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1.发明申请MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WITH PUSH-TO-PULL TRANSFORMER 有权微型/纳米机械测试系统采用推拉变压器的拉伸测试台公开(公告)号：US20130247682A1
公开(公告)日：2013-09-26
申请号：US13888959
申请日：2013-05-07
申请人： Hysitron Inc.
IPC分类号： G01L1/00
CPC分类号： G01L1/005 , B81C99/005 , G01N3/08 , G01N2203/0286 , G01N2203/0647
摘要： A micromachined or microelectromechanical system (MEMS) based push-to-pull mechanical transformer for tensile testing of micro-to-nanometer scale material samples including a first structure and a second structure. The second structure is coupled to the first structure by at least one flexible element that enables the second structure to be moveable relative to the first structure, wherein the second structure is disposed relative to the first structure so as to form a pulling gap between the first and second structures such that when an external pushing force is applied to and pushes the second structure in a tensile extension direction a width of the pulling gap increases so as to apply a tensile force to a test sample mounted across the pulling gap between a first sample mounting area on the first structure and a second sample mounting area on the second structure.
摘要翻译： 一种用于对包括第一结构和第二结构的微米至纳米尺度材料样品的拉伸测试的基于微机械或微机电系统（MEMS）的推挽式机械变压器。 第二结构通过至少一个可使第二结构相对于第一结构运动的柔性元件耦合到第一结构，其中第二结构相对于第一结构设置，以便在第一结构之间形成牵引间隙 以及第二结构，使得当在拉伸延伸方向上施加外推力并推动所述第二结构时，所述牵引间隙的宽度增加，以便对安装在所述牵引间隙上的第一样品 第一结构上的安装区域和第二结构上的第二样品安装区域。
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公开(公告)号：US09759641B2
公开(公告)日：2017-09-12
申请号：US14948549
申请日：2015-11-23
申请人： Hysitron, Inc.
IPC分类号： H05B3/20 , H05B3/10 , G01N1/42 , H01J37/20 , G01N3/08 , H05B1/02 , H05B3/22 , G01N3/18 , G01N3/42
CPC分类号： G01N1/42 , G01N3/08 , G01N3/18 , G01N3/42 , G01N2203/0226 , G01N2203/0286 , G01N2203/04 , G01N2223/418 , H01J37/20 , H05B1/023 , H05B3/06 , H05B3/22
摘要： A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.
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公开(公告)号：US20150033835A1
公开(公告)日：2015-02-05
申请号：US14361133
申请日：2012-11-28
申请人： Hysitron, Inc.
发明人： Syed Amanulla Syed Asif , Edward Cyrankowski , Lucas Paul Keranen , Ryan Major , Yunjie Oh , Oden Lee Warren
CPC分类号： G01N3/54 , G01N3/08 , G01N3/18 , G01N2203/0078 , G01N2203/0226 , G01N2203/0282 , G01N2203/0286 , G01N2203/0482 , H05B1/023 , H05B3/32
摘要： A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.
摘要翻译： 用于微米或更小尺度的机械测试的加热系统包括级加热器。 舞台加热器具有舞台平面，舞台加热元件分布在舞台平面上。 在舞台平面的相对两侧有两个或多个支撑座。 第一桥从舞台平面延伸到两个或更多个支撑座的第一安装座，并且第二桥从舞台平面延伸到两个或更多个支撑座的第二安装座。 第一和第二桥梁在台面平面和两个或更多个支撑架之间提供多个支撑件，以相应地支撑台面平面。 在另一示例中，加热系统包括配置成加热探针作为机械测试的一部分的探针加热器。
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公开(公告)号：US20140231670A1
公开(公告)日：2014-08-21
申请号：US14347173
申请日：2012-09-28
申请人： HYSITRON, INC.
IPC分类号： H01J37/20
CPC分类号： G01N3/04 , G01N3/42 , G01N2203/0026 , G01N2203/0206 , G02B21/26 , G02B21/32 , G21K5/10 , H01J37/20 , H01J2237/202 , H01J2237/2062 , H01J2237/28
摘要： A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
摘要翻译： 包括多自由度样品台的多自由度样品台或测试组件。 多自由度采样台包括多个级，包括线性的，以及一个或多个旋转或倾斜台，其被配置为将样本定位在多个取向中，以便在聚集体积中的多个仪器进行接近或观察，从而限制 多自由度样品阶段。 多自由度样品台包括一个或多个夹紧组件，用于在观察期间将样品静态保持在适当位置，并且例如通过机械测试仪器向样品施加力。 此外，多自由度样品台包括一个或多个交叉滚子轴承组件，其基本上消除了与各个台阶的运动轴正交的方向上的一个或多个阶段的元件之间的机械公差。
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公开(公告)号：US09804072B2
公开(公告)日：2017-10-31
申请号：US14361133
申请日：2012-11-28
申请人： Hysitron, Inc.
发明人： Syed Amanulla Syed Asif , Edward Cyrankowski , Lucas Paul Keranen , Ryan Major , Yunje Oh , Oden Lee Warren , Maciej W. Misiak
CPC分类号： G01N3/54 , G01N3/08 , G01N3/18 , G01N2203/0078 , G01N2203/0226 , G01N2203/0282 , G01N2203/0286 , G01N2203/0482 , H05B1/023 , H05B3/32
摘要： A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.
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公开(公告)号：US20170030812A1
公开(公告)日：2017-02-02
申请号：US15295196
申请日：2016-10-17
申请人： Hysitron, Inc.
摘要： A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
摘要翻译： 包括多自由度样品台的多自由度样品台或测试组件。 多自由度采样台包括多个级，包括线性的，以及一个或多个旋转或倾斜台，其被配置为将样本定位在多个取向中，以便在聚集体积中的多个仪器进行接近或观察，从而限制 多自由度样品阶段。 多自由度样品台包括一个或多个夹紧组件，用于在观察期间将样品静态保持在适当位置，并且例如通过机械测试仪器向样品施加力。 此外，多自由度样品台包括一个或多个交叉滚子轴承组件，其基本上消除了与各个台阶的运动轴正交的方向上的一个或多个阶段的元件之间的机械公差。
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公开(公告)号：US09472374B2
公开(公告)日：2016-10-18
申请号：US14347173
申请日：2012-09-28
申请人： Hysitron, Inc.
CPC分类号： G01N3/04 , G01N3/42 , G01N2203/0026 , G01N2203/0206 , G02B21/26 , G02B21/32 , G21K5/10 , H01J37/20 , H01J2237/202 , H01J2237/2062 , H01J2237/28
摘要： A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
摘要翻译： 包括多自由度样品台的多自由度样品台或测试组件。 多自由度采样台包括多个级，包括线性的，以及一个或多个旋转或倾斜台，其被配置为将样本定位在多个取向中，以便在聚集体积中的多个仪器进行接近或观察，从而限制 多自由度样品阶段。 多自由度样品台包括一个或多个夹紧组件，用于在观察期间将样品静态保持在适当位置，并且例如通过机械测试仪器向样品施加力。 此外，多自由度样品台包括一个或多个交叉滚子轴承组件，其基本上消除了与各个台阶的运动轴正交的方向上的一个或多个阶段的元件之间的机械公差。
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公开(公告)号：US20160123859A1
公开(公告)日：2016-05-05
申请号：US14948549
申请日：2015-11-23
申请人： Hysitron, Inc.
CPC分类号： G01N1/42 , G01N3/08 , G01N3/18 , G01N3/42 , G01N2203/0226 , G01N2203/0286 , G01N2203/04 , G01N2223/418 , H01J37/20 , H05B1/023 , H05B3/06 , H05B3/22
摘要： A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.
摘要翻译： 一种亚微米级属性测试装置，包括测试对象支架和加热组件。 组件包括构造成与亚微米机械测试仪器和电 - 机械换能器组件联接的保持器基座。 组件还包括与保持器基座联接的测试对象级。 测试对象阶段与保持器基座热隔离。 测试对象阶段包括被配置为接收测试对象的舞台对象表面和支撑舞台对象表面的舞台。 舞台板在舞台主体表面下。 测试对象阶段还包括与舞台对象表面相邻的加热元件，加热元件构造成在舞台对象表面处产生热量。
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9.发明授权Micro/nano-mechanical test system employing tensile test holder with push-to-pull transformer 有权微/纳机械测试系统采用拉拔式测试架，带有推挽式变压器公开(公告)号：US08789425B2
公开(公告)日：2014-07-29
申请号：US13888959
申请日：2013-05-07
申请人： Hysitron Inc.
IPC分类号： G01L1/00
CPC分类号： G01L1/005 , B81C99/005 , G01N3/08 , G01N2203/0286 , G01N2203/0647
摘要： A micromachined or microelectromechanical system (MEMS) based push-to-pull mechanical transformer for tensile testing of micro-to-nanometer scale material samples including a first structure and a second structure. The second structure is coupled to the first structure by at least one flexible element that enables the second structure to be moveable relative to the first structure, wherein the second structure is disposed relative to the first structure so as to form a pulling gap between the first and second structures such that when an external pushing force is applied to and pushes the second structure in a tensile extension direction a width of the pulling gap increases so as to apply a tensile force to a test sample mounted across the pulling gap between a first sample mounting area on the first structure and a second sample mounting area on the second structure.
摘要翻译： 一种用于对包括第一结构和第二结构的微米至纳米尺度材料样品的拉伸测试的基于微机械或微机电系统（MEMS）的推挽式机械变压器。 第二结构通过至少一个可使第二结构相对于第一结构运动的柔性元件耦合到第一结构，其中第二结构相对于第一结构设置，以便在第一结构之间形成牵引间隙 以及第二结构，使得当在拉伸延伸方向上施加外推力并推动所述第二结构时，所述牵引间隙的宽度增加，以便对安装在所述牵引间隙上的第一样品 第一结构上的安装区域和第二结构上的第二样品安装区域。
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