知搜-全球专利检索

  1. 登录
  2. 注册

搜索结果

70 条记录 (耗时 0.028 秒)

    Instrument changing assembly and methods
    4.
    发明授权
    Instrument changing assembly and methods 有权

    公开(公告)号：US09902027B2

    公开(公告)日：2018-02-27

    申请号：US14908809

    申请日：2014-08-01

    申请人： Hysitron, Inc.

    发明人： Rajiv Dama ,  Svetlana Zigelman

    IPC分类号： G01D21/00 ,  B23P19/04 ,  G01N3/42 ,  G01Q60/36 ,  G01Q70/02 ,  B23P19/10 ,  G01D18/00 ,  G01N19/04

    CPC分类号： B23P19/04 ,  B23P19/10 ,  G01D18/00 ,  G01N3/42 ,  G01N19/04 ,  G01N2203/0078 ,  G01N2203/0202 ,  G01N2203/0206 ,  G01N2203/0286 ,  G01Q60/366 ,  G01Q70/02

    摘要： An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator.

    Testing assembly including a multiple degree of freedom stage
    5.
    发明授权
    Testing assembly including a multiple degree of freedom stage 有权
    测试组件包括多自由度阶段

    公开(公告)号：US09472374B2

    公开(公告)日：2016-10-18

    申请号：US14347173

    申请日：2012-09-28

    申请人： Hysitron, Inc.

    发明人： Edward Cyrankowski ,  Syed Amanulla Syed Asif ,  Ryan Major ,  Derek Rasugu ,  Yuxin Feng

    IPC分类号： H01J37/20 ,  G02B21/26 ,  G02B21/32 ,  G21K5/10 ,  G01N3/04 ,  G01N3/42

    CPC分类号： G01N3/04 ,  G01N3/42 ,  G01N2203/0026 ,  G01N2203/0206 ,  G02B21/26 ,  G02B21/32 ,  G21K5/10 ,  H01J37/20 ,  H01J2237/202 ,  H01J2237/2062 ,  H01J2237/28

    摘要： A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.

    摘要翻译： 包括多自由度样品台的多自由度样品台或测试组件。 多自由度采样台包括多个级，包括线性的，以及一个或多个旋转或倾斜台，其被配置为将样本定位在多个取向中，以便在聚集体积中的多个仪器进行接近或观察，从而限制 多自由度样品阶段。 多自由度样品台包括一个或多个夹紧组件，用于在观察期间将样品静态保持在适当位置，并且例如通过机械测试仪器向样品施加力。 此外，多自由度样品台包括一个或多个交叉滚子轴承组件，其基本上消除了与各个台阶的运动轴正交的方向上的一个或多个阶段的元件之间的机械公差。

    INSTRUMENT CHANGING ASSEMBLY AND METHODS
    6.
    发明申请
    INSTRUMENT CHANGING ASSEMBLY AND METHODS 有权
    仪器更换装配及方法

    公开(公告)号：US20160169718A1

    公开(公告)日：2016-06-16

    申请号：US14908809

    申请日：2014-08-01

    申请人： HYSITRON, INC.

    发明人： Rajiv Dama ,  Svetlana Zigelman

    IPC分类号： G01D18/00 ,  B23P19/04 ,  B23P19/10

    CPC分类号： B23P19/04 ,  B23P19/10 ,  G01D18/00 ,  G01N3/42 ,  G01N19/04 ,  G01N2203/0078 ,  G01N2203/0202 ,  G01N2203/0206 ,  G01N2203/0286 ,  G01Q60/366 ,  G01Q70/02

    摘要： An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator.

    摘要翻译： 仪器更换组件包括具有一个或多个探针组装工位的盒。 组件还包括至少一个探针更换工具，其包括插座插座。 一个或多个探针组件保持在一个或多个探针组装工位内。 一个或多个探针组件各自包括探针插座，其包括探针保持凹部和构造成用于与公共插座插座互补配合的公共插座配件。 探头更换工具被配置为根据公共插座配件和探头组件的公共插座之间的互补配合从机械测试仪器安装或提取相应的探头。 或者，仪器更换组件包括包括多个仪器的仪器阵列壳体。 一个或多个仪器（探头和换能器组合）中的每一个相对于具有仪器部署致动器的仪器阵列壳体被部署。

    HARDNESS TESTER
    7.
    发明申请
    HARDNESS TESTER 有权
    硬度测试仪

    公开(公告)号：US20120085154A1

    公开(公告)日：2012-04-12

    申请号：US13238022

    申请日：2011-09-21

    申请人： Fumihiro TAKEMURA ,  Kozo ARIGA

    发明人： Fumihiro TAKEMURA ,  Kozo ARIGA

    IPC分类号： G01N3/42

    CPC分类号： G01N3/42 ,  G01N2203/0206 ,  G01N2203/0286 ,  G06F9/451

    摘要： A hardness tester includes a monitor capable of displaying a main screen and an assistant screen; a first test location setter setting an indentation formation location on a test specimen for an initial test; and a second test location setter setting an indentation formation location on the test specimen for a retest. The second test location setter judges whether a new indentation formation location is suitable for a test based on a surface image of the test specimen and a setting condition obtained during the initial test, and, in a case where it is judged that the new indentation formation location is unsuitable for a test, sets again a coordinate point different from the coordinate point of the new indentation formation location as another new indentation formation location.

    摘要翻译： 硬度计包括能够显示主屏幕和辅助屏幕的监视器; 第一测试位置设定器，在初始测试的试样上设置压痕形成位置; 以及第二测试位置设定器，在测试样本上设置压痕形成位置以进行重新测试。 第二测试位置设定器基于测试样本的表面图像和初始测试期间获得的设置条件来判断新的压痕形成位置是否适合于测试，并且在判断新的压痕形成 位置不适合于测试，再次将与新压痕形成位置的坐标点不同的坐标点设置为另一个新的压痕形成位置。

    Apparatus and method for testing stiffness of articles
    8.
    发明申请
    Apparatus and method for testing stiffness of articles 有权
    用于测试物品刚度的装置和方法

    公开(公告)号：US20030226404A1

    公开(公告)日：2003-12-11

    申请号：US10427964

    申请日：2003-05-02

    发明人： Jean-Claude Ouellet ,  Jean Campagna ,  Danick Dupont ,  Gratien Beauchemin ,  Jacques Labbe

    IPC分类号： G01N003/20

    CPC分类号： G01N33/46 ,  G01N3/20 ,  G01N2203/0023 ,  G01N2203/0075 ,  G01N2203/0206 ,  G01N2203/0248 ,  G01N2203/0258

    摘要： An apparatus for testing stiffness characteristics such as modulus of elasticity E of an article such as a piece of lumber moving in a conveying direction transverse to the testing axis, comprises a bearing unit capable of contacting the piece of lumber at two spaced apart portions thereof. There is provided a first deflecting unit including a first working element being normally disposed in a first static position relative to the conveying path for applying a first thrust against a loaded area on the article at an intermediary portion thereof located between the spaced apart portions, to produce an article deflection of a first magnitude. Each working element defines a loading surface extending substantially parallel to the article-conveying path. There is further provided a second deflecting unit including a second working element being normally disposed in a second static position relative to the conveying path for applying a second thrust against a loaded area of the article intermediary portion, to produce an article deflection of a second magnitude, wherein the second position differs from the first position relative to the conveying path by a differential value. The apparatus further comprises load cells coupled to the bearing unit for generating signals indicative of respective magnitudes the first and second thrusts as applied by first and second deflecting units, and a computer for deriving from such signals and differential value an indication of the stiffness of the article, such as modulus of elasticity E.

    摘要翻译： 用于测量诸如在横向于测试轴线的传送方向上移动的一块木材的制品的刚度特性（例如，弹性模量E）的装置包括能够在其两个间隔开的部分处接触该木材的轴承单元。 提供了第一偏转单元，其包括第一工作元件，第一工作元件通常相对于输送路径设置在第一静止位置，用于在其位于间隔开的部分之间的中间部分处施加第一推力抵靠物品上的装载区域， 产生第一幅度的物品偏转。 每个工作元件限定基本平行于物品输送路径延伸的装载表面。 还提供了一种第二偏转单元，其包括第二工作元件，该第二工作元件通常相对于输送路径设置在第二静止位置，用于将第二推力施加在物品中间部分的装载区域上，以产生第二幅度的制品偏转 ，其中所述第二位置与所述第一位置相对于所述输送路径的微分值不同。 该装置还包括耦合到轴承单元的负载传感器，用于产生指示由第一和第二偏转单元施加的第一和第二推力的相应大小的信号，以及用于从这些信号和微分值导出的指示， 物品如弹性模量E.

    MATERIAL TESTING MACHINE
    10.
    发明公开
    MATERIAL TESTING MACHINE 审中-公开

    公开(公告)号：US20230366796A1

    公开(公告)日：2023-11-16

    申请号：US17868741

    申请日：2022-07-19

    申请人： Tsinghua University

    发明人： Fei Guo ,  Ganlin Cheng ,  Bingzhe Chen ,  Chong Xiang ,  Yijie Huang ,  Shengshan Chen ,  Yongjian Li ,  Xiaohong Jia ,  Yuming Wang

    IPC分类号： G01N3/04 ,  G01N3/40 ,  G01N3/56 ,  G01N3/30

    CPC分类号： G01N3/04 ,  G01N3/30 ,  G01N3/405 ,  G01N3/56 ,  G01N2203/0206

    摘要： A material testing machine, including a machine body, a first fixing element, a second fixing element and a detection assembly; the first and the second fixing elements are mounted to the machine body, the first fixing element is configured to mount a first testing element, and the second fixing element is configured to mount a second testing element; in a first state, the first and the second testing elements are in sliding contact; in a second state, the first fixing element drives the first testing element to collide with the second testing element; the detection assembly is configured to detect a target parameter, and in the first state, the target parameter includes a friction force and/or, a friction sound between the first and the second testing elements; and in the second state, the target parameter includes a collision force received by the first or the second testing element.