Abstract:
An apparatus is described for the real-time identification of one or more selected components of a target material. In one embodiment, an infrared spectrometer and a separate Raman spectrometer are coupled to exchange respective spectral information of the target material preferably normalized and presented in a single graph. In an alternative embodiment, both an infrared spectrometer and a Raman spectrometer are included in a single instrument and a common infrared light source is used by both spectrometers. In another embodiment, a vibrational spectrometer and a stoichiometric spectrometer are combined in a single instrument and are coupled to exchange respective spectral information of the target material and to compare the spectral information against a library of spectra to generate a real-time signal if a selected component is present in the target material.
Abstract:
The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arrangement.
Abstract:
A diode laser spectroscopy gas sensing apparatus having a diode laser with a select lasing frequency, a pitch optic coupled to the diode laser with the pitch optic being operatively associated with a process chamber and oriented to project laser light along a projection beam through the process chamber. This embodiment additionally includes a catch optic in optical communication with the pitch optic to receive the laser light projected through the process chamber and an optical fiber optically coupled to the catch optic. In addition, the catch optic is operatively associated with a catch side alignment mechanism which provides for the alignment of the catch optic with respect to the projection beam to increase a quantity of laser light received by the catch optic from the pitch optic and coupled to the optical fiber and a detector sensitive to the select lasing frequency optically coupled to the optical fiber. The catch side alignment mechanism may consist of means to tilt the catch optic along a first axis and a second axis orthogonal to the first axis with both the first and second axes being approximately orthogonal to the projection beam.
Abstract:
Echelle gratings and microelectromechanical system (MEMS) digital micromirror device (DMD) detectors are used to provide rapid, small, and highly sensitive spectrometers. The new spectrometers are particularly useful for laser induced breakdown and Raman spectroscopy, but could generally be used with any form of emission spectroscopy. The new spectrometers have particular applicability in the detection of improvised explosive devices.
Abstract:
A method for the wavelength calibration of echelle spectra, in which the wavelengths are distributed across number of orders is characterised by the steps: recording of a line-rich reference spectrum with known wavelengths for a number of the lines, determination of the position of a number of peaks of the reference spectrum in the recorded spectrum, selection of at least two first lines of known order, position and wavelength, determination of a wavelength scale for the order in which the known lines lie, by means of a fit function γm(x), determination of a provisional wavelength scale γ?m 1(x) for at least one neighboring order m 1, by means of addition/subtraction of a wavelength difference γFSR which corresponds to a free spectral region, according to γm 1 ?(x)=γm(x)γFSR with γFSR=γm(x)/m, determination of the wavelengths of lines in said neighboring order m 1, by means of the provisional wavelength scale γ 1(x), replacement of the provisional wavelength of at least two lines by the reference wavelength for said lines as obtained in step (a) and repeat of steps (d) to (g) for at least one further neighboring order.
Abstract:
A catch side optical system for use in diode laser spectroscopy consisting of a catch side optic optically coupled to a catch side multimode optical fiber and means to mechanically manipulate a section of the catch side multimode optical fiber to minimize catch side mode noise. The mechanical manipulation may consist of twisting the catch side multimode optical fiber around its longitudinal axis. The means to mechanically manipulate the section of the catch side multimode optical fiber in the above fashion may consist of a motor associated with the catch side multimode optical fiber such that a section of fiber is held fast relative to a shaft position of the motor and the motor shaft is repetitively swept through +360 degrees and −360 degrees of motion. The frequency of the motor shaft sweep may be at least 10 Hz to enable effective averaging of the transmitted signal and thereby reduce the effect of catch side mode noise.
Abstract:
A spectrometer assembly (10) is disclosed. The assembly includes a light source (11) with a continuous spectrum. A pre-monochromator (2) generates a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of the spectral portion being smaller than or equal to the bandwidth of the free spectral range of the order in the echelle spectrum. The centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency. The assembly also includes an echelle spectrometer (4) with means for wavelength calibration, an entrance slit (21) at the pre-monochromator (2), an intermediate slit assembly (50) with an intermediate slit (3) and a spatially resolving light detector (5) in the exit plane of the spectrometer for the detection of wavelength spectra.
Abstract:
A sensing apparatus consisting of more than one diode laser having select lasing frequencies, a multiplexer optically coupled to the outputs of the diode lasers with the multiplexer being further optically coupled to a pitch side optical fiber. Multiplexed laser light is transmitted through the pitch side optical fiber to a pitch optic operatively associated with a process chamber which may be a combustion chamber or the boiler of a coal or gas fired power plant. The pitch optic is oriented to project multiplexed laser output through the process chamber. Also operatively oriented with the process chamber is a catch optic in optical communication with the pitch optic to receive the multiplexed laser output projected through the process chamber. The catch optic is optically coupled to an optical fiber which transmits the multiplexed laser output to a demultiplexer. The demultiplexer demultiplexes the laser light and optically couples the select lasing frequencies of light to a detector with the detector being sensitive to one of the select lasing frequencies.
Abstract:
A high resolution spectrometer with a large free spectral range comprising an entry slit for a beam of electromagnetic radiation to be analyzed, a first dispersion device for dispersing the beam to be analyzed into various wavelength components in a first direction, a second dispersion device for dispersing each wavelength component output from the first dispersion device in a second direction, and an imaging device comprising a sensitive detection spectrum. surface on which the beam dispersed in the first and second directions is focused, the first dispersion device being an optical filter that varies linearly and has a surface on which the beam to be analyzed is focused, each point on the surface of the filter operating like a pass band filter with a central frequency varying linearly in the first direction.
Abstract:
An optical performance monitor for measuring the performance of optical networks has an echelle grating for demultiplexing an input beam into a plurality of wavelengths that are focused onto an array of divided output waveguides. Each divided output waveguide is positioned to receive a corresponding demultiplexed wavelength from the echelle grating or other waveguide multiplexer device. The divided output waveguides laterally separate the corresponding demultiplexed wavelength into a first and second portions. A detector array is positioned to receive the respective portions of the demultiplexed wavelengths and by comparing their relative intensity it is possible to detect any drift in the nominal wavelengths of the channels.