PHASE-CONTRAST IMAGING METHOD FOR ESTIMATING THE LOCAL STOICHIOMETRY OF A SAMPLE

    公开(公告)号:US20250044243A1

    公开(公告)日:2025-02-06

    申请号:US18717887

    申请日:2022-12-02

    Inventor: Philippe ZEITOUN

    Abstract: An imaging method for determining a parameter δ of real and imaginary parts of a sample complex optical index; the method using an X-ray source to illuminate the sample, a perforated grating arranged between the sample and the detector, and a signal processing unit; the method performing measurement while illuminating the sample, the X-rays reaching the detector forming a spot for each grating hole; for each measurement and for each grating hole, analysing the grating spot by determining a spot barycenter using a centroid-finding technique, determining an offset of the barycenter relative to a reference barycenter and determining a local phase variation via the offset of the barycenter, determining an amplitude of the X-rays forming the spot and determining a local attenuation relative to a reference amplitude, determining the parameter δ on the basis of the local phase variation, and determining the imaginary part β via the local attenuation.

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