 在一个示例中，膨胀和收缩连接根据环境空腔内的加热或冷却波动在样品台上保持样品在静态高度。 测试仪器进出口延伸穿过外壳进入环境空腔。

公开(公告)号：US08959980B2

公开(公告)日：2015-02-24

申请号：US13962849

申请日：2013-08-08

申请人： Hysitron, Inc.

发明人： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

IPC分类号： G01Q40/00 ,  G01P21/00 ,  G01B21/04 ,  G01N3/02 ,  G01Q60/36 ,  G01N3/42

CPC分类号： G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

摘要： An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

摘要翻译： 自动化测试系统包括用机械测试仪器在微（多微米）或更小尺度下对样品进行在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。

公开(公告)号：US20150033835A1

公开(公告)日：2015-02-05

申请号：US14361133

申请日：2012-11-28

申请人： Hysitron, Inc.

发明人： Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Lucas Paul Keranen ,  Ryan Major ,  Yunjie Oh ,  Oden Lee Warren

IPC分类号： G01N3/54 ,  H05B3/32 ,  G01N3/08 ,  H05B1/02

CPC分类号： G01N3/54 ,  G01N3/08 ,  G01N3/18 ,  G01N2203/0078 ,  G01N2203/0226 ,  G01N2203/0282 ,  G01N2203/0286 ,  G01N2203/0482 ,  H05B1/023 ,  H05B3/32

摘要： A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.

摘要翻译： 用于微米或更小尺度的机械测试的加热系统包括级加热器。 舞台加热器具有舞台平面，舞台加热元件分布在舞台平面上。 在舞台平面的相对两侧有两个或多个支撑座。 第一桥从舞台平面延伸到两个或更多个支撑座的第一安装座，并且第二桥从舞台平面延伸到两个或更多个支撑座的第二安装座。 第一和第二桥梁在台面平面和两个或更多个支撑架之间提供多个支撑件，以相应地支撑台面平面。 在另一示例中，加热系统包括配置成加热探针作为机械测试的一部分的探针加热器。

公开(公告)号：US20140326707A1

公开(公告)日：2014-11-06

申请号：US14358065

申请日：2012-11-14

申请人： Hysitron, Inc.

发明人： Roger William Schmitz ,  Yunje Oh

IPC分类号： G01N3/40 ,  H05B3/03

CPC分类号： G01N3/40 ,  G01N3/42 ,  G01N2203/0226 ,  G01N2203/0282 ,  G01Q30/02 ,  G01Q30/10 ,  G01Q60/366 ,  H05B3/03

摘要： A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.

摘要翻译： 一种加热组件，其配置用于以微米或更小的尺度进行机械测试。 加热组件包括构造成与机械测试系统的换能器耦合的探针末端组件。 探针头组件包括具有加热元件的探针尖端加热器系统，与探针末端加热器系统耦合的探针末端和加热器插座组件。 在一个示例中，加热器插座组件包括在加热器插座组件内形成插座的磁轭和加热器接口。 与探针头相连的探头尖端加热器系统可滑动地接收并夹紧在插座内。

公开(公告)号：US20140231670A1

公开(公告)日：2014-08-21

申请号：US14347173

申请日：2012-09-28

申请人： HYSITRON, INC.

发明人： Edward Cyrankowski ,  Syed Amanulla Syed Asif ,  Ryan Major ,  Derek Rasugu ,  Yuxin Feng

IPC分类号： H01J37/20

CPC分类号： G01N3/04 ,  G01N3/42 ,  G01N2203/0026 ,  G01N2203/0206 ,  G02B21/26 ,  G02B21/32 ,  G21K5/10 ,  H01J37/20 ,  H01J2237/202 ,  H01J2237/2062 ,  H01J2237/28

摘要： A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.

摘要翻译： 包括多自由度样品台的多自由度样品台或测试组件。 多自由度采样台包括多个级，包括线性的，以及一个或多个旋转或倾斜台，其被配置为将样本定位在多个取向中，以便在聚集体积中的多个仪器进行接近或观察，从而限制 多自由度样品阶段。 多自由度样品台包括一个或多个夹紧组件，用于在观察期间将样品静态保持在适当位置，并且例如通过机械测试仪器向样品施加力。 此外，多自由度样品台包括一个或多个交叉滚子轴承组件，其基本上消除了与各个台阶的运动轴正交的方向上的一个或多个阶段的元件之间的机械公差。

公开(公告)号：US09902027B2

公开(公告)日：2018-02-27

申请号：US14908809

申请日：2014-08-01

申请人： Hysitron, Inc.

发明人： Rajiv Dama ,  Svetlana Zigelman

IPC分类号： G01D21/00 ,  B23P19/04 ,  G01N3/42 ,  G01Q60/36 ,  G01Q70/02 ,  B23P19/10 ,  G01D18/00 ,  G01N19/04

CPC分类号： B23P19/04 ,  B23P19/10 ,  G01D18/00 ,  G01N3/42 ,  G01N19/04 ,  G01N2203/0078 ,  G01N2203/0202 ,  G01N2203/0206 ,  G01N2203/0286 ,  G01Q60/366 ,  G01Q70/02

摘要： An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator.