Colorimetry method and colorimetry apparatus

    公开(公告)号:US09983120B2

    公开(公告)日:2018-05-29

    申请号:US14169923

    申请日:2014-01-31

    Inventor: Tetsuo Tatsuda

    Abstract: An imaging section that detects the amount of light separated by a wavelength tunable interference filter to acquire a spectroscopic image (imaging device and light amount acquisition section) detects the amount of light successively separated for three wavelengths to acquire spectroscopic images for producing a combined image. A display controller causes a display section to display a combined image based on the spectroscopic images for producing the combined image. A specified position detection section identifies based on user's operation a specified position where a colorimetry result is to be outputted. The imaging section detects the amount of light successively separated for a plurality of wavelengths by the wavelength tunable interference filter to acquire spectroscopic images for colorimetry corresponding to the plurality of wavelengths. A colorimetry section measures the color in the specified position by using the amount of light obtained from each of the spectroscopic images for colorimetry.

    Multispectral imaging via coded aperture

    公开(公告)号:US09983063B1

    公开(公告)日:2018-05-29

    申请号:US14687364

    申请日:2015-04-15

    Abstract: Mechanisms for identifying energy received from a scene are provided. A coded aperture in an optical system receives energy from a scene. The coded aperture comprises a plurality of wavelength filter sets arranged in a predetermined pattern. Each wavelength filter set is configured to transmit energy in a corresponding wavelength band of a plurality of different wavelength bands. The coded aperture transmits the energy toward a detector array comprising a plurality of detector elements. The detector array generates sensor data that quantifies energy received by each detector element. The sensor data is processed based on the predetermined pattern to identify spatial locations of energy in each corresponding wavelength band with respect to the scene.

    Imaging spectrometer design tool for evaluating freeform optics

    公开(公告)号:US09964444B2

    公开(公告)日:2018-05-08

    申请号:US15168015

    申请日:2016-05-28

    CPC classification number: G01J3/2823 G01J3/0208 G01J3/027 G01J3/0289 G01J3/18

    Abstract: A full-field display for spectrally dispersive imaging optics, particularly as a design tool for evaluating optical designs including designs with freeform optical surfaces, includes a ray tracing module arranged for modeling local aberrations throughout the image field of the spectrometer and a display module that converts values of the modeled local aberrations throughout the image field into representative symbols. The spectrometer field has a first spatial dimension corresponding to a length dimension of an input and a second spectral dimension corresponding to the dispersion of the input. The representative symbols are plotted in an array having a first axis corresponding to the first spatial dimension of the image field and a second axis corresponding to the second spectral dimension of the image field.

    IMAGING SPECTROMETER WITH REFLECTIVE GRATING
    80.
    发明申请

    公开(公告)号:US20180094977A1

    公开(公告)日:2018-04-05

    申请号:US15718475

    申请日:2017-09-28

    Inventor: Matteo Taccola

    Abstract: An imaging spectrometer receives a beam of light from a slit and outputs the beam of light to a focal plane. The output beam of light at the focal plane is dispersed in accordance with a spectral composition of the beam of light received from the slit. The imaging spectrometer comprises first to fourth curved reflective portions. The first to fourth curved reflective portions are arranged so that the beam of light, in its passage from the slit to the focal plane, sequentially strikes the first to fourth curved reflective portions and is reflected by the first to fourth curved reflective portions. Further, the first to fourth curved reflective portions are alternatingly concave or convex, respectively, along the passage of the beam of light. At least one of the first to fourth curved reflective portions has a reflective grating structure. Further disclosed is a method of manufacturing such imaging spectrometer.

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