Interface device
    1.
    发明授权

    公开(公告)号:US12212315B1

    公开(公告)日:2025-01-28

    申请号:US18093281

    申请日:2023-01-04

    Inventor: Vinod Kumar

    Abstract: Methods and systems are provided for transmitting data using thin-oxide devices. The methods and system generate a first bias voltage and a second bias voltage based on a power supply voltage of the second voltage domain, the first bias voltage value representing a high-level voltage signal of the first voltage domain, and the second bias voltage representing a low-level voltage signal of the second voltage domain and its value corresponds to a difference between the second voltage domain and the first voltage domain. The methods and systems generate an output of the thin-oxide device interface using first and second thin-oxide devices, the output of the thin-oxide device interface having a range corresponding to the second voltage domain.

    Clock duty cycle measurement
    2.
    发明授权

    公开(公告)号:US12184286B1

    公开(公告)日:2024-12-31

    申请号:US17831685

    申请日:2022-06-03

    Abstract: The present disclosure describes a circuit that may include a first amplifier portion configured to receive a first input signal corresponding to a first clock signal and a second input signal corresponding to a second clock signal. The circuit may include a first amplifier of the first amplifier portion. The first amplifier may be configured to receive a first amplifier input signal and a second amplifier input signal. The circuit may include a second amplifier portion configured to receive a first output signal from the first amplifier portion. In a first mode, the first amplifier input signal may be based upon the second input signal and the second amplifier input signal may be based upon the first input signal. In a second mode, the first amplifier input signal may be based upon the first input signal and the second amplifier input signal may be based upon the second input signal.

    MODELING OF FOUR-STATE-AWARE MEMORIES IN AN EMULATION SYSTEM

    公开(公告)号:US20240296269A1

    公开(公告)日:2024-09-05

    申请号:US18178463

    申请日:2023-03-03

    CPC classification number: G06F30/3308

    Abstract: The systems and methods described herein include emulators that implement wrappers comprising instrumentation logic for the emulator components (e.g., memories) to perform certain memory-related functions. These functions allow the physical binary memories of the emulator to behave as a ternary memory. The memory wrappers include instrumentation logic around logic of the physical binary memories. In some cases, embodiments generate the wrappers for the user memory, rather than performing conventional synthesis functions for user-design memories. The inputs include the user ternary RTL, as well as additional potential inputs for pre-compiler control. The wrappers instantiate the operations, such as MPRs or MPWs, and create the ternary-memory support logic to, for example, prevent unknown-value writes and to output unknown values X for unknown-value reads.

    Load-store unit dual tags and replays

    公开(公告)号:US11983538B2

    公开(公告)日:2024-05-14

    申请号:US17659569

    申请日:2022-04-18

    CPC classification number: G06F9/3834 G06F12/0855

    Abstract: Techniques are disclosed relating to a processor load-store unit. In some embodiments, the load-store unit is configured to execute load/store instructions in parallel using first and second pipelines and first and second tag memory arrays. In tag write conflict situations, the load-store unit may arbitrate between the first and second pipelines to ensure the first and second tag memory array contents remain identical. In some embodiments, a data cache tag replay scheme is utilized. In some embodiments, executing load/store instructions in parallel with fills, probes, and store-updates, using separate but identical tag memory arrays, may advantageously improve performance.

    Test-point flop sharing with improved testability in a circuit design

    公开(公告)号:US11947887B1

    公开(公告)日:2024-04-02

    申请号:US17953618

    申请日:2022-09-27

    CPC classification number: G06F30/333 G06F30/327 G01R31/318583

    Abstract: A system includes a memory that stores instructions and receives a circuit netlist, and includes a processing unit that accesses the memory and executes the instructions. The instructions include an EDA application that includes a test-point flop allocation module that is configured to evaluate the circuit netlist to determine compatibility of the test-point nodes in the circuit netlist. The test-point flop allocation module can further allocate each of the test-point flops to a test-point sharing group comprising a plurality of compatible test-point nodes. The EDA application also includes a circuit layout module configured to generate a circuit layout associated with the circuit design, the circuit layout comprising the functional logic and scan-chains comprising the test-point flops allocated to the test-point sharing groups in response to the circuit netlist. The circuit layout is employable to fabricate an integrated circuit (IC) chip.

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