Abstract:
An area efficient input terminated readable and resettable configuration memory latch is disclosed. A pull-up network and a pair of pull-down networks operate to set the value of an internal node based, in part, on the state of the input terminated bit line and a word line write input. The internal node is inverted to form the output of the configuration memory latch. A reset line operates to reset the latch and a reset cycle is initiated prior to each write cycle. In some embodiments, the configuration memory latch includes a scan mode input, which, when asserted, facilitates automated testing of a programmable logic device that includes the configuration memory latch. Asserting the scan mode input enables Design for Test functionality. A sensing block is configured to sense the state of the bit when a word line read signal and a read enable signal are both asserted.
Abstract:
An area efficient readable and resettable configuration memory latch is disclosed that maintains latch data integrity through read and write operations and includes a non-terminated inout bit line (BL). During write operations, enabled by a Word Line Write (WLW) signal, the non-terminated inout BL drives data to be written, while, during read operations, enabled by a Word Line Read (WLR) signal, the state of the BL is indicative of a data stored in the latch. A pull-down network is activated when the WLR signal is asserted and the stored data is logic one and, when activated, operates to pull down the BL to logic zero; the pull-down network is inactive otherwise. A weak pull-up operates to pull up the BL when the pull-down network is inactive. A sensing block is configured to sense the state of the BL when the WLR signal and a read enable signal are both asserted.
Abstract:
A sensor hub includes a bit packer that receives sensor data from a plurality of sensors and bit packs the sensor data so that the sensor ID, time stamp and each axis of the measured data is stored contiguously. The bit packer may compress the sensor data by removing the sensor ID and/or the time stamp in the sensor data. The bit packed sensor data is stored in batching memory. A bit unpacker receives the sensor data from the batching memory and unpacks the sensor data, e.g., so that the sensor ID, time stamp and each axis of the measured data is stored in its own word. Additionally, the bit unpacker may decompress the bit packed sensor data by reinserting the sensor ID and/or time stamp in the sensor data.
Abstract:
A programmable logic device uses power island based design partitioning. Each power islands includes a plurality of programmable logic cells and a programmable routing network configurable to interconnect the plurality of programmable logic cells and configurable to interconnect with at least one other power island. When a power island is in an OFF state, the programmable logic cells within the power island are powered OFF. Feed-through routing connectors in the power island, however, may be statically or dynamically powered ON independently of the powered OFF state of the power island.
Abstract:
A logic cell in a programmable logic device receives an external signal from a routing network that serves as a select signal that selects a combinatorial logic signal via a first multiplexor as well as a data input to a second multiplexor. The second multiplexor selects between the combinatorial logic signal and the external signal and provides an output signal to a register. Accordingly, the logic cell has the flexibility to support a combinatorial and/or sequential function using minimal routing resources. A third multiplexor may select the output from the register or another signal as the output signal from the logic cell. A clock signal to the register may be gated off when the register output is not selected as the output signal, thereby reducing dynamic power consumption. The programmable logic device may include a number of super logic cells, each of which includes a plurality of logic cells.
Abstract:
A routing network is associated with a logic island in a logic block of a programmable logic device and includes switches for each of feedback, street, and highway and clock networks. Some of the switches include multiple stages. The feedback network switch receives signals from the logic island as well as from neighboring logic blocks and provides an output to one or more stages of the street network switch. The street network switch receives the signals from the feedback network switch and signals from neighboring highway network switches and provides an output to the logic island. A clock network switch may receive dedicated clock signals or high fan out signals as inputs and provides outputs to the street network switch. The highway network switch receives signals from the logic island and from neighboring highway network switches and provides an output to neighboring highway network switches.
Abstract:
An integrated circuit includes a programmable logic device, a dedicated device, and an interface circuit between the two. The interface circuit can be easily modified to accommodate the different interface I/O demands of various dedicated devices that may be embedded into the integrated circuit. In one embodiment, the interface circuit may be implemented using a plurality of mask programmable uni-directional interface buffer circuits. The direction of any desired number of the interface buffer circuits can be reversed based on the needs of a desired dedicated device by re-routing the conductors in the interface buffer circuits in a single metal layer of the integrated circuit. In another embodiment, the interface circuit may be implemented using a hardware configurable bi-directional interface buffer circuit.
Abstract:
Testing of combinatorial logic in a programmable device is provided by routing input and/or output test values as signals from and back to dedicated logic through programming circuitry in programmable logic.
Abstract:
A voltage regulator with a variable compensation capacitor is capable of driving a large variable dynamic current load. The regulator includes an error amplifier and an output stage amplifier. The variable compensation capacitor is disposed between the output terminal of the error amplifier and the output terminal of the output stage amplifier. In one embodiment, a NMOS transistor is disposed between the output terminal of the output stage amplifier and the variable compensation capacitor. The variable compensation capacitor may be, e.g., a PMOS transistor with the source and drain tied together. In one embodiment, a plurality of regulators is included on chip, e.g., such as a programmable device, where the output terminals of each regulator is tied together and used to drive the same load.
Abstract:
In one method for forming amorphous silicon antifuses with significantly reduced leakage current, a film of amorphous silicon is formed in a antifuse via between two electrodes. The amorphous silicon film is deposited using plasma enhanced chemical vapor deposition, preferably in an silane-argon environment and at a temperature between 200 and 500 degrees C., or reactively sputtered in a variety of reactive gases. In another method, an oxide layer is placed between two amorphous silicon film layers. In yet another method, one of the amorphous silicon film layers about the oxide layer is doped. In another embodiment, a layer of conductive, highly diffusible material is formed either on or under the amorphous silicon film. The feature size and thickness of the amorphous silicon film are selected to minimize further the leakage current while providing the desired programming voltage. A method also is described for for forming a field programmable gate array with antifuses.