公开(公告)号：US09581554B2

公开(公告)日：2017-02-28

申请号：US14194443

申请日：2014-02-28

Applicant: SEAGATE TECHNOLOGY LLC

Inventor： Joachim Walter Ahner ,  David M. Tung

IPC: G01N21/95 ,  G01N21/47 ,  G01N21/88

CPC classification number: G01N21/8806 ,  G01N21/47 ,  G01N21/4738 ,  G01N21/95 ,  G01N21/9506 ,  G01N2021/8816 ,  G01N2021/8845 ,  G01N2021/8848

Abstract: Provided herein is an apparatus, including at least two photon emitters, each with a preselected polarization orientation, and configured to emit polarized photons onto a surface of an article, and a processing means configured to process photon-detector-array signals corresponding to photons scattered from surface features of the article, and generate one or more surface features maps for the article from the photon-detector-array signals corresponding to the photons scattered from the surface features of the article.

Abstract translation: 本文提供了一种装置，包括至少两个光子发射器，每个光子发射器各自具有预选的偏振取向，并且被配置为将偏光光子发射到物品的表面上;以及处理装置，被配置为处理对应于分散的光子的光子检测器阵列信号 从物品的表面特征，并且从对应于从物品的表面特征散射的光子的光子检测器阵列信号生成物品的一个或多个表面特征图。

公开(公告)号：US20160139060A1

公开(公告)日：2016-05-19

申请号：US15004730

申请日：2016-01-22

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  David M. Tung

IPC: G01N21/95 ,  G01N23/20

CPC classification number: G01N21/95 ,  G01N23/20

Abstract: Provided herein is an apparatus, including a mapping means for generating a map of locations of surface features of an article based on photon-detector signals corresponding to photons scattered from the surface features of the article, and a surface feature manager. The surface manager is configured to locate a predetermined surface feature of the surface features of the article based, at least in part, on the map of the surface features locations, irradiate photons of a first power onto the location of the predetermined surface feature to analyze the predetermined surface feature, and irradiate photons of a second power onto the location of the predetermined surface feature to remove the predetermined surface feature.

Abstract translation: 本文提供了一种装置，其包括用于基于对应于从物品的表面特征散射的光子的光子检测器信号和表面特征管理器来生成物品的表面特征的位置的映射的映射装置。 表面管理器被配置为至少部分地基于表面特征位置的图来定位物品的表面特征的预定表面特征，将第一功率的光子照射到预定表面特征的位置上以分析 预定的表面特征，并且将第二功率的光子照射到预定表面特征的位置上以去除预定的表面特征。

公开(公告)号：US09217714B2

公开(公告)日：2015-12-22

申请号：US14029700

申请日：2013-09-17

Applicant: Seagate Technology LLC

Inventor： Joachim W. Ahner ,  David M. Tung ,  Stephen Keith McLaurin ,  Travis W. Grodt

IPC: G01N21/95

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9506

Abstract: Provided herein is an apparatus, including a photon emitter configured for emitting photons onto a surface of an article; a first reflective surface and a second reflective surface configured to reflect the photons onto the surface of the article; and a processing means configured for processing signals from a photon detector array corresponding to photons scattered from surface features of the article.

Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到制品的表面上的光子发射器; 第一反射表面和第二反射表面，被配置为将光子反射到制品的表面上; 以及处理装置，被配置为处理来自对应于从物品的表面特征散射的光子的光子检测器阵列的信号。

公开(公告)号：US09201019B2

公开(公告)日：2015-12-01

申请号：US14096002

申请日：2013-12-03

Applicant: Seagate Technology LLC

Inventor： David M. Tung ,  Joachim W. Ahner

IPC: G01N21/88

CPC classification number: G01N21/8806 ,  G01N21/88 ,  G01N21/9503 ,  G01N21/9506 ,  G01N2201/061

Abstract: Provided herein is an apparatus, including a photon emitting means for emitting photons onto surface edges of an article, a photon detecting means for detecting photons scattered from particles on the surface edges of the article, and a mapping means for mapping a particle or a defect of the surface of the article.

Abstract translation: 本文提供了一种装置，包括用于将光子发射到物品的表面边缘上的光子发射装置，用于检测从物品的表面边缘上的颗粒散射的光子的光子检测装置，以及用于映射颗粒或缺陷的映射装置 的物品表面。

公开(公告)号：US20140354984A1

公开(公告)日：2014-12-04

申请号：US14096001

申请日：2013-12-03

Applicant: Seagate Technology LLC

Inventor： David M. Tung ,  Joachim W. Ahner

IPC: G01N21/956 ,  G01N21/47

CPC classification number: G01N21/4738 ,  G01N21/8806 ,  G01N21/95 ,  G01N2021/8809 ,  G01N2201/062 ,  G01N2201/12

Abstract: Provided herein is an apparatus, including a photon emitting means configured to emit photons onto a surface of an article at a number of azimuthal angles; and a processing means configured to process photon-detector-array signals corresponding to photons scattered from surface features of the article and generate one or more surface features maps for the article from the photon-detector-array signals corresponding to the photons scattered from the surface features of the article.

Abstract translation: 本文提供了一种装置，包括被配置为以多个方位角将光子发射到制品的表面上的光子发射装置; 以及处理装置，被配置为处理对应于从物品的表面特征散射的光子的光子检测器阵列信号，并且从对应于从表面散射的光子的光子检测器阵列信号生成物品的一个或多个表面特征图 文章的特点。

公开(公告)号：US20140160481A1

公开(公告)日：2014-06-12

申请号：US14029700

申请日：2013-09-17

Applicant: Seagate Technology LLC

Inventor： Joachim W. Ahner ,  David M. Tung ,  Stephen Keith McLaurin ,  Travis W. Grodt

IPC: G01N21/95

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9506

Abstract: Provided herein is an apparatus, including a photon emitter configured for emitting photons onto a surface of an article; a first reflective surface and a second reflective surface configured to reflect the photons onto the surface of the article; and a processing means configured for processing signals from a photon detector array corresponding to photons scattered from surface features of the article.

Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到制品的表面上的光子发射器; 第一反射表面和第二反射表面，被配置为将光子反射到制品的表面上; 以及处理装置，被配置为处理来自对应于从物品的表面特征散射的光子的光子检测器阵列的信号。

公开(公告)号：US20140152804A1

公开(公告)日：2014-06-05

申请号：US14029725

申请日：2013-09-17

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  Travis William Grodt ,  Florin Zavaliche ,  Maissarath Nassirou ,  David M. Tung ,  Tchernio T. Boytchev ,  Stephen Keith McLaurin ,  Henry Luis Lott

IPC: G06K9/20

CPC classification number: G06T3/4069 ,  G06T7/0004 ,  G06T2207/10016 ,  G06T2207/30164

Abstract: Provided herein is an apparatus comprising a photon detecting array configured to take images of an article, and a mount configured to mount and translate the article in a direction by a sub-pixel distance. In some embodiments, the sub-pixel distance is based on a pixel size of the photon detecting array.

Abstract translation: 本文提供了一种装置，其包括被配置为拍摄物品的图像的光子检测阵列和被配置成沿着子像素距离的方向安装和平移物品的安装件。 在一些实施例中，子像素距离基于光子检测阵列的像素大小。

公开(公告)号：US20140098368A1

公开(公告)日：2014-04-10

申请号：US14032192

申请日：2013-09-19

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  David M. Tung ,  Florin Zavaliche ,  Stephen Keith McLaurin

IPC: G01N21/47

CPC classification number: G01N21/4738 ,  G01N21/95 ,  G01N2021/4764 ,  G01N2021/4792 ,  G01N2201/0635 ,  G01N2201/0683

Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.

Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列，其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置，其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。

公开(公告)号：US20140098364A1

公开(公告)日：2014-04-10

申请号：US14032187

申请日：2013-09-19

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  David M. Tung ,  Samuel Kah Hean Wong ,  Henry Luis Lott ,  Stephen Keith McLaurin ,  Maissarath Nassirou ,  Florin Zavaliche

IPC: G01N21/95

CPC classification number: G01N21/6456 ,  G01N21/47 ,  G01N21/63 ,  G01N21/64 ,  G01N21/8851 ,  G01N21/94 ,  G01N21/95 ,  G01N21/9501 ,  G01N21/9506 ,  G01N2021/8864 ,  G01N2201/06153 ,  G01N2201/0683

Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.

Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到物品的表面上的光子发射器，被配置为从制品的表面特征接收光子的光子检测器阵列; 以及处理装置，其被配置用于处理对应于从所述表面特征散射的光子和从所述表面特征发荧光的光子的光子检测器阵列信号，其中所述处理装置还被配置为对所述物品的表面特征进行分类。