公开(公告)号：US11743403B2

公开(公告)日：2023-08-29

申请号：US17498864

申请日：2021-10-12

申请人： Masahiro Ishida

发明人： Masahiro Ishida

IPC分类号： H04N1/00 ,  G01B11/02 ,  G06T7/50 ,  G01B11/24

CPC分类号： H04N1/00827 ,  G01B11/022 ,  G06T7/50 ,  H04N1/00801

摘要： An image reading device and an image forming apparatus. The image reading device includes a scanned-image acquisition unit configured to scan a mounting table to obtain image data of a to-be-scanned object placed on the mounting table, a capturing unit configured to capture an image of the to-be-scanned object to obtain image data of the to-be-scanned object, and a shape measuring device configured to perform a shape measurement process to measure a shape of the to-be-scanned object placed on the mounting table based on the image data of the to-be-scanned object obtained by the scanned-image acquisition unit and the image data of the to-be-scanned object obtained by the capturing unit. The image forming apparatus includes the image reading device and an image recording unit configured to record an image on a recording material.

公开(公告)号：US11733032B2

公开(公告)日：2023-08-22

申请号：US17210906

申请日：2021-03-24

申请人： Panasonic Intellectual Property Management Co., Ltd.

发明人： Hikaru Fujiwara ,  Ken Hatsuda ,  Shota Tezuka ,  Miyu Ueda ,  Takuya Yasunaga

IPC分类号： G01B11/22 ,  H04N13/128 ,  G01B11/02 ,  G01B11/24 ,  H04N13/00

CPC分类号： G01B11/22 ,  G01B11/02 ,  G01B11/24 ,  H04N13/128 ,  G01B11/024 ,  H04N2013/0081

摘要： A measurement device includes: an operation unit that receives an operation of a user; an acquisition unit that acquires depth information indicating a depth image and color information indicating a color image of an object; a controller that calculates, based on at least one of the depth information and the color information, first dimension of the object; and a display unit that displays a frame image showing a contour shape of the object to be superimposed on the color image, the contour shape being based on the first dimension. The operation unit receives a selection and an input of a change amount of the adjustment target plane by the user. The controller calculates, second dimension of the object when the adjustment target plane is moved in a normal direction based on the change amount, and changes the frame image to show a contour shape based on the second dimension.

公开(公告)号：US11731236B2

公开(公告)日：2023-08-22

申请号：US16094085

申请日：2017-03-14

申请人： SHIN-ETSU HANDOTAI CO., LTD.

发明人： Kazuya Sato ,  Naoki Kamihama ,  Hiromasa Hashimoto

IPC分类号： B24B37/32 ,  G01B11/30 ,  H01L21/306 ,  G01B11/02 ,  B24B37/30 ,  G01B11/24 ,  H01L21/304

CPC分类号： B24B37/32 ,  B24B37/30 ,  G01B11/02 ,  G01B11/24 ,  G01B11/306 ,  H01L21/304 ,  H01L21/30625

摘要： A method for selecting a template assembly includes: preparing a template assembly in which a template is concentrically attached on a base ring or a base plate having a larger outer diameter than the template, the template having a back pad to hold a workpiece back surface and a retainer ring positioned on the back pad and to hold an edge portion of the workpiece; non-destructively measuring a height position distribution of the retainer ring and the back pad on the template side of the template assembly, where an outer peripheral edge surface of the base ring or the base plate serves as a reference surface; calculating a flatness of the retainer ring and an average amount of step differences between the retainer ring and the back pad from the measured height position distribution; and selecting the template assembly based on the flatness and the average amount of step differences.

公开(公告)号：US11721573B2

公开(公告)日：2023-08-08

申请号：US17302437

申请日：2021-05-03

申请人： HIWIN TECHNOLOGIES CORP.

发明人： Yan-Yu Chen ,  Ming-Shiou Liu

IPC分类号： H01L21/68 ,  G01B11/26 ,  G01B11/24

CPC分类号： H01L21/681 ,  G01B11/24 ,  G01B11/26

摘要： A method for detecting positions of wafers includes: rotating a rotation table with a wafer thereon in a first direction at a first speed; detecting a contour of the wafer rotating in the first direction at the first speed to provide contour data; rotating the rotation table in a second direction at a second speed when an aiming feature of the wafer passes the detector in the first direction at the first speed; detecting the contour of the wafer rotating in the second direction at the second speed to provide new contour data; and stopping the rotation of the rotation table and the detection of the wafer according to an accumulation of contour data and corresponding rotation angles, to estimate an eccentric position of the wafer and a position of the aiming feature when the aiming feature passes the detector in the second direction at the second speed.

公开(公告)号：US20230246413A1

公开(公告)日：2023-08-03

申请号：US17967151

申请日：2022-10-17

申请人： FUJIFILM Business Innovation Corp.

发明人： Daisuke IGUCHI

IPC分类号： H01S5/042 ,  G01B11/24

CPC分类号： H01S5/042 ,  G01B11/24

摘要： A light-emitting apparatus includes: a light-emitting unit including a light-emitting element; a drive unit including a first element connected to a cathode electrode provided on a cathode side of the light-emitting element, the drive unit being configured to drive the light-emitting element by supplying current that causes light emission; and a capacitive unit provided in parallel with a route of current that causes light emission, between an anode electrode provided on an anode side of the light-emitting element and the cathode electrode.

公开(公告)号：US20230244832A1

公开(公告)日：2023-08-03

申请号：US18092840

申请日：2023-01-03

申请人： RAYTHEON TECHNOLOGIES CORPORATION

发明人： RAJA KRISHNAN KOUNTANYA ,  JEAN-PHILIPPE ALBERT THOMAS ,  MICHAEL GRAM

IPC分类号： G06F30/23 ,  G01B11/24 ,  B23B27/16

CPC分类号： G06F30/23 ,  G01B11/24 ,  B23B27/1611

摘要： Systems and methods for mesh refinement of finite element analysis simulations employ an analytical modeling program configured to identify a location of contact between two components and a finite element analysis program configured to use the identified location to perform finite element mesh refinement. In this regard, the location of contact (and location of desired mesh refinement) is identified using analytical modeling. Said location of contact is then provided to the finite element analysis program for determining precisely where to perform mesh refinement on the finite element mesh. The finite element analysis program performs a mesh refinement at the exact location of contact between two components to provide for optimized and more efficient finite element analysis.

公开(公告)号：US20230243644A1

公开(公告)日：2023-08-03

申请号：US18296733

申请日：2023-04-06

申请人： Carl Zeiss SMT GmbH

发明人： Hans Michael STIEPAN ,  Thomas MONZ ,  Julian KALLER ,  Ulrich LOERING

IPC分类号： G01B11/24 ,  G02B5/08 ,  G02B7/18 ,  G03F7/00

CPC分类号： G01B11/2441 ,  G02B5/0891 ,  G02B7/1815 ,  G03F7/70891 ,  G02B2207/101

摘要： A method for measuring a surface shape of an optical element, wherein the optical element has a main body with a substrate and a reflective surface, and wherein at least one cooling channel for receiving a coolant is formed in the substrate, comprising: a) recording a cooling channel pressure, b) recording a measurement environment pressure, c) determining a pressure difference based on the cooling channel pressure and the measurement environment pressure, d) comparing the pressure difference with a predetermined target pressure difference, e) monitoring for a deviation between the pressure difference and the target pressure difference, wherein, if a deviation greater than a predetermined limit value is detected, the cooling channel pressure is adapted in such a way that the deviation becomes less than or equal to the predetermined limit value, and f) measuring the surface shape if the deviation is less than or equal to the predetermined limit value.

公开(公告)号：US11709049B2

公开(公告)日：2023-07-25

申请号：US16977868

申请日：2019-02-28

申请人： NIPPON TELEGRAPH AND TELEPHONE CORPORATION

发明人： Shigehiro Matsuda ,  Takashi Goto ,  Ryuji Honda ,  Yoshiyuki Kajihara

IPC分类号： G01B11/24 ,  G06T7/62 ,  G06T7/00 ,  G06V20/64

CPC分类号： G01B11/24 ,  G06T7/0002 ,  G06T7/62 ,  G06V20/653 ,  G06T2207/30184

摘要： Even when a missing portion occurs in a solid data set on a columnar structure, an estimator for a deflection value and an accuracy of the deflection value are correctly estimated according to an extent of the missing portion and the like. A measurement accuracy estimation unit (15) is included that: calculates a deflection of a columnar structure and an extent of a missing portion, from a solid data set on the columnar structure; calculates an accuracy assessment indicator for the deflection that is acquirable when a plurality of missing portion patterns occur on a virtual basis, based on a plurality of solid data sets in each of which the calculated extent of the missing portion is smaller than a preset threshold value, the accuracy assessment indicator being calculated for each missing portion pattern; and calculates an accuracy of the deflection calculated from the solid data set, based on the calculated accuracy assessment indicator for each missing portion pattern, and based on the calculated extent of the missing portion in the solid data set.

公开(公告)号：US11693208B2

公开(公告)日：2023-07-04

申请号：US16738486

申请日：2020-01-09

申请人： TDK TAIWAN CORP.

发明人： Ichitai Moto

IPC分类号： G02B26/08 ,  G02B7/182 ,  G02B26/10 ,  H02K41/035 ,  G01S7/481 ,  G01B11/24 ,  G01S17/42

CPC分类号： G02B7/1821 ,  G01B11/24 ,  G01S7/4813 ,  G01S7/4816 ,  G01S7/4817 ,  G01S17/42 ,  G02B26/0816 ,  G02B26/101 ,  G02B26/105 ,  H02K41/0356 ,  H02K2201/18

摘要： An optical sensing system is provided, including a sensing module, a light emitter, and a light receiver. The sensing module has a substrate, an optical waveguide disposed on the substrate, and a sensing membrane disposed on the optical waveguide for carrying a specimen. The light emitter emits a sensing light to the optical waveguide, and the light receiver receives the sensing light that propagates through the optical waveguide.

公开(公告)号：US11690975B2

公开(公告)日：2023-07-04

申请号：US15763143

申请日：2016-10-02

申请人： KONINKLIJKE PHILIPS N.V.

发明人： David Paul Noonan ,  Molly Lara Flexman ,  Aryeh Leib Reinstein ,  Neriman Nicoletta Kahya ,  Martinus Bernardus Van Der Mark ,  Sander Hans Denissen ,  Eibert Gerjan Van Putten

IPC分类号： A61M25/00 ,  A61B5/06 ,  A61B90/00 ,  A61B34/20 ,  A61M25/10 ,  G02B6/38 ,  A61M39/10 ,  A61M39/06 ,  G01B11/16 ,  G01B11/24

CPC分类号： A61M25/0097 ,  A61B5/064 ,  A61B5/065 ,  A61B90/37 ,  G01B11/18 ,  G01B11/24 ,  A61B5/066 ,  A61B2034/2061 ,  A61M25/0023 ,  A61M25/0074 ,  A61M25/1002 ,  A61M39/06 ,  A61M39/10 ,  G02B6/3897

摘要： A hub for an optical shape sensing reference includes a hub body (606) configured to receive an elongated flexible instrument (622) with a shape sensing system coupled to the flexible instrument within a path formed in the hub body. A profile (630) is formed in the hub body in the path to impart a hub template configured to distinguish a portion of the elongated flexible instrument within the hub in shape sensing data. An attachment mechanism (616) is formed on the hub body to detachably connect the hub body to a deployable instrument such that a change in a position of the hub body indicates a corresponding change in the deployable device.